• Proceedings of the Korean Magnestics Society Conference
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• 2011.06a
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• pp.3-3
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• 2011

Since the first discovery of exchange anisotropy on Co/CoO system[1], there have been numerous studies to explore the physical origin of exchange-biased system[2,3]. In this presentation, we report that how the polarized neutron reflectomery can be applied to study the magnetization reversal behavior of the exchange biased system. As an example, the detailed magnetization reversal mechanism of the exchange-biased Py(30 nm)/FeMn (0, 15, 30 nm)/CoFe(30 nm) trilayers was studied and found that the 15 nm antiferromagnetic FeMn layer mediates the magnetization reversal behaviors of both Py and CoFe layers through interlayer exchange bias coupling. We also update the current activities in polarized neutron reflectometer in HANARO.

• Journal of Magnetics
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• v.11 no.2
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• pp.61-65
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• 2006

The physical origin of complex dynamic domain configuration in nonequilibrium magnetic systems with mesoscopic length scales has been studied. An increasing complexity in the spatial feature of the evolution is found to accompany the increasing reversal speed, when a ferromagnetic element is driven by progressively faster switching fields applied antiparallel to the initial magnetization direction. As reversal rates approach the characteristic precession frequencies of spin fluctuations, the thermal energy can boost the magnetization into local configurations which are completely different from those experienced during quasistatic reversal. The sensitive dependence of the spatial pattern on switching speed can be understood in terms of a dynamic exchange interaction of thermally excited spins; the coherent modulation of the spins is strongly dependent on the rise time of switching pulses.

• Journal of Magnetics
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• v.16 no.2
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• pp.97-100
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• 2011

Bilayers of soft NiFe (150 nm-420 nm) on hard Ni (150 nm) were prepared by electrodeposition. The process of magnetization reversal in the NiFe/Ni bilayers was then investigated. The hysteresis loop generated by a magnetization reversal of soft NiFe under a positive saturation state of a hard Ni layer shows a shift along the negative field axis, which is clear evidence for the exchange spring effect in the NiFe/Ni bilayers. The dependence of the coercive field $H_c$ and exchange bias field Hex on the thickness of the NiFe layer was also investigated. As the NiFe thickness increases from 150 nm to 420 nm, both $H_c$ and $H_{ex}$ decrease rapidly from $H_c$= 51.7 Oe and $H_{ex}$ = 12.2 Oe, and saturate to $H_c$ = 5.8 Oe and $H_{ex}$ = 3.5 Oe.

• Journal of the Korean Magnetics Society
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• v.11 no.5
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• pp.179-183
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• 2001

Magnetoresistance and Planar Hall effect of Glass/Ni$\sub$83/Fe$\sub$17/(2 nm)/[Cu(2 nm)Ni$\sub$83/Fe$\sub$17/(20 nm)]$\sub$50/ multilayer were measured. Repeated saw tooth like planar Hall effect signal was observed in the range of magnetization reversal process, while no sign of such saw tooth was observed in Magnetoresistance diagram. For the reason of saw tooth like signal, it is supposed that subsequent abrupt domain wall motion of each magnetic layer in the process of magnetization reversal process was observed in planar Hall effect in transverse direction to the current direction. This fine structure of planar Hall effect was observed for applied fields in any direction. Magnetoresistance curve did not show this fine structure of magnetization reversal, of course, since only net magnetization of each layer has to do with the resistivity. Extended research on the reason of this sawtooth like signal should be conducted.

• Journal of Magnetics
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• v.11 no.2
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• pp.66-69
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• 2006

Local magnetization reversal in the exchange-biased NiFe/FeMn and $[Pd/Co]_5/FeMn$ multilayers with in-plane and out-of-plane magnetic anisotropy was achieved by using laser annealing. The local annealed NiFe/FeMn film under the opposite magnetic field shows a magnetoresistance (MR) curve having two symmetric peaks at the positive and negative exchange biasing field (${\pm}H_{ex}$). The intensity of the nucleated MR peak rises as the exposed area extends during the laser annealing process, and the peak disappears under the reverse magnetic field. In the case of [Pd/Co]/FeMn films, the local magnetization reversal increased gradually as the laser power increases. The locally reversed magnetization was restored under the opposite magnetic field.

• Journal of the Korean Magnetics Society
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• v.6 no.4
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• pp.199-203
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• 1996

To study the magnetization reversal behavior of Co/Pd multilayers, we first demagnetized the samples by the field-demagnetized method and then measured initial curves and minor loops. The coercivity and the perpendicular magnetic anisotropy were obtained from the perpendicular and parallel magnetization curves measured at different temperatures. We interpret our experimental results by applying several qualitative and semiquantative approaches. From these study, we found that the magnetization reversal behavior is dominated by the domain wall pinning for all samples and the coercivity incremental tendency can be explained by Kronmuller's formula $H_c(T)\;{\propto}\;r_0.K_u$.

• Proceedings of the Korean Magnestics Society Conference
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• 2002.12a
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• pp.186-187
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• 2002

Recently, there has been much interest in magnetic thin film patterned in submicron scale because of possible ultrahigh density storage media or logical device applications [1-3]. Various geometries such as rectangle, circle, ring and ellipse type dots have been studied to find the shape showing stable switching behavior from repeated cycles. However, rectangle and circle types may not be suitable for device applications because they have two uncontrollable different magnetization reversal modes: C state and S state, resulting in different coercivity and irreproducible switching[4]. (omitted)

• Journal of the Korean Magnetics Society
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• v.5 no.4
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• pp.261-268
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• 1995

In order to investigate the origin of the asymmetric magnetization reversal effect, we studied the variation of magnetic hysteresis loops with the alloy composition in amorphous ferromagnetic alloy ribbons of ${(Fe_{1-x}Co_{x})}_{75}Si_{10}B_{15}$ system annealed at $380^{\circ}C$ for 16 hours in a zero field condition. The asymmetric magnetization reversal effect developed more strongly in amorphous ribbons having two metallic components than in ribbons having a single metallic component. The effect developed more strongly in ribbons showing a smaller value of the saturation mag¬netostriction. The development of the asymmetric magnetization reversal effect was affected by the ratio of two metallic components as well as the magnitude of the saturation magnetostriction.

• Proceedings of the Korean Magnestics Society Conference
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• 2000.09a
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• pp.287-296
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• 2000

We have developed a three-axis configurational in situ SMOKE apparatus by which three-dimensional vector magnetization reversal processes are studied for ultrathin Co films grown on a Pd (111) single crystal in the thickness range of spin-reorientation transition. This study provides a better understanding of magnetization reversal motions with the knowledge of 3 components of magnetization vector at the transition of an easy axis of magnetization from the film normal at 5 ML Co to in-plane at 6 ML Co (ML notes monolayer). For a 5.25 ML Co, it was observed that a slightly canted magnetization vector from the film normal rotated in the film plane under an applied field direction parallel to the film normal.

• Journal of Magnetics
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• v.6 no.2
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• pp.53-56
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• 2001

We have developed a three-axis configurational in situ SMOKE apparatus by which three-dimensional vector magnetization reversal processes are studied for ultrathin Co films grown on a Pd (111) single crystal in the thickness range of spin reorientation transition. This study provides a better understanding of magnetization reversal motions with the knowledge of three components of the magnetization vector at the transition of an easy axis of magnetization from the film normal at 5 ML Co to in-plane at 6 ML Co (ML denotes monolayer). For a 5.25 ML Co, it was observed that a slightly canted magnetization vector from the film normal rotated in the film plane under an applied field direction parallel to the film normal.