• Bulletin of the Korean Chemical Society
• /
• v.23 no.3
• /
• pp.469-476
• /
• 2002

Photocrosslinkable soluble polyimide and polymethacrylate compound were synthesized for studying the optically induced anisotropy of the thin films. Chalcone group was introduced into the side chain unit of two polymers. We observed a photodimerization behavior between the double bonds in the chalcone group and an optical anisotropy of these materials by irradiation of a linearly polarized UV light (LPL). Optical anisotropy of the thin film was also investigated by using polarized UV absorption spectroscopy. The dynamic property of optical anisotropy in photoreactive polyimide was compared to that in polymethacrylate containing chalcone group in the side chain.

• Korean Journal of Optics and Photonics
• /
• v.20 no.5
• /
• pp.281-287
• /
• 2009

The optical anisotropy of rubbed PI(polyimide) film on patterned LCD glass substrate is analyzed using polarimetry. The direction of the optic axis and the magnitude of the very small retardation ($\sim$ 0.4 nm or less) is precisely measured by using a transmission ellipsometer. The variation of the optical anisotropy is presented as the curve of the optic axis versus the magnitude of the phase retardation and it is explained by using a simple optical model.

• Journal of the Optical Society of Korea
• /
• v.18 no.2
• /
• pp.156-161
• /
• 2014

Anisotropy profile of a rubbed polyimide film is investigated using both a modified ultra high precision transmission ellipsometer and the analysis software previously developed to determine the optic axis distribution of discotic liquid crystals in the wide view film. The distorted sinusoidal variation of the ellipsometric constants obtained at an oblique angle of incidence indicates that the optic axis varies from $14.7^{\circ}$ to $40.6^{\circ}$ from the sample plane. The magnitude and distribution of anisotropy is expressed in terms of no, ne, and the cosine-shaped tilt angle distribution of the optic axis in a rubbed polyimide film.

• Journal of Magnetics
• /
• v.20 no.1
• /
• pp.8-10
• /
• 2015

The magnetic anisotropy field plays an important role in spin-orbit-torque-induced magnetization dynamics with electric current injection. Here, we propose a magnetometric technique to measure the magnetic anisotropy field in nanostructured ferromagnetic thin films. This technique utilizes a magneto-optical Kerr effect microscope equipped with two-axis electromagnets. By measuring the out-of-plane hysteresis loops and then analyzing their saturated magnetization with respect to the in-plane magnetic field, the magnetic anisotropy field is uniquely quantified within the context of the Stoner-Wohlfarth theory. The present technique can be applied to small nanostructures, enabling in-situ determination of the magnetic anisotropy field of nanodevices.

• Korean Journal of Optics and Photonics
• /
• v.23 no.6
• /
• pp.274-280
• /
• 2012

A normal incidence ellipsometer is fabricated to measure the optical anisotropy of a small spot whose diameter is less than $8.0{\mu}m$, by adding a beam splitter and a prism to the conventional rotating analyzer type ellipsometer. The polarizing actions of the added optical components are calibrated to improve the accuracy of the anisotropy measurement. The standard deviation of the optical anisotropy factor decreased to 0.00083, and the variation of the optical anisotropy factor of rutile versus sample azimuth angle variation also decreased to 0.015, after adoption of a non-polarizing beam splitter and a quarter wavelength phase retarder, followed by removal of the optical fiber and a careful choice of measurement wavelength.

• Korean Journal of Optics and Photonics
• /
• v.26 no.4
• /
• pp.195-202
• /
• 2015

We developed a reflection ellipsometer so that one can measure the extremely small optical anisotropy of a rubbed polyimide alignment layer, without being disturbed by the residual anisotropy of the substrate. The optical anisotropy of the alignment layer was measured as rubbing strength was increased, and the measured anisotropy was compared to the retardation obtained by using a transmission-type ellipsometer, to confirm the reliability of our reflection ellipsometer. With this measured anisotropy we could verify the formation of an alignment layer by rubbing, and could quantitatively evaluate the formation of the alignment layer.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2008.06a
• /
• pp.399-400
• /
• 2008

The light efficiency of fringe-field switching (FFS) mode when using a liquid crystal (LC) with positive dielectric anisotropy was found to be dependent on the magnitude of dielectric anisotropy, such that the lower dielectric anisotropy, the higher. We studied out not only light efficiency but also response time according to dependence on the magnitude of dielectric anisotropy. Rising and decay time became fast and slow respectively according to decreasing the magnitude of dielectric anisotropy. This paper investigates electro-optical characteristic of FFS mode using LC with a positive dielectric anisotropy dependent on the magnitude of dielectric anisotropy of the LC.

• Proceedings of the Optical Society of Korea Conference
• /
• 1988.06a
• /
• pp.127-131
• /
• 1988

In order to clarify the origin of perpendicular anisotropy in thermally evaporated TbFeCo amorphous thin films, we have investigated the effects of deposition angle on magnetic Kerr hysteresis loop, perpendicular magnetic anisotropy and internal stress depend strongly on the deposition angle and above a threshold value(30$^{\circ}$), the perpendicular anisotropy disapperars and the in-plane anisotropy appears. The measurement of internal stress is the major contribution to the perpendicular anisotropy. The measurements of Kerr hysteresis loops in the polar and the longitudinal directions show that as the deposition angle increases the polar kerr hystresis loop deteriorates while the longitudinal Kerr hystersis loop becomes prominent.

• 한국정보디스플레이학회:학술대회논문집
• /
• 2005.07b
• /
• pp.1351-1354
• /
• 2005

We report on the photoalignment process of pentacene thin film with optical anisotropy on treated buffer layers. The photopolymer, showing an anchoring transition, was used as a buffer layer to control the structural order of the pentacene molecules. Using the photoelastic modulator, it was found that the grain size and the optical anisotropy of the pentacene thin film were strongly correlated with each other.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2009.06a
• /
• pp.288-288
• /
• 2009

We have studied polarity effects of dielectric anisotropy effects on electro-optical characteristics of a twisted nematic mode driven by fringe electric field, which has wide viewing angle characteristics. Our device is designed as normally black mode between parallel polarizers. The perfect polarization conversion of incident light, which passes through a polarizer, is achieved, when it passes through the twisted liquid crystal (LC) layer. If an electric field is applied, the LC molecules with a positive (or negative) dielectric anisotropy rotate parallel (or perpendicular) to the horizontal component of a fringe electric field as increasing transmittance. From the calculated results, enhanced transmittance of the fringe field-twisted nematic (FF-TN) mode with positive dielectric anisotropy of + 8.2 can be obtained.