• The Korean Journal of Ceramics
• /
• 제7권1호
• /
• pp.26-29
• /
• 2001

Indium tin oxide (ITO) films were deposited on glass substrates at $300^{\circ}C$ in oxygen/argon mixtures by RF-enhanced DC-magnetron sputtering and were compared to those by conventional DC magnetron sputtering. The RF enhancement was performed using a coil above an ITO target. X-ray diffraction measurements revealed that RF-enhanced plasma affected the preferred orientation and the crystallinity of the films. The resistivity of the films prepared by RF-enhanced DC-magnetron sputtering was almost constant at oxygen content lower than 0.3% and then increased sharply with increasing oxygen content. However the resistivity of the films by conventional sputtering has little dependence on the oxygen content. Those results can be explained on the basis of the incorporation of oxygen into the ITO films due to the RF enhancement.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
• /
• pp.256-256
• /
• 2013

기존에 사용되어 오던 DCMS (DC magnetron sputtering)과 HPPMS (high-power pulsed magnetron sputtering)에 비해 MPP를 이용한 magnetron sputtering은 높은 증착률을 가지고 있으며, 증착된 박막의 특성도 우수하다고 알려져 있다. 본 연구에서는 최대 출력 700 V, 12.5 A, 100 kHz)의 사양을 가지는 DC, pulse DC, modulated pulsed DC의 세 종류로 변환이 가능한 Power supply를 제작하여 Cr 박막을 증착하였다. 증착시 혼합기체 Ar/$N_2$를 사용하였으며, 박막의 특성을 sputtering power 종류별로 비교 평가하였다. 실험 결과얻어진 박막을 SEM과 XRD를 이용하여 분석하였다.

• 대한전기학회논문지:전기물성ㆍ응용부문C
• /
• 제55권11호
• /
• pp.538-543
• /
• 2006

A high-Power continuous-wave (CW) ten-vane double-strapped magnetron oscillator has been investigated using three-dimensional (3D) particle-in-cell (PIC) numerical simulation code, MAGIC3D. The resonant modes and their resonant frequencies of the ten-vane strapped magnetron resonator were obtained to show a large mode separation near the ${\pi}$-mode. An electron cloud formed in an anode-cathode gap, called an interaction space was confined well enough to result in no leakage current. Five spokes were clearly observed in the electron cloud, which definitely ensured the ${\pi}$-mode oscillation in the ten-vane magnetron. Numerical simulations predicted that the saturated microwave output power measured at the coaxial output port was 5.41 kW at the microwave frequency of 893 MHz, corresponding to a power conversion efficiency of 72.6% when the external axial magnetic field was 1150 gauss and the electron beam voltage and current were 6 kV and 1.25 A, respectively.

• Journal of Korean Vacuum Science & Technology
• /
• 제3권2호
• /
• pp.101-106
• /
• 1999

The main consideration factor to design a magnetron of the sputtering system for TFT-LCD metallization is high sheet resistance (Rs) uniformity which is provided by the high target erosion and high current efficiency. The present study has developed a rectangular magnetron for TFT-LCD to bve considered full target erosion and high film uniformity. After an aluminum-2 at.% and alloy target was installed in a magnetron source and the film was deposited on the glass of 600${\times}$720 mm, the Rs uniformity of the deposited film was measured as functions of the magnet tilt and magnet scanning configuration. And the target erosion profile was observed with the target voltage. When sputtered at 4mtorr and 10kW, the magnet tilt for the high Rs uniformity of 8.38% was 7mm. The plasma voltage at the dwell home and end for full-face target erosion, when scanned the magnetron was 120% compared to the mean voltage of the other area.

• Journal of Advanced Marine Engineering and Technology
• /
• 제28권7호
• /
• pp.1172-1177
• /
• 2004

This paper describes a output power control of magnetron for microwave oven. Magnetron is used extensively in household microwave oven and industrial microwave heating devices it is operated by 3000[V]～5000[V] dc high voltage. Power supply for driving magnetron is consisted of a bridge rectifier. HB(half bridge) inverter, full wave rectifier and gate drive circuit. In proposed system. we confirm that line input power can be controlled extensively and linearly to 24.56[%] by change of duty ratio of inverter through a experiment.

• 한국공작기계학회논문집
• /
• 제18권2호
• /
• pp.123-129
• /
• 2009

Magnetron is a compartment of microwave oven and it generates the microwave. In this paper, the program HUSAP is developed in order to perform the heat transfer, structure, and fatigue analysis of magnetron. By using it we can make the geometry of magnetron and can solve the governing equations which are formulated by finite element technique. In order to achieve the reliability of HUSAP, we compare it with experiment and commercial software ANSYS. And comparisons of observed results show that agreement is remarkably consistent.

• 한국재료학회지
• /
• 제7권1호
• /
• pp.27-32
• /
• 1997

본 연구에서는 고밀도 플라즈마를 형성하는 planar magnetron RF 플라즈마 CVD를 이용하여 DLC(diamond-like carbon) 박막을 합성하였다. 이 방법을 이용하여 DLC 박막을 합성한다면 고밀도 플라즈마 때문에 종래의 플라즈마 CVD(RF-PECVD)법보다 증착속도가 더욱더 향상될 것이라는 것에 착안하였다. 이를 위해 magnetron에 의한 고밀도 플라즈마가 존재할 때도 역시 DLC박막형성에 미치는 RF 전력과 반응가스 압력이 중요한 반응변수인가에 대해 조사하였고, 일정한 자기장의 세기에서 RF전력과 DC self-bias 전압과의 관계를 조사하였다. 또한 RF전력변화에 따른 박막의 증착속도와 밀도를 측정하였다. 본 연구에 의해 얻어진 박막의 증착속도는 magnetron에 의한 이온화율이 매우 높아 기존의 RF-PECVD 법보다 매우 빠르며, DLC박막의 구조와 물질특성을 알아보기 위해 FTIR(fourier transform infrared)및 Raman 분광분석을 행한 결과 전형적인 양질의 고경질 다이아몬드상 탄소박막임을 알 수 있었다.

• 한국표면공학회:학술대회논문집
• /
• 한국표면공학회 1998년도 추계학술발표회 초록집
• /
• pp.57-57
• /
• 1998

최근 건식도금 분야에 있어서 경제성의 확보를 위해 고속 증착에 관한 연구가 활발히 진행 중에 있다. 이러한 고속 증착의 방법으로서는 high current arc, laser arc, hollow cathode discharge 및 magnetron sputtering법 등이 대두되고 있다. 특히 이중 magnetron sputtering 법은 고밀도의 박막을 고속으로 증착활 수 있는 장점으로 인해 고속 증착의 효과적인 방법으로 크게 대두되고 있다. 이러한 magnetron sputtering 법을 이용한 고속 증착에 관한 연구는 Cu, Ag와 같은 순수 금속 박막의 경우 $1~3\mu\textrm{m}/min$의 증착율까지 확보한 연구결과가 이미 발표되 고 있다. 그러나 이러한 고속 증착에 관한 연구들은 순금속 박막의 증착에 한정되어 있고 화합물 박막의 고속 증착에 관한 연구결과는 거의 전무한 결과이다. 따라서 본 연구에서는 magnetron sputtering 법을 이용하여 Ti계와 Cr계의 화합물 박막을 고속으로 증착하였다. 포한 박막의 증착율 및 특성 분석을 위혜 a-step, XRD 및 SEM을 이용하였다. 본 연구의 결과 $0.25~0.38\mu\textrm{m}/min$. 증착율을 확보하였으며 XRD 분석을 통하여 화합물 박막의 합성여부를 확인하였고, 박막의 미소 경도값도 2300~2500HK의 값을 얻었다.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2010년도 제39회 하계학술대회 초록집
• /
• pp.203-203
• /
• 2010

Nano-crystalline Si thin films were deposited on polymer and glass by inductively coupled plasma (ICP) - assisted RF magnetron sputtering at low temperature in an argon and hydrogen atmosphere. Internal ICP coil was installed to increase hydrogen atoms dissociated by the induced magnetic field near the inlet of the working gases. The microstructure of deposited films was investigated with XRD, Raman spectroscopy and TEM. The crystalline volume fraction of the deposited films on polymer was about 70% at magnetron RF power of 600W and ICP RF power of 500W. Crystalline volume fraction was decreased slightly with increasing magnetron RF power due to thermal damage by ion bombardment. The diffraction peak consists of two peaks at $28.18^{\circ}$ and $47.10^{\circ}\;2{\theta}$ at magnetron RF power of 600W and ICP RF power of 500W, which correspond to the (111), (220) planes of crystalline Si, respectively. As magnetron power increase, (220) peak disappeared and a dominant diffraction plane was (111). In case of deposited films on glass, the diffraction peak consists of three peaks, which correspond to the (111), (220) and (311). As the substrate temperature increase, dominant diffraction plane was (220) and the thickness of incubation (amorphous) layer was decreased.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2003년도 춘계학술대회 논문집 센서 박막재료 반도체 세라믹
• /
• pp.49-52
• /
• 2003

The role of gas ratio with the crystallization behavior and electrical properties in $Bi_{3.25}La_{0.75}Ti_3O_{12}$(BLT) thin films by rf magnetron sputtering method has not been precisely defined. In this work, the ferroelectric properties of these films with gas variation was investigated. BLT thin films were deposited on the Pt/Ti bottom electrode by rf magnetron sputtering method and then they were crystallized by rapid thermal annealing (RTA). The experiment showed that all BLT films indicated perovskite polycrystalline structure with preferred orientation (020) and (0012). And no pyrochlore phase was observed. The fabricated film annealed with $O_2$ of 15 sccm showed that value of leakage current was $9.67{\times}10^{-7}A/cm^2$ at 50kV /em, and the value of remanent polarization (2Pr=Pr+-Pr-) was $11.8{\mu}C/cm^2$. Therefore we induce access to memory device application by rf-magnetron sputtering method in this report.