• Journal of electromagnetic engineering and science
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• v.10 no.2
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• pp.73-77
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• 2010

This paper proposes a novel memory effect measurement technique in RF power amplifiers(PAs) using a two-tone intermodulation distortion(IMD) signal with a very simple and intuitive algorithm. Based on the proposed predistortive tone cancellation technique, the proposed measurement method is capable of measuring the relative phase and magnitude of the third-order and fifth-order IMDs, as well as the fundamental signal. The measured relative phase between the higher and lower IMD signal for specific tone spacing can be interpreted as the group delay(GD) information of the IMD signal concerned. From the group delay analysis, we can conclude that an adaptive control of GD as well as the magnitude and phase is a key function in increasing the linearization bandwidth and the dynamic range in a predistortion(PD) technique.

• Journal of the Korean Society for Precision Engineering
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• v.19 no.9
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• pp.172-178
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• 2002

One of the ever-increasing demands on the performances of heterodyne interferometers is to improve the measurement resolution, of which current state -of-the-art reaches the region of sub-nanometers. So far, the demand has been met by increasing the clock speed that drives the electronics involved fur the phase measurement of the Doppler shift, but its further advance is being hampered by the technological limit of modem electronics. To cope with the problem, in this investigation, we propose a new scheme of phase -measuring electronics that reduces the measurement resolution without further increase in clock speed. Our scheme adopts a super-heterodyne technique that lowers the original beat frequency to a level of 1 MHz by mixing it with a stable reference signal generated from a special phase- locked-loop. The technique enables us to measure the phase of Doppler shift with a resolution of 1.58 nanometer at a sampling rate of 1 MHz. To avoid the undesirable decrease in the maximum measurable speed caused by the lowered beat frequency, a special form of frequency up-down counting technique is combined with the super-heterodyning. This allows performing required phase unwrapping simply by using programmable digital gates without 2n ambiguities up to the maximum velocity guaranteed by the original beat frequency.

• Current Optics and Photonics
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• v.2 no.6
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• pp.568-575
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• 2018

Various techniques to measure the three-dimensional (3D) surface profile of a 3D micro- or nanostructure have been proposed. However, it is difficult to apply such techniques directly to industrial uses because most of them are relatively slow, unreliable, and expensive. The HiLo optical imaging technique, which was recently introduced in the field of fluorescence imaging, is a promising wide-field imaging technique capable of high-speed imaging with a simple optical configuration. It has not been used in measuring a 3D surface profile although confocal microscopy originally developed for fluorescence imaging has been adapted to the field of 3D optical measurement for a long time. In this paper, to the best of our knowledge, the HiLo optical imaging technique for measuring a 3D surface profile is proposed for the first time. Its optical configuration and algorithm for a precisely detecting surface position are designed, optimized, and implemented. Optical performance for several 3D microscale structures is evaluated, and it is confirmed that the capability of measuring a 3D surface profile with HiLo optical imaging technique is comparable to that with confocal microscopy.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1995.10a
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• pp.415-418
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• 1995

This paper describes a new technique for thickness measurement of a very thin layer less than one-quarter of the wavelength of ultrasonic wave using ultrasonic pulse-echo method. The technique determines the thickness of a thin layer in a layered medium form the amplitudes of the total reflected waves from the back side layer of interst. Thickness of a very thin layer few inch deep inside the media can be measured without using a very high frequency ultrasonic transducer over 100MHz which must be used in the conventional techniques for the precision measurement of a thin layer. The method also requires no inversion process to extract the thickness from the waveform of the reflected waves, so that it makes possible on-line measurement of the thickness of the layer.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2002.10a
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• pp.391-395
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• 2002

This paper described about the ultra-precision profile measurement of aspheric surfaces using contact probing technique. A contact probe has been designed as a sensing device to obtain measuring resolutions in nanometer regime utilizing a leaf spring mechanism and a capacitive-type sensor. The contact probe is attached on the z-axis during measurement while aspheric objects are supported on the single point diamond turning machine(SPDTM). The machine xz-axis motions are monitored by a set of two orthogonal plane mirror type laser interferometers. Experimental results show that the contact probing technique developed of On-machine Measurement System in this investigation is capable of providing a repeatability of 20 nanometers with a $\pm$20 uncertainty of 300 nanometers.

• Journal of the Optical Society of Korea
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• v.9 no.2
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• pp.54-58
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• 2005

A novel mode analysis method and differential mode delay measurement technique for a multimode optical fiber based on optical frequency domain reflectometry has been proposed for the first time. We have used a conventional OFDR with a tunable external cavity laser and a Michelson interferometer. A few-mode optical multimode fiber was prepared to test our proposed measurement technique. The differential mode delay (DMD) of the sample fiber was measured to be 16.58 ps/m with a resolution of 1.5 ps/m. We have also compared the OFDR measurement results with those obtained using a traditional time-domain measurement method.

• Journal of Ocean Engineering and Technology
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• v.16 no.2
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• pp.60-66
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• 2002

The remote measurement system(RMS) as a new experimental method is limited in its application to crack measurement at elevated temperatures because of the oxide layer on the specimen surface. Since TiAIN and Cr coating layers have a high resistance to oxidation and wear, this paper proposed a TiAIN and Cr coating technique for specimens to facilitate the measurement of crack growth behavior using RMS. To investigate the effects of the coating layer, tension and fatigue tests were carried out at room temperature and at $538^{\circ}C$. The test material was 1Cr-1Mo-0.25V steel which is widely used as a turbine rotor material. From the experimental results, it was found that the mechanical properties of the TiAIN and Cr coated specimens were similar to those of the substrate. Accordingly, the TiAIN and Cr coated layer had hardly any influence on the fatigue crack propagation.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.56 no.4
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• pp.157-160
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• 2007

The van der Pauw technique is one of the popular methods for determining the conductivity of flat metal samples. Traceability of the national standard for the conductivity has been achieved by direct current measurement techniques in national measurement institutes of many countries. But recently, alternative current measurement techniques for determining the conductivity of flat metal samples is also interested. In this study, we measured the conductivity of non-ferrous and ferrous flat metals at alternative current using van der Pauw technique. As measurement results, the conductivities of the samples were decreased according to increasing the test frequency even though the decreasing ratio was different.

• Journal of the Korean Society of Propulsion Engineers
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• v.13 no.3
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• pp.9-19
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• 2009

Accurate thrust measurement is very important when developing an engine of propulsion system. Especially for a low thrust liquid rocket engine(LRE), accuracy of thrust is seriously affected by thrust measurement errors and thurst losses which are caused by propellant supply system. In this study, a new thrust measurement system is developed for accurate thrust measurement of a low thurst LRE by minimizing these effects. Its thrust measurement range is 150~1500N and the maximum error is below 10N. Also, a reliability appraisal technique is investigated to improve reliability and accuracy of the thrust measurement system.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.24 no.3
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• pp.253-258
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• 2013

In this paper, a free-space material measurement technique is discussed in W-band(75~110 GHz). For the accurate measurement of S-parameters of an MUT(Material Under Test) in free space, a W-band quasi-optical free-space material measurement system, less affected by the measurement environments, is discussed, and GRL(Gated Reflect Line) method for calibrating the measurement system is described. Proposed technique is verified for 'Air' and measurement results for arystal plates of thickness 1.1 mm, 2 mm, 2.75 mm and 5 mm are also shown.