• Title/Summary/Keyword: non-polarizer

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High Contrast Red, Green, and Blue Organic Lightemitting Diodes using Inorganic Metal Multi Layers

  • Kim, You-Hyun;Lee, Sang-Youn;Song, Wook;Mong, Mei;Kim, Woo-Young
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.787-790
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    • 2009
  • High contrast red, green and blue organic light-emitting diodes were fabricated using inorganic metal multi layer composed of thin Al, KCl and thick Al and then were compared to optical and electrical characteristics with the attached polarizer and conventional OLEDs. Ambient light reflection of OLED using inorganic metal layer, polarizer and conventional metal layer were 29.2, 31.1 and 82.5% respectively. Optical characteristics of OLEDs using inorganic metal layer were max luminescence of 13040 cd/m2 and luminous efficiency of 2.12 cd/A at 8V whereas OLEDs using polarizer has 8456 cd/m2 and 1.43 cd/A at 8V each. OLEDs including inorganic metal multi layers show significant technical advantages in achieving high performance of OLED display with improved contrast ratio of 251:1, specifically in Red OLED.

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Metastable Vortex State of Perpendicular Magnetic Anisotropy Free Layer in Spin Transfer Torque Magnetic Tunneling Junctions

  • You, Chun-Yeol;Kim, Hyungsuk
    • Journal of Magnetics
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    • v.18 no.4
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    • pp.380-385
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    • 2013
  • We find a metastable vortex state of the perpendicular magnetic anisotropy free layer in spin transfer torque magnetic tunneling junctions by using micromagnetic simulations. The metastable vortex state does not exist in a single layer, and it is only found in the trilayer structure with the perpendicular magnetic anisotropy polarizer layer. It is revealed that the physical origin is the non-uniform stray field from the polarizer layer.

Development of the Non-Contact Torque Sensor for EPAS Using Maluss Polarization Law (Malus의 편광법칙을 이용한 EPAS용 비접촉 torque sensor 개발)

  • Roh, Byung-Ok;Park, Ho;Kang, Pan-Shik
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.25 no.7
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    • pp.1039-1046
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    • 2001
  • Among the automotive steering systems, an Electric Power Assisted steering (EPAS) system utilizes an electronically controlled electric motor to provide steering assistance to the driver. The key components of the EPAS system are torque sensor, ECU (Electronic Control Unit), and DC Motor. The most important component of the EPAS is the torque sensor. The conventional torque sensor has complicated mechanical mechanism of torque detection. However, we suggest a non-contact torque sensor for EPAS using Maluss polarization law. It was found that the sensor exhibited not only excellent linearity but also superior characteristics of hysteresis, temperature and vibration.

1.5' Full Color ECR(Enhanced Contrast Ratio) OLED Using Black Layer Technology

  • Kang, Seong-Jong;E, Jung-Yoon;Roh, Byeong-Gyu;Lee, Jong-Ho;Kim, Woo-Young
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.1394-1397
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    • 2005
  • Hyundai LCD Inc. and LUXELL Technologies Inc. have jointly developed a 1.5" passive matrix full color OLED display ($132{\times}RGB{\times}96$, 111ppi) with characteristics of enhanced contrast ratio using black layer technology. This prototype ECR OLED was fabricated with the structure of ITO/HIL/HTL/RGB EML/HBL/ETL/LiF/Black Layer/Cathode and showed significant improvement of contrast ratio comparing with that of non-filtered OLED as well as compatible with circular polarizer OLED

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Optimal Design of Liquid Crystal Display Devices Using Electro-optic Characteristics of Liquid Crystal Cell: I. Monochromatic Case (액정셀의 전기광학적 편광투과특성을 이용한 액정표시소자의 최적설계: I. 단색광의 경우)

  • 노봉규;김규석;김진승
    • Korean Journal of Optics and Photonics
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    • v.5 no.3
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    • pp.411-417
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    • 1994
  • The electro-optic polarization transmission characteristics of a liquid crystal (LC) cell is represented by a rotational transformation on the Poincare sphere, and its characteristic parameters, the angle and the axis of the rotation, are experimentally determined with respect to the voltage applied to the LC cell. From the experimental data obtained, we determine driving voltage for the LC cell to give the rotation angle near $180^{\circ}$ of the rotation for the change of the state of the LC cell from non-select to select state, which is a necessary condition for the realization of maximally bright images. The directions of the transmission axes of the polarizer and the analyzer which form a liquid crystal display panel together with the LC cell, are determined from the general characteristics of the rotaional transformation of the LC cell. cell.

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Polarization Phase-shifting Technique for the Determination of a Transparent Thin Film's Thickness Using a Modified Sagnac Interferometer

  • Kaewon, Rapeepan;Pawong, Chutchai;Chitaree, Ratchapak;Bhatranand, Apichai
    • Current Optics and Photonics
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    • v.2 no.5
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    • pp.474-481
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    • 2018
  • We propose a polarization phase-shifting technique to investigate the thickness of $Ta_2O_5$ thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized beams traveling in opposite directions, and a quarter-wave plate is inserted into the common path to create an unbalanced phase condition. The linearly polarized light beams are transformed into two circularly polarized beams by transmission through a quarter-wave plate placed at the output of the interferometer. The proposed setup, therefore, yields rotating polarized light that can be used to extract a relative phase via the self-reference system. A thin-film sample inserted into the cyclic path modifies the output signal, in terms of the phase retardation. This technique utilizes three phase-shifted intensities to evaluate the phase retardation via simple signal processing, without manual adjustment of the output polarizer, which subsequently allows the thin film's thickness to be determined. Experimental results show that the thicknesses obtained from the proposed setup are in good agreement with those acquired by a field-emission scanning electron microscope and a spectroscopic ellipsometer. Thus, the proposed interferometric arrangement can be utilized reliably for non-contact thickness measurements of transparent thin films and characterization of optical devices.