• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.286-289
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• 2007

We have developed an automated circuit defect inspection and repair method that can be used to improve the yield ratio of TFT-LCD. The method focuses on correcting resist patterns after the development process to ensure shape regularity. We built a prototype system and confirmed that the method is valid.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.1079-1082
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• 2005

This paper deals with the algorithm development that inspects defects such as Lens Focus, Focus check, Black Defect, Dark Defect, Dim Defect, Color Defect, and Line Defect, Angle Defect, IrisAgc Defect caused by the process of 2M Class Compact Camera Module (CCM). Domestic market was majorly comprised of VGA(0.3 million pixel) market. But in the middle of year 2004, camera phone with Mega Pixel has appeared, and it is estimated that the camera phone with Mega Pixel will take up to 28% of total phone sales if it is released in the end of year 2004. Since the inspection of finished products is done manually, it is major obstacle in production increment In this paper, to solve these problems, we developed the imaging processing algorithm to inspect the defects in captured image of assembled CCM. The performances of the developed inspection system and we can recognize various types of defect of CCM modules with good accuracy and high speed

• Journal of the Korean Society for Nondestructive Testing
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• v.30 no.3
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• pp.261-270
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• 2010

This paper presents an analytical investigation for a baseline-free imaging of a defect in plate-like structures using the time-reversal of Lamb waves. We first consider the flexural wave (A0 mode) propagation in a plate containing a defect, and reception and time reversal process of the output signal at the receiver. The received output signal is then composed of two parts: a directly propagated wave and a scattered wave from the defect. The time reversal of these waves recovers the original input signal, and produces two additional side bands that contain the time-of-flight information on the defect location. One of the side band signals is then extracted as a pure defect signal. A defect localization image is then constructed from a beamforming technique based on the time-frequency analysis of the side band signal for each transducer pair in a network of sensors. The simulation results show that the proposed scheme enables the accurate, baseline-free detection of a defect, so that experimental studies are needed to verify the proposed method and to be applied to real structure.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.41 no.8
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• pp.69-78
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• 2004

In this paper, we estimated the exact software defect density to build up a suitable model that is closely related to the size of module in the probability model proposed by MD (Malaiya and Denton). To put it concretely, we predict that the software defect density using some practical data sets that are the outcomes from the system test performed our three projects for the types of distribution (exponential and geometric), per a unit of module, and the size of source line that have been recommended by KLOC(kilo-line-of-code). Then, we make comparison between our proposed defect density model and those examined real data.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2007.10a
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• pp.364-367
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• 2007

In nano-imprint lithography (NIL) process, which has shown to be a good method to fabricate polymeric patterns, several kinds of pattern defects due to thermal effects during polymer flow and mold release operation have been reported. A typical defect in NIL process with high aspect ratio and low resist thickness pattern is a resist fracture during the mold release operation. It seems due to interfacial adhesion between polymer and mold. However, in the present investigation, FEM simulation of NIL molding process was carried out to predict the defects of the polymer pattern and to optimize the process by FEA. The embossing operation in NIL process was investigated in detail by FEM. From the analytical results, it was found that the lateral flow of polymer resin and the applied pressure in the embossing operation induce the weld line and the drastic lateral strain at the edge of pattern. It was also shown that the low polymer-thickness result in the delamination of polymer from the substrate. It seems that the above phenomena cause the defects of the final polymer pattern. To reduce the defect, it is important to check the initial resin thickness.

• Journal of the Korean Institute of Navigation
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• v.22 no.4
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• pp.59-67
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• 1998

A quick and automatic detection with no harm to the goods is very important task for improving quality control, process control and labour reduction. In real fields of industry, defect detection is mostly accomplished by skillful workers. A narrow band eliminating spatial filter having characteristics of removing the specified spatial frequency is developed by the author, and it is proved that the filter has an excellent ability for on-line and real time detection of surface defect. By the way,. this spatial filter shows a ripple phenominum in filtering characteristics. So, it is necessary to remove the ripple component for the improvement of filter gain, moreover efficiency of defect detection. The spatial filtering method has a remarkable feature which means that it is able to set up weighting function for its own sake, and which can to obtain the best signal relating to the purpose of the measurement. Hence, having an eye on such feature, theoretical analysis is carried out at first for optimal design of narrow band eliminating spatial filter, and secondly, on the basis of above results spatial filter is manufactured, and finally advanced effectiveness of spatial filter is evaluated experimentally.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.41 no.4
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• pp.69-74
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• 2004

In this paper, we propose a novel method for improving defect-detection performance based on reconstruction of line-scan camera images using both the projection profiles and color space transform. The proposed method consists of RGB region segmentation, representative value reconstruction using the tracing system, and Y image reconstruction using color-space transformation. Through experiments it is demonstrated that the performance using the reconstructed image is better than that using aerial image for LCD surface inspection.

• Proceedings of the Korea Electromagnetic Engineering Society Conference
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• 2003.11a
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• pp.361-365
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• 2003

In this paper, we proposed the effective serial connection methodology of PBG resonator with defect mode. We use the big difference of impedance ratio in connection region, for example dual PBG, for serial connection. This method reduces the PBG cells and is able to control the pole of bandpass filters. This result in flexibility in design of bandpass filter. Our PBG bandpass filter is modeled by using the ideal transmission line model. This model is very easy, fast, and effective for PBG structure.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.25 no.6
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• pp.849-852
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• 2021

This paper presents a vision based tire mold inspection system where mold defects are inspected and the sizes of specific parts of the mold are measured. There are a lot of challenging issues as letters and pictures of intaglio are engraved on a bright surface of the tire mold. To solve the issues, we carefully selected a line-scan camera and a line light. In addition, we used PLC to control the mechanical parts. The developed system provides inspection of misspelled and deformed letters as well as a variety of the functions such as size measurement of engraved regions and inspection report file creation.

• Journal of the Korean Institute of Intelligent Systems
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• v.19 no.6
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• pp.852-859
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• 2009

Normally, to extract the defect in TFT-LCD inspection system, the image is obtained by using line scan camera or area scan camera which is achieved by CCD or CMOS sensor. Because of the limited dynamic range of CCD or CMOS sensor as well as the effect of the illumination, these images are frequently degraded and the important features are hard to decern by a human viewer. In order to overcome this problem, the feature vectors in the image are obtained by using the average intensity difference between defect and background based on the weber's law and the standard deviation of the background region. The defect detection method uses non-linear SVM (Supports Vector Machine) method using the extracted feature vectors. The experiment results show that the proposed method yields better performance of defect classification methods over conveniently method.