• Journal of the Korean Crystal Growth and Crystal Technology
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• v.8 no.3
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• pp.424-430
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• 1998

Film characteristics of thin ONO dielectric layers for MONOS (metal-oxide-nitride-oxide-semiconductor) EEPROM was investigated by AES, SIMS, TEM and AFM. The ONO films with different dimension of tunneling oxide, nitride, and blocking oxide were fabricated. During deposition of the LPCVD nitride films on tunneling oxide, this thin oxide was nitrized. When the blocking oxide were deposited on the nitride film, the oxygen not only oxidized the nitride surface, but diffused through the nitride. The results of ONO film analysis exhibits that it is made up of $SiO_2$(blocking oxide)/O-rich SiOxNy (interface)/ N-rich SiOxNy(nitride)/O-rich SiOxNy(tunneling oxide). In addition, the SiON phase is distributed mainly near the tunneling oxide/nitride and nitride/blocking oxide interfaces, and the $Si_2NO$ phase is distributed mainly at nitride side of each interfaces and in tunneling oxide.

• Transactions on Electrical and Electronic Materials
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• v.9 no.6
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• pp.231-236
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• 2008

B, P, and Cs ions were implanted with various parameters into silicon nitride layers prepared by LPCVD. In order to get the maximum impurity concentration at the silicon nitride surface, a high temperature oxide (HTO) buffer layers was deposited prior to the implantation. Alkali ion and pH sensing properties of the layers were investigated with an electrolyte-insulator-silicon (EIS) structure using high frequency capacitance-voltage (HF-CV) measurements. The ion sensing properties of implanted silicon nitrides were compared to those of as-deposited silicon nitride. Band Cs co-implanted silicon nitrides showed a pronounced difference in pH and alkali ion sensing properties compared to those of as-deposited silicon nitride. B or P implanted silicon nitrides in contrast showed similar ion sensitivities like those of as-deposited silicon nitride.

• Journal of the Korean Ceramic Society
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• v.35 no.2
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• pp.115-122
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• 1998

The effect of sintering conditions on the sinterability for silicon nitride has been studied by many in-vestigators. However the effect of sintering conditions on the machinability which is the major barrier to the field applications of the ceramic components has not been fully studied. In this study the sintering con-ditions such as temperature gas pressure and time in silicon nitride were varied. The physical and mechan-ical properties of the gas pressure sintered (GPS) silicon nitride were measured. The optimum mi-crostructure of silicon nitride with the excellent machinability was investigated by MFG(magnetic-fluid grinding) technique. An attempt was made to figure out how the mechanical properties influence upon the machinability of silicon nitride ball.

• Journal of Welding and Joining
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• v.20 no.3
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• pp.116-121
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• 2002

For the accumulation of a fundamental knowledge about the behavior of glass solder during the joining of ceramics, the wettability of solder on silicon nitride have been measured by sessile drop method. $SiO_2-MgO-Al_2O_3$ g1ass solder and oxynitride glass solders were selected as examples while silicon nitride which were used as substrates. Contact angle of solder on silicon nitride didn't decrease with time at high nitrogen content in the solder, but low nitrogen content in solders have the time-dependent property. Reason which contact angle of low nitrogen content in solders decrease on silicon nitride was that diffusion of nitrogen take place between solder and silicon nitride.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.11 no.10
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• pp.778-783
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• 1998

Film characteristics of thin ONO dielectric layers for MONOS(metal-oxide-nitride-oxide-semiconductor) EEPROM was investigated by TEM, AES and AFM. Seocnd derivative spectra of Auger Si LVV overlapping peak provide useful information fot chemical state analysis of superthin film. The ONO film with dimension of tunnel oxide 23$\AA$, nitride 33$\AA$, and blocking oxide 40$\AA$ was fabricated. During deposition of the LPCVD nitride film on tunnel oxide, this thin oxide was nitrized. When the blocking oxide was deposited on the nitride film, the oxygen not only oxidized the nitride surface, but diffused through the nitride. The results of ONO film analysis exhibits that it is made up of $SiO_2$ (blocking oxide)/O-rich SiON(interface)/N-rich SiON(nitride)/ O-rich SiON(tunnel oxide)

• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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• 1999.11a
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• pp.84-93
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• 1999

Sliding friction and wear tests for silicon nitride(Si$_3$N$_4$) was carried out with a ball-on-disk specimen configuration. The material used in this study was HIPed silicon nitride. The tests was carried out from room temperature to 1000"I with self mated couples of slicon nitride in laboratory air. Worn surfaces were observed by SEM and debris particles from worn surfaces were analyzed degree of oxidation by XPS. XPS.

• 한국신재생에너지학회:학술대회논문집
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• 2010.11a
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• pp.56.1-56.1
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• 2010

결정질 실리콘 태양전지의 표면 ARC(Anti-reflection Coating)layer는 반사도를 줄여 광 흡수율을 증가시키고, passivation 효과를 통하여 표면 재결합을 감소 시켜 태양전지의 효율을 높이는 중요한 역할을 한다. Silicon nitride 박막은 외부 stress 요인에 대해 안정성을 담보할 수 있어야한다. 따라서, 본 연구에서는 굴절률 가변에 따른 silicon nitride 박막을 PECVD를 이용하여 증착하고, 항온/항습 stability test를 통해 박막의 안정성을 확인하였다. Silicon nitride 증착을 위해 PECVD를 이용하였고, 공정압력 0.8Torr, 증착온도 $450^{\circ}C$, 증착파워 300W에서 실험을 진행하였다 박막의 굴절률은 1.9~2.3의 범위로 가변하였다. 항온/항습에 대한 신뢰성을 test 하기 위하여 5시간동안의 test를 1cycle로 하여 20회 동안 실험을 실시하였다. 증착된 silicon nitride 박막의 lifetime은 firing 이후 57.8us로 가장 높았으며, 항온/항습 test 이후에도 유사한 경향을 확인 할 수 있었다. 또한, 100h 동안의 항온/항습 test 결과 silicon nitride 박막의 lifetme 감소는 8.5%에 불과했다. 본 연구를 통하여 온도와 습도의 변화에 따른 결정질 실리콘 태양전지의 SiNx 박막의 증착 공정 조건에 대한 신뢰성을 확인 할 수 있었다.

• Journal of Welding and Joining
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• v.28 no.6
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• pp.40-44
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• 2010

Laser assisted machining (LAM) has been researched in order to machine the silicon nitride ceramics economically and effectively. LAM is an effective machining method by local heating of the cutting part to the softening temperature of the silicon nitride using laser beam. When silicon nitride ceramics is heated using a laser beam, the surface of silicon nitride ceramic is softened, oxidized and decomposed. And then surface hardness is decreased. Through machining in low viscosity and hardness conditions, silicon nitride was machined effectively and the life span of tool was increased. The plastic deformation was occurred due to softening of amorphous YSiAlON above $ 1,000^{\circ}C$. Transgranular fracture of ${\beta}-Si_3N_4$ was occurred when YSiAlON was not softened, but mostly intergranular fracture was occurred by the plastic deformation of softened YSiAlON.

• Tribology and Lubricants
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• v.16 no.4
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• pp.282-288
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• 2000

A sliding friction and wear test for silicon nitride (Si,N4) was conducted using a ball-on-disk specimen configuration. The material used in this study was HIPed silicon nitride. The tests were carried out from room temperature to 1000$^{\circ}C$ using self-mated silicon nitride couples in laboratory air. The worn surfaces were observed by SEM and the debris particles from the worn surfaces were analyzed for oxidation by XPS. The normal load was found to have a more significant influence on the friction coefficient of the silicon nitride than an elevated temperature. The specific wear rate was found to decrease along with the sliding distance. The specific wear rate at 29.4 N and 1000$^{\circ}C$ was 292 times larger than that at room temperature. The main wear mechanism from room temperature to 750$^{\circ}C$ was caused by brittle fracture whereas from 750$^{\circ}C$ to 1000$^{\circ}C$ the wear mechanism was mainly influenced by the oxidation of silicon nitride due to the increased temperature. The oxidation of silicon nitride at a high temperature was a significant factor in the wear increase.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1998.06a
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• pp.79-82
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• 1998

Film characteristics of thin ONO dielectric layers for MONOS(metal-oxide-nitride-oxide-semiconductor) EEPRM was investigated by AES and AFM. Second derivative spectra of AES Si LVV overlapping peak provided useful information for chemical state analysis of superthin film. The ONO films with dimension of tunneling oxide 24${\AA}$, nitride 33${\AA}$, and blocking oxide 40${\AA}$ were fabricated. During deposition of the LPCVD nitride films on tunneling oxide, this thin oxide was nitrized. When the blocking oxide were deposited on the nitride film, the oxygen not only oxidized the nitride surface, but diffused through the nitride. The results of ONO film analysis exhibits that it is made up of SiO$_2$(blocking oxide)/O-rich SiON(interface/N-rich SiON(nitride)/-rich SiON(interface)/N-rich SiON(nitride)/O-rich SiON(tunneling oxide).