• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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• pp.787-790
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• 2009

High contrast red, green and blue organic light-emitting diodes were fabricated using inorganic metal multi layer composed of thin Al, KCl and thick Al and then were compared to optical and electrical characteristics with the attached polarizer and conventional OLEDs. Ambient light reflection of OLED using inorganic metal layer, polarizer and conventional metal layer were 29.2, 31.1 and 82.5% respectively. Optical characteristics of OLEDs using inorganic metal layer were max luminescence of 13040 cd/m2 and luminous efficiency of 2.12 cd/A at 8V whereas OLEDs using polarizer has 8456 cd/m2 and 1.43 cd/A at 8V each. OLEDs including inorganic metal multi layers show significant technical advantages in achieving high performance of OLED display with improved contrast ratio of 251:1, specifically in Red OLED.

• Journal of Magnetics
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• 제18권4호
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• pp.380-385
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• 2013

We find a metastable vortex state of the perpendicular magnetic anisotropy free layer in spin transfer torque magnetic tunneling junctions by using micromagnetic simulations. The metastable vortex state does not exist in a single layer, and it is only found in the trilayer structure with the perpendicular magnetic anisotropy polarizer layer. It is revealed that the physical origin is the non-uniform stray field from the polarizer layer.

• 대한기계학회논문집A
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• 제25권7호
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• pp.1039-1046
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• 2001

Among the automotive steering systems, an Electric Power Assisted steering (EPAS) system utilizes an electronically controlled electric motor to provide steering assistance to the driver. The key components of the EPAS system are torque sensor, ECU (Electronic Control Unit), and DC Motor. The most important component of the EPAS is the torque sensor. The conventional torque sensor has complicated mechanical mechanism of torque detection. However, we suggest a non-contact torque sensor for EPAS using Maluss polarization law. It was found that the sensor exhibited not only excellent linearity but also superior characteristics of hysteresis, temperature and vibration.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2005년도 International Meeting on Information Displayvol.II
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• pp.1394-1397
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• 2005

Hyundai LCD Inc. and LUXELL Technologies Inc. have jointly developed a 1.5" passive matrix full color OLED display ($132{\times}RGB{\times}96$, 111ppi) with characteristics of enhanced contrast ratio using black layer technology. This prototype ECR OLED was fabricated with the structure of ITO/HIL/HTL/RGB EML/HBL/ETL/LiF/Black Layer/Cathode and showed significant improvement of contrast ratio comparing with that of non-filtered OLED as well as compatible with circular polarizer OLED

• 한국광학회지
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• 제5권3호
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• pp.411-417
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• 1994

액정층을 지나는 빛의 편광상태의 변화를 뽀앙카레공에서의 회전변환으로 나타내어, 액정층에 걸어준 전압에 대한 회전변환이 회전각과 회전축의 변화를 쟀다. 이로부터 액정셀에 걸린 전압이 비선택전압에서 선택전압으로 바뀔 때의 회전변환의 회전각이 $180^{\circ}$에 가장 가까운 구동전압을 결정하고, 이 전압으로 액정셀을 구동할 때 화면의 콘트라스트 및 투과율이 최대가 되는 현광판과 검광판의 투과축의 방향을 회전변환의 일반적인 특성을 써서 결정하고 실험적으로 확인하였다.

• Current Optics and Photonics
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• 제2권5호
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• pp.474-481
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• 2018

We propose a polarization phase-shifting technique to investigate the thickness of $Ta_2O_5$ thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized beams traveling in opposite directions, and a quarter-wave plate is inserted into the common path to create an unbalanced phase condition. The linearly polarized light beams are transformed into two circularly polarized beams by transmission through a quarter-wave plate placed at the output of the interferometer. The proposed setup, therefore, yields rotating polarized light that can be used to extract a relative phase via the self-reference system. A thin-film sample inserted into the cyclic path modifies the output signal, in terms of the phase retardation. This technique utilizes three phase-shifted intensities to evaluate the phase retardation via simple signal processing, without manual adjustment of the output polarizer, which subsequently allows the thin film's thickness to be determined. Experimental results show that the thicknesses obtained from the proposed setup are in good agreement with those acquired by a field-emission scanning electron microscope and a spectroscopic ellipsometer. Thus, the proposed interferometric arrangement can be utilized reliably for non-contact thickness measurements of transparent thin films and characterization of optical devices.