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Software Product Line Test Cases Derivation Using Combinatorial Test Design  

Haeun, Baek (KAIST 전산학과)
Sungwon, Kang (KAIST 전산학과)
Jihyun, Lee (대전대학교 교양학부대학)
Publication Information
Journal of KIISE:Software and Applications / v.41, no.7, 2014 , pp. 469-480 More about this Journal
Abstract
Software Product Line (SPL) is a software development paradigm that guarantees high productivity, reduced cost, and shorter time-to-market by systematically planning and reusing commonality and variability. In order to maximize the benefits of SPL engineering, testing should be integrated into the SPL engineering lifecycle processes that consist of domain engineering and application engineering and should be performed with as little test efforts as possible. This paper proposes a systematic software product line test cases derivation method using combinatorial test design. By applying combinatorial test design to product line test cases derivation and exploiting commonality between products at the same time, the number of generated test cases is dramatically reduced with the result that they can be effectively reused by the products of the given product line. Case studies conducted in this paper show the efficacy of our method compared with other methods that use only commonality or combinatorial design or neither of them in terms of the number of derived test cases.
Keywords
SPL testing; combinatorial test design(CTD); pairwise combination testing; test case reuse;
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