• Journal of Magnetics
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• v.19 no.3
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• pp.221-226
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• 2014

Significantly enhanced low-field magnetoresistance (LFMR) and maximum dMR/dH {$(dMR/dH)_{max}$} values were successfully achieved from $La_{0.7}Sr_{0.3}MnO_3$(LSMO)-manganese oxide composite samples prepared by liquid phase sintering, compared with those of the same composites prepared by solid state reaction. For this study, pure LSMO and LSMO-manganese oxide composites with various nominal compositions of (1-x)LSMO-$xMn_2O_3$ (x = 0.1, 0.2, 0.3, 0.4, and 0.8) were sintered at $1450^{\circ}C$, above the eutectic temperature of $1430^{\circ}C$, for 1 h in air. The highest LFMR value of 1.28% with the highest $(dMR/dH)_{max}$ value of 21.1% $kOe^{-1}$ was obtained from the composite sample with x = 0.3 at 290 K in 500 Oe. This enhancement of LFMR and $(dMR/dH)_{max}$ values is ascribed to efficient suppression of magnetic disorder at the LSMO grain boundary, by forming a characteristic LSMO-manganese eutectic structure.

• Journal of the Korean Magnetics Society
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• v.19 no.4
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• pp.121-125
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• 2009

Amorphous $Ge_1$_$_xMn_x$ semiconductor thin films grown by low temperature vapor deposition were annealed at various temperatures from 400 to $700^{\circ}C$ for 3 minutes in high vaccum chamber. The electrical and magnetotransport properties of as-grown and annealed samples have been studied. X-ray diffraction patterns analysis revealed that the samples still maintain amorphous state after annealling at $500^{\circ}C$ for 3 minutes and they were crystallized when annealing temperature increase to $600^{\circ}C$. Temperature dependence of resistivity measurement implied that as-grown and annealed $Ge_1$_$_xMn_x$ films have semiconductor characteristics, the increase of resistivity with annealling temperature was obseved. The $700^{\circ}C$-annealed sample exhibited negative magnetoresistance (MR) at low temperatures and the MR ratio was ${\sim}$8.5% at 10 K. The asymmetry was present in all MR curves. The anomalous Hall Effect was also observed at 250 K.