• Journal of the Optical Society of Korea
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• v.18 no.2
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• pp.156-161
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• 2014

Anisotropy profile of a rubbed polyimide film is investigated using both a modified ultra high precision transmission ellipsometer and the analysis software previously developed to determine the optic axis distribution of discotic liquid crystals in the wide view film. The distorted sinusoidal variation of the ellipsometric constants obtained at an oblique angle of incidence indicates that the optic axis varies from $14.7^{\circ}$ to $40.6^{\circ}$ from the sample plane. The magnitude and distribution of anisotropy is expressed in terms of no, ne, and the cosine-shaped tilt angle distribution of the optic axis in a rubbed polyimide film.

• Bulletin of the Korean Chemical Society
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• v.17 no.8
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• pp.707-712
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• 1996

Growth and changes of electronically conducting polypyrrole (PPy) in the form of thin films polymerized on metal electrodes were investigated by electrochemical and in situ three-parameter ellipsometry methods at the wavelength of 632.8 nm. Although the optical equations produced multiple sets of solution, it was possible to determine a unique set of thickness and the optical constants of a film by auxiliary measurements and/or physical reasoning. The changes in the thickness and the optical properties of the polymers during polymerization and electrochemical oxidation/reduction was successfully followed by the three-parameter ellipsometric technique. The optical properties of the polymers continuously changed as the film grew. The imaginary part of the refractive index of polypyrrole seemed to be dominantly determined by the existence of an absorption band around the visible range.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.58 no.4
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• pp.451-454
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• 2009

The $\beta-In_2Te_3$ single crystal was grown by vertical Bridgman method. The $\beta-In_2Te_3$ single crystal had a face centered cubic(fcc) structure. The lattice constants were found to be $a\;=\;0.617\;{\AA}$. The direct optical energy gap ($E_g$) was found to be 1.11 ev at 300 K. Raman spectra peak of $\beta-In_2Te_3$ single crystal showed the low $E_{LO}$ mode at $105\;cm^{-1}$. The electrical conduction type was measured by the thermal method and was p-type. The electrical conductivity was found to be $1.8\;{\times}\;10^{-2}\;{\Omega}^{-1}cm^{-1}$ at 300 K. The activation energy was found to be 0.51 eV.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.23 no.3
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• pp.228-233
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• 2010

We studied the optical characteristics correlated with low dielectric constants of low-k SiOCH thin films through ellipsometry. The low-k SiOCH thin films were prepared by CCP-PECVD method using BTMSM(Bis-trimethylsilylmethane) precursors deposited on p-Si wafer. The Si-O-CHx, Si-O-Si, Si-CHx, CHx and Si-H bonding groups were specified by FTIR spectroscopic spectra, and the groups coupled with the nano-porous structural organic/inorganic hybrid-type of SiOCH thin films which has extremely low dielectric constant close to 2.0. The structural groups includes highly dense pore as well as ions in SiOCH thin films affecting to complex refraction characteristics of single layer on the p-Si wafer. The structural complexity originate the complex refractive constants of the films, and resulted the elliptical polarization of the incident linearly polarized light source of Xe-light source in the range from 190 nm to 2100 nm. Phase difference and amplitude ratio between s wave and p wave propagating through SiOCH thin film was studied. After annealing, the amplitude of p wave was reduced more than s wave, and phase difference between p and s wave was also reduced.

• Publications of The Korean Astronomical Society
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• v.30 no.2
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• pp.65-67
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• 2015

The surfaces of most atmosphereless solar system objects are referred to as regolith, layers of loosely connected fragmentary debris, produced by meteorite impacts. Measurements of light scattered from such surfaces provides information about the composition and structure of the surface. A suitable way to characterize the scattering properties is to consider how the intensity and polarization of scattered light depends on the particle size, composition, porosity, roughness, wavelength of incident light and the geometry of observation. In the present work, the effect of porosity on bidirectional reflectance as a function of phase angle is studied for alumina powder with grain size of $0.3{\mu}m$ and olivine powder with grain size of $49{\mu}m$ at 543.5 nm. The optical constants of the alumina sample for each porosity were calculated with Maxwell Garnett effective medium theory. On using each of the optical constants of alumina sample in Mie theory with the Hapke model the variation of bidirectional reflectance is obtained as a function of phase angle with porosity as a parameter. Experimental reflectance data are in good agreement the model. For the olivine sample the effect of porosity is studied using Hapke (2008).

• Journal of the Korean Vacuum Society
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• v.17 no.3
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• pp.204-210
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• 2008

ZnO thin films were grown on a glass by RF sputtering system with RF power 100W and oxygen partial pressure of $0%{/sim}30%$. Elliptic constants were measured by using a phase modulated spectroscopic ellipsometer and analyzed with the Tauc-Lorentz dispersion formula and best fit method in the range of 1.5 to 3.8eV. Also, scanning electron microscope(SEM) was used for the analysis of surface crystallization condition. From elliptic constants spectra, optical constants, thickness and roughness of ZnO films were evaluated. Total thickness of ZnO films obtained by ellipsometry showed good agreement with SEM data. It was found that the grain size of the films were getting smaller with increasing oxygen partial pressure. Band-gap of ZnO films increase with the oxygen partial pressure. These findings clearly indicate that optical properties of ZnO films are strongly dependent on the oxygen partial pressure. It could be explained that increasing the oxygen partial pressure induced high crystalline imperfection in the ZnO films.

• Fire Science and Engineering
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• v.30 no.1
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• pp.37-42
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• 2016

The dimensionless extinction constants of smoke particles produced from burning of soy methyl ester (B100) biodiesel and ultra low sulfur diesel (ULSD) fuels were measured. To this end, optical measurements of smoke volume fraction with the aid of a He-Ne laser at 633 nm were compared to the simultaneous gravimetric measurements. The average value of measured dimensionless extinction constants at 633 nm was 11.8 for biodiesel smoke particles and 11.1 for diesel smoke particles, respectively whose values are very comparable withing the range of measurement uncertainty (${\pm}10.1%$). The analysis of Raman spectroscopy revealed that overall characteristics of light extinction between particles produced from each fuel may differ from each other.

• Korean Journal of Optics and Photonics
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• v.35 no.1
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• pp.1-8
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• 2024

Explicit expressions for the transmission pseudo-ellipsometric constants and transmittance of a semi-transparent glass substrate coated with thin films are presented to determine the optical constants of a very weakly absorbing thin film coated on a glass substrate. The intensity of the multiply reflected light inside the semi-transparent substrate is superposed incoherently and the light absorption by the substrate is properly treated, so that modeling analysis of thin films coated on a semi-transparent substrate can be performed with increased accuracy. The extinction coefficient derived from transmittance analysis is compared to that from ellipsometric analysis in the weakly absorbing region, and the difference between the two extinction coefficients is discussed in relation to the sensitivities of the transmittance and ellipsometric constants. This transmittance analysis, together with ellipsometric analysis, is applied to a glass substrate coated with a SiN thin film, and it is shown that the thickness and complex refractive index of the SiN thin film can be determined accurately, even though the extinction coefficient is very small.

• Korean Journal of Optics and Photonics
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• v.13 no.3
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• pp.215-222
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• 2002

Using an in-situ ellipsometer, we monitored the growth curve of optical recording media in real time. For confirmation of the thickness control using in-situ ellipsometry, we analyzed the deposited multi-layer sample made of Ge-Sb-Te alloy film and ZnS-Si0$_2$ dielectric films using an exsitu spectroscopic ellipsometer. The target material in the first sputtering gun is ZnS-SiO$_2$ as the protecting dielectric layer and that in the second gun is Ge$_2$sb$_2$Te$_{5}$ as the receding layer. While depositing ZnS-SiO$_2$, Ge$_2$Sb$_2$Te$_{5}$ and ZnS-SiO$_2$ films on c-Si substrate in sequence, we measured Ψ $\Delta$ in real time. Utilizing the complex refractive indices of Ge$_2$Sb$_2$Te$_{5}$ and ZnS-SiO$_2$ obtained from the analysis of spectroscopic ellipsometry data, the evolution of ellipsometric constants Ψ, $\Delta$ with thickness is calculated. By comparing the calculated evolution curve of ellipsometric constants with the measured one, and by analyzing the effect of density variation of the Ge$_2$Sb$_2$Te$_{5}$ recording layer on ellipsometric constants with thickness, we precisely monitored the growth rate of the Ge-Sb-Te multilayer and controlled the growth process. The deviation of the real thicknesses of Ge-Sb-Te multilayer obtained under the strict monitoring is post confirmed to be less than 1.5% from the target structure of ZnS-SiO$_2$(1400 $\AA$)IGST(200 $\AA$)$\mid$ZnS-SiO$_2$(200$\AA$).(200$\AA$).

• Journal of the Korean Chemical Society
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• v.36 no.1
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• pp.38-43
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• 1992

The Hammett's substituent constants were interpreted for substituted stilbenes by HMO method. The appropriate quantum chemical indices are chosen as independent contribution of the inductive and the resonance effects for substituent constants. It has been found that theoretical values, ${\sigma}_p{^{th}}$, defined as sum of the net charge, self atom polarizability and difference in HOMO energy between substituted- and unsubstituted-stilbenes, correlated with experimental Hammett's substituent constants. The dipole moments were found to be correlated with differences in ${\sigma}_p{^{th}}$ between two substituents for disubstituted stilbenes. It has been also found that transition optical spectra, ${\lambda}_{max}$ of the substituted stilbenes depend on difference between the HOMO and the LUMO energy as expected.