• 제목/요약/키워드: oxide pattern

검색결과 386건 처리시간 0.026초

유도 결합 플라즈마를 이용한 백금 박막의 건식 식각시 가스 첨가 효과 (Effects of $O_2$ Gas Addition to Dry Etching of Platinum. Thin Film by Inductively Coupled Plasma)

  • 김남훈;김창일;권광호;장의구
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제48권6호
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    • pp.451-455
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    • 1999
  • The highest etch rate of Pt film was obtained at 10% $Cl_2$/90% Ar gas mixing ratio in our previous investigation. However, the problems such as the etch residues(fence) remained on the pattern sidewall, low selectivity to oxide as mask and low etch slope were presented. In this paper, the etching by additive $O_2$ gas to 10% $Cl_2$/90% Ar gas base was examined. As a result, the fence-free pattern and higher etch slope as about 60$^{\circ}$was observed and the selectivity to oxide increased to 2.4 without decreasing of the etch rate $1500{\AA}$/min. XPS surface analysis proved that a only little $O_2$ gas removes the Pt-CI compounds as residues on the etched surface.

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Charge Spreading Effect of Stored Charge on Retention Characteristics in SONOS NAND Flash Memory Devices

  • Kim, Seong-Hyeon;Yang, Seung-Dong;Kim, Jin-Seop;Jeong, Jun-Kyo;Lee, Hi-Deok;Lee, Ga-Won
    • Transactions on Electrical and Electronic Materials
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    • 제16권4호
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    • pp.183-186
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    • 2015
  • This research investigates the impact of charge spreading on the data retention of three-dimensional (3D) silicon-oxide-nitride-oxide-silicon (SONOS) flash memory where the charge trapping layer is shared along the cell string. In order to do so, this study conducts an electrical analysis of the planar SONOS test pattern where the silicon nitride charge storage layer is not isolated but extends beyond the gate electrode. Experimental results from the test pattern show larger retention loss in the devices with extended storage layers compared to isolated devices. This retention degradation is thought to be the result of an additional charge spreading through the extended silicon nitride layer along the width of the memory cell, which should be improved for the successful 3-D application of SONOS flash devices.

화학 기계적 미세 가공기술에 의한 버 최소화에 관한 연구 (A Study on The Burr Minimization by The Chemical Mechanical Micro Machining(C3M))

  • 이현우;박준민;정상철;정해도;이응숙
    • 한국정밀공학회지
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    • 제18권12호
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    • pp.177-184
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    • 2001
  • C3M(chemical mechanical micro machining) is applied for diminishing the size of burr and fabricating the massless patterning for aluminium wafer(thickness of 1${\mu}m$). It is difficult to perform the micro size machining with the radically increased shear stress. While the miniaturization and function-orientation of parts has been needed in the many field such as electronics, optics and medicine. etc., it is not enough to satisfy the industry needs in the machining technology. In this paper feasibility test of diminishing burr and fabricating maskless pattern was experimented and analyzed. In the experiment oxide layer was farmed on the aluminium with chemical reaction by ${HNO_3}$(10wt%), then the surface was grooved with tungsten carbide tool for the different condition such as the load and fred rate. The result was compared with the conventional machining to show the improvement of C3M with SEM for burr diminish and XPS for atomic existence, AFM for more precise image.

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딤플 패턴 최적화를 통한 고체산화물 연료전지 분리판의 흐름 균일도 향상 (Enhancing Flow Uniformity of Gas Separator for Solid Oxide Fuel Cells by Optimizing Dimple Patterns)

  • 쿠엔;이동근;안국영;김영상
    • 한국수소및신에너지학회논문집
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    • 제32권5호
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    • pp.331-339
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    • 2021
  • This study presents a novel way to enhance uniformity of the gas flow inside the solid oxide fuel cell (SOFC), which is critically important to fuel cell performance, by using dimples. A pattern of dimple, which works as a flow distributor/collector, is designed at the inlet and outlet section of a straight channel gas separator. Size of the dimples and the gap between them were changed to optimize the flow uniformity, and any change in size or gap is considered as one design. The results show that some dimple patterns significantly enhance the uniformity compared to baseline, about 4%, while the others slightly reduce it, about 1%. Besides, the dimple pattern also affects to the pressure drop in the flow channel, however the pressure drop in all cases are negligible (less than 26.4 Pa).

The Effect of Mechanical Properties of Polishing Pads on Oxide CMP ( Chemical Mechanical Planarization )

  • Hong, Yi-Koan;Eom, Dae-Hong;Kang, Young-Jae;Park, Jin-Goo;Kim, Jae-Suk;Kim, Geon;Lee, Ju-Yeol;Park, In-Ha
    • 한국윤활학회:학술대회논문집
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    • 한국윤활학회 2002년도 proceedings of the second asia international conference on tribology
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    • pp.445-446
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    • 2002
  • The purpose of this study was to investigate the effect of micro holes, pattern structure and elastic modulus of pads on the polishing behavior such as the removal rate and WIWNU (within wafer non-uniformity) during CMP. The regular holes on the pad act as the superior abrasive particle's reservoir and regular distributor at the bulk pad, respectively. The superior CMP performance was observed at the laser processed bulk pad with holes. Also, th ε groove pattern shape was very important for the effective polishing. Wave grooved pad showed higher removal rates than K-grooved pad. The removal rate was linearly increased as the top pad's elastic modulus increased.

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나노임프린트 리소그래피를 위한 스케일 다운된 산화막 스탬프 제작과 패턴결함 개선에 관한 연구 (Improved Defect Control Problem using Scaled Down Silicon Oxide Stamps for Nanoimprint Lithography)

  • 박형석;최우범;성만영
    • 한국전기전자재료학회논문지
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    • 제19권2호
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    • pp.130-138
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    • 2006
  • We have investigated pattern scaling down of silicon stamps through the oxidation technique, During oxidizing the silicon stamps, silicon dioxide that has 300 nm and 500 nm thickness was grown, and critical deformations were not observed in the patterns. There was positive effect to reduce size of patterns because vertical and horizontal patterns have different orientation. We achieved pattern reduction rate of $26\%$. In addition, the formation of polymer patterns had been investigated with varied temperature and pressure conditions to improve the filling characteristics of polymers during nanoimprint lithography when pattern sizes were few micrometers. In these varied conditions, polymers had been affected by free space compensation and elastic stress relaxation for filling the cavities. Based on the results, defect control which is an important issue in the nanoimprint lithography were facilitated.

STI-CMP 공정을 위한 Pattern wafer와 Blanket wafer 사이의 특성 연구 (A study on Relationship between Pattern wafer and Blanket Wafer for STI-CMP)

  • 김상용;이경태;김남훈;서용진;김창일;이우선;장의구
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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    • pp.211-213
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    • 1999
  • In this paper, we documented the controlling oxide removal amount on the pattern wafer using removal rate and removal thickness of blanket wafer. There was the strong correlation relationship for both(correlation factor:0.7109). So, we could confirm the repeatability as applying for STI CMP process from the obtained linear formular. As the result of repeatability test, the difference of calculated polishing time and actual polishing time was 3.48 seconds based on total 50 lots. If this time is converted into the thickness, it is from 104$\AA$ to 167$\AA$. It is possible to be ignored because it is under the process margin.

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Effect of corrugation structure and shape on the mechanical stiffness of the diaphragm

  • Kim, Junsoo;Moon, Wonkyu
    • 센서학회지
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    • 제30권5호
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    • pp.273-278
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    • 2021
  • Here, we studied the change in the mechanical stiffness of a diaphragm according to the corrugation pattern. The diaphragm consists of a silicon oxide and nitride double layer; a corrugation pattern was formed by dry etching, and the diaphragm was released by wet etching. The fabrication of the thin film was verified using focused ion beam and scanning electron microscopy images. The mechanical stiffness of the diaphragm was obtained by measuring the surface vibration using a laser Doppler vibrometer while applying external sound pressure. Flat squares, diaphragms with square corrugations, and circular corrugation patterns were measured and compared. The stiffness of the diaphragm with a corrugation structure was found to be smaller than that without a corrugation structure; in particular, circular corrugation showed a better effect because of the high symmetry. Furthermore, the effect of corrugation was theoretically predicted. The proposed corrugated diaphragm showed comparable flexibility with the state-of-the-art MEMS microphone diaphragm.

실리카 도파로(Silica Waveguide) 제작을 위한 Inductively Coupled Plasma에 의한 산화막 식각특성 연구 (The study of oxide etching characteristics using inductively coupled plasma for silica waveguide fabircation)

  • 박상호;권광호;정명영;최태구
    • 한국진공학회지
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    • 제6권3호
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    • pp.287-292
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    • 1997
  • 본 실험은 고밀도 플라즈마원인 inductively coupled plasma(ICP)를 이용하여 실리카 도파로의 코아를 형성하고자 하였다. $CF_4/CHF_3$유량비, bias power 및 source power 등의 변화에 따른 산화막의 식각 특성 즉 식각 속도, 식각 단면 및 식각된 표면의 거칠기 등의 변화를 검토하였다. 또한 single Langmuir probe 및 optical emission spectroscopy(OES)를 이용하여, 식각 변수에 따른 ICP의 플라즈마 특성을 관찰하였다. 이상의 결과를 토대로, $SiO_2-P_2O_5$로 구성된 실리카 도파로의 코아(core)층을 형성하였고, 이때 최적화된 식각 조건 에서 식각 속도는 380nm/min이고, 마스크 층으로 사용된 Al(Si 1%)와 산화막과의 식각 선 택비는 30:1이상이였다. 형성된 실리카 도파로를 scanning electron microscopy(SEM)으로 관찰한 결과, 코아층의 식각 단면이 수직하고 패턴 선폭의 손실이 거의 없음을 확인하였다.

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기계적 합금화하여 제조한 Fe-5Y2O3 합금분말의 나노산화물 석출거동 (A Precipitation Behavior of Nano-Oxide Particles in Mechanically Alloyed Fe-5Y2O3 Powders)

  • 김가언;노상훈;최지은;김영도;김태규
    • 한국분말재료학회지
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    • 제22권1호
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    • pp.46-51
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    • 2015
  • A precipitation behavior of nano-oxide particle in Fe-$5Y_2O_3$ alloy powders is studied. The mechanically alloyed Fe-$5Y_2O_3$ powders are pressed at $750^{\circ}C$ for 1h, $850^{\circ}C$ for 1h and $1150^{\circ}C$ for 1h, respectively. The results of Xray diffraction pattern analysis indicate that the $Y_2O_3$ diffraction peak disappear after mechanically alloying process, but $Y_2O_3$ and $YFe_2O_4$ complex oxide precipitates peak are observed in the powders pressed at $1150^{\circ}C$. The differential scanning calorimetry study results reveal that the formation of precipitates occur at around $1054^{\circ}C$. Based on the transmission electron microscopy analysis result, the oxide particles with a composition of Y-Fe-O are found in the Fe-$5Y_2O_3$ alloy powders pressed at 1150oC. It is thus conclude that the mechanically alloyed Fe-$5Y_2O_3$ powders have no precipitates and the oxide particles in the powders are formed by a high temperature heat-treatment.