• The Bulletin of The Korean Astronomical Society
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• v.44 no.1
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• pp.58.3-58.3
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• 2019

Optical intensity interferometry, developed in the 1950s, is a simple and inexpensive method for achieving angular resolutions on microarcsecond scales. Its low sensitivity has limited intensity interferometric observations to bright stars so far. Substantial improvements are possible by using avalanche photodiodes (APDs) as light detectors. We present here the results of laboratory measurements with a prototype astronomical intensity interferometer using APDs in continuous ("linear") detection mode - arguably, the first of its kind. We used two interferometer configurations, one with zero baseline and one with variable baseline. Using a superluminous diode as light source, we unambiguously detected Hanbury Brown-Twiss photon-photon correlations at very high significance. From measuring the correlation as function of baseline, we measured the angular diameter of the light source, in analogy to the measurement of the angular diameter of a star. Our results demonstrate the possibility to construct large astronomical intensity interferometers that can address a multitude of astrophysical science cases.

• Journal of the Korean Society for Precision Engineering
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• v.14 no.10
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• pp.151-156
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• 1997

A laser measurement system, a modified Michelson interferometer, which can accurately measure high speed length and displacement of servomechanisms by detecting a phase shift in the measurement beam using an optical interference was developed. A frequency stabilized laser source and a 20 fold frequency interpolation and digitizing circuit were applied to the system. The refra- ctive index of the ambient air was calibrated through the Edlens formula. The system achieved a resolution of /40, 16nm, a maximum allow-able measurement speed of 600nm/sec, and a length measure- ment range of 1500 mm. Performance of the system was evaluated on the machining center in short and long length measurements.

• Korean Journal of Optics and Photonics
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• v.17 no.1
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• pp.47-53
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• 2006

The Integrated Ballistics Identification Systems (IBIS) is widely used for bullet and casing signature identification. The IBIS obtains a pair of ballistic signatures from two bullets (or casings) using optical microscopy, and estimates a correlation score which can represent the degree of signature match. However, this method largely depends on lighting and surface conditions because optical image contrast is primarily a function of test surface's slope, shadowing, multiple reflections, optical properties, and illumination direction. Moreover, it can be affected with surface height variation. To overcome these problems and improve the identification system, we used well known surface topographic techniques, such as confocal microscopy and white-light scanning interferometry. The measuring instruments were calibrated by a NIST step height standard and verified by a NIST sinusoidal profile roughness standard and a commercial roughness standard. We also suggest a new analysis method for the ballistic identification. In this method, the maximum cross-correlation function CCFmax is used to quantify the degree of signature match. If the compared signatures were exactly the same, CCFmax would be $100\%$.

• Journal of the Korean Society for Precision Engineering
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• v.18 no.5
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• pp.90-97
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• 2001

An electronic speckle pattern interferometry (ESPI) system for measuring tensile properties under micro-tensile testing has been developed. The system consists of an optical system and an image processing system. In the optical system, optical components for measurement of in-plane deformation are arranged on the path of He-Ne laser. In the image processing system, the window-based program for acquiring speckle pattern interferometric image was developed and deformation in a small specimen is continuously evaluated during the test. Using this system, tensile strain of copper foil was measured during tensile testing. Tensile specimen had the thickness and width of 22 and 500 ${\mu}{\textrm}{m}$, respectively. Tensile properties, including the elastic modulus, yielding strength and tensile strength, of the copper were evaluated and also plastic exponent and coefficient in the Ramberg-Osgood relationship were evaluated from the stress-strain curve.

• ETRI Journal
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• v.41 no.1
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• pp.84-92
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• 2019

Recent advances in digital holography in the far-infrared region of the spectrum have demonstrated the potential use of digital holography in homeland security as a tool to observe hostile environments in which smoke, flames, and dust impair vision. However, to make this application practical, it is necessary to simplify the optical setup. Here, we show an off-axis, self-reference scheme that spills the reference beam out from the object beam itself and avoids the need for a complex interferometric arrangement. We demonstrate that this scheme allows the reconstruction of high-quality holograms of objects captured under visible as well as far-infrared light exposure. This could pave the way to the industrialization of holographic systems to enable users to see through fire. Moreover, the quantitative nature of the holographic signal is preserved. Thus, the reported results demonstrate the possibility to use this setup for optical metrology.

• Current Optics and Photonics
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• v.3 no.1
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• pp.16-21
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• 2019

We present a broad-bandwidth comb-spacing-swept source (CSWS) based on a differential polarization delay line (DPDL) for interferometric three-dimensional (3D) imaging. The comb spacing of the CSWS is repeatedly swept by the tunable DPDL in the multiwavelength source to provide depth-scanning optical coherence tomography (OCT). As the polarization differential delay of the DPDL is tuned from 5 to 15 ps, the comb spacing along the wavelength continuously varies from 1.6 to 0.53 nm, respectively. The wavelength range of various semiconductor optical amplifiers and the cavity feedback ratio of the tunable fiber coupler are experimentally selected to obtain optimal conditions for a broader 3-dB bandwidth of the multiwavelength spectrum and thus provide a higher axial resolution of $35{\mu}m$ in interferometric OCT imaging. The proposed CSWS-OCT has a simple imaging interferometer configuration without reference-path scanning and a simple imaging process without the complex Fourier transform. 3D surface images of a via-hole structure on a printed circuit board and the top surface of a coin were acquired.

• Current Optics and Photonics
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• v.4 no.6
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• pp.483-499
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• 2020

In this paper, a novel analog signature scheme is proposed by modifying an RSA-based digital signature scheme with optical phase-shifting digital holography. The purpose of the proposed method is generating an analog signature to provide data confidentiality and security during the data transfer, compared to the digital signature. The holographic encryption technique applied to a hash value reveals an analog-type of pseudo-random pattern in the analog signature scheme. The public key and secret key needed to verify the analog signature are computed from public key ciphers which are generated by the same holographic encryption. The proposed analog signature scheme contains a kind of double encryption in the process of generating signature and key, which enhances security level more than the digital signature. The results of performance simulations show the feasibility of the highly secure signature scheme, and security analysis shows high robustness against known-message attacks and chosen-message attacks. In addition, the proposed method can apply to one-time signature schemes which can be used to sign only one message and it can also apply to authentication, e-mails, electronic banking and electronic data interchange.

• Transactions of the Korean Society of Mechanical Engineers
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• v.10 no.3
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• pp.343-348
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• 1986

An optical interference method was developed for measuring rapidly growing and evaporating liquid condensate films (e.g., Na$_{2}$SO$_{4}$, $K_{2}$SO$_{4}$) on solid surface exposed to flowing combustion product gases at film thicknesses well below the onset of complications due to run-off. To develop this optical system, this study investigated the optical parameters (e.g., polarization state, incident angle, target roughness, etc.) Trends for the Na$_{2}$SO$_{4}$(l) and $K_{2}$SO$_{4}$(l) deposition rates as a function of target temperature using this optical measuring system agree with the theoretical prediction of the vapor deposition. This study was able to extend the experimental range for vapor plus condensed phase transport and deposition. While previously unable to measure the evaporation rates interferometrically, these rates are estimated from the results of the investigation of polarization states.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.27 no.2
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• pp.188-196
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• 2003

Liquid-assisted cleaning technology utilizing a nanosecond laser pulse is effective for removing submicron particulates from a variety of solid substrates. In the technique, saturated vapor is condensed on a solid surface to form a thin liquid film and the film is evaporated explosively by laser heating. The present work studies the role of liquid-film evaporation in the cleaning process. First, optical interferometry is employed for in-situ monitoring the displacement of the laser-irradiated sample in the cleaning process. The experiments are performed for estimating the recoil force exerted on the target with and without liquid deposition. Secondly, time-resolved visualization and optical reflectance probing are also conducted for monitoring the phase-change kinetics and plume dynamics in vaporization of thin liquid layers. Discussions are made on the effect of liquid-film thickness and dynamics of plume and acoustic wave. The results confirm that cleaning force is generated when the bubble nuclei initially grow in the strongly superheated liquid.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2002.05a
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• pp.173-176
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• 2002

In this paper, we present the combined 2-D and 3-D algorithms for automatic solder paste inspection. For automatic inspection, optical system for the combined inspection and driving unit is made. One-pass run length algorithm that has fast and efficient memory space is applied to the input image fur extracting solder paste patterns. The path of probe movement is then calculated for an automatic inspection. For a fast 3-D inspection, the phase shift algorithm based on Moire interferometry is also used. In addition, algorithms used in this paper are coded by $MMX^{TM}$. A probe system is manufactured to simultaneously inspect 2-D and 3-D for 10mm$\times$10mm field of view, with resolutions of 10 $\mu\textrm{m}$for both x, y axis and 17 $\mu\textrm{m}$for z axis, and then, experiments on several PCBs are conducted. The processing times of 2-D and 3-D, excluding an image capturing, is 0.039 sec and 0.047 sec, respectively. The credible result with $\pm$ 1$\mu\textrm{m}$uncertainty can be also achieved.