• Title/Summary/Keyword: laser metrology

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Time-resolved Anisotropy Study on the Excited-State Intramolecular Proton Transfer of 1-Hydroxyanthraquinone

  • Choi, Jun-Rye;Jeoung, Sae-Chae;Cho, Dae-Won
    • Bulletin of the Korean Chemical Society
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    • v.24 no.11
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    • pp.1675-1679
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    • 2003
  • The photodynamics of excited-state intramolecular proton transfer reaction of 1-hydroxyanthraquinone (1-HAQ) and 1-deuterioanthraquinone was investigated in toluene with time-resolved emission and femtosecond transient transmittance techniques at room temperature. The temporal profiles of transient transmittance of 1-HAQ could be well described with multi-decaying time constants. The ultrafast time constant within ca. 260 fs reflects the dynamics of proton transfer. The decay component of 2 ps is assigned to an additional proton translocation process induced by the intramolecular vibrational relaxation, whereas the decay component of 18 ps is assigned to the vibrational cooling process, while the long component (200 ps) can be explained in terms of the relaxation from excited-state keto-tautomer to its ground state. Time-resolved anisotropy decay dynamics and isotope effects on the photodynamics reveals that the ESIPT from enol-tautomer to keto-one of 1-HAQ is barrierless reaction and coupled to a vibrational relaxation process.

Development of Burr Measurement System Using Laer (레이저를 이용한 버 측정 시스템 개발)

  • Go, Seong-Rim;Jeon, Geun-Bae;Lee, Jing-Gu
    • Journal of the Korean Society for Precision Engineering
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    • v.17 no.9
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    • pp.166-173
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    • 2000
  • A system for burr measurement is developed to measure the geometry of the burr formed in metal cutting or shearing operations. laser system is selected according to the required measuring accuracy and burr size. A specific program for calculating the burr geometry from measured laser data is developed. The raw data is obtained by scanning cross the burr. The height and width of burr are calculated. Due to the specific characteristic of laser peak or valley are formed in measuring sharp edges or small sharp cracks. Compensation for the peak or valley is carried out to make it possible to calculate the burr, burr geometry is measured in 3 dimension.

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Four Degree-of-Freedom Geometric Error Measurement System with Common-Path Compensation for Laser Beam Drift

  • Qibo, Feng;Bin, Zhang;Cuifang, Kuang
    • International Journal of Precision Engineering and Manufacturing
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    • v.9 no.4
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    • pp.26-31
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    • 2008
  • A precision four-degree-of-freedom measurement system has been developed for simultaneous measurement of four motion errors of a linear stage, which include straightness and angular errors, The system employs a retro-reflector to detect the straightness errors and a plane mirror to detect the angular errors. A common-path compensation method for laser beam drift is put forward, and the experimental results show that the influences of beam drift on four motion errors can be reduced simultaneously. In comparison with the API 5D laser measuring system, the accuracy for straightness measurement is about ${\pm}1.5{\mu}m$ within the measuring range of ${\pm}650{\mu}m$, and the accuracy for pitch and yaw measurements is about ${\pm}1.5$ arc-seconds within the range of ${\pm}600$ arc-seconds.

Photoacoustic Laser Doppler Velocimetrv Using the Self - mixing Effect of RF - excited CO2 Laser

  • Choi, Jong-Woon;You, Moon-Jong;Choi, Sung-Woong;Woo, Sam-Young
    • Journal of the Optical Society of Korea
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    • v.8 no.4
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    • pp.188-191
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    • 2004
  • A new laser Doppler velocimeter employing a $CO_2$ laser has been developed by using its photoacoustic effect. A change in the pressure of a discharge, induced by mixing of a returned wave with an originally existing wave inside the cavity, is employed to detect the Doppler frequency shift. We found that a Doppler frequency shift as small as 50 kHz was detected, and also a good linear relationship between the velocity and the Doppler frequency shift was obtained.

Optical metrology for resonant surface acoustic wave in RF device (RF 소자의 표면탄성파 공진에 대한 광학적 측정)

  • Park, Jun-Oh;Jang, Won-Kweon
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.11 no.9
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    • pp.3435-3440
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    • 2010
  • Unlike the electric method capable of checking only product defect, the real time optical metrology is suggested for measuring and visualizing vibration with respect to position of surface acoustic wave in RF device. The measuring limits and conditions for surface acoustic wave is given, and the interference and diffraction due to RF signal are analyzed by optical interpretation. A single mode laser and a 105MHz-center-frequency repeater filter were employed for experiments and theoretical analysis. In this paper, the optical metrology providing visual energy distribution and real time inspection for surface acoustic wave is proposed for development of high quality multi-service and multi-frequency RF module.

Application of fiber optic BOTDA sensor for measuring the temperature distributed on the surfaces of a building (빌딩표면에 분포된 온도를 측정하기 위한 광섬유 BOTDA센서의 적용)

  • Kwon, Il-Bum;Kim, Chi-Yeop;Park, Man-Yong
    • Proceedings of the Computational Structural Engineering Institute Conference
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    • 2002.10a
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    • pp.505-510
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    • 2002
  • We have focused on the development of a fiber optic BOTDA (Brillouin Optical Time Domain Analysis) sensor system in order to measure temperature distributed on large structures. Also, we present a feasibility study of the fiber optic sensor to monitor the distributed temperature on a building construction. A fiber optic BOTDA sensor system, which has a capability of measuring the temperature distribution, attempted over several kilometers of long fiber paths. This simple fiber optic sensor system employs a laser diode and two electro-optic modulators. The optical fiber of the length of 1400 m was installed on the surfaces of the building. The change of the distributed temperature on the building construction was well measured by this fiber optic sensor. The temperature changed normally up to 4℃ through one day.

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Optical Probe of white Light Interferometry for Precision Coordinate Metrology (정밀 삼차원 측정을 위한 백색광 간섭 광학 프로브 개발)

  • 김승우;진종한;강민구
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.05a
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    • pp.195-198
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    • 2002
  • Demand for high precision measurement of large area is increasing in many industrial fields. White-light Scanning Interferometer(WSI) is a well-known method for 3D profile measurement. However WSI has some limitations in a measurement range because of the sensing mechanism. Therefore, in this paper we use a heterodyne laser interferometer to get over the limitations of a short measurement range in WSI, We suggest a new WSI system combined with heterodyne laser interferometer. This system is aimed at eliminating Abbe error with measuring the focus point directly. With the use of triggering functionality of WSI, we can use this system as a probe of a precision stage such as a probe of CMM. The suggested system gives a repeatability of 87 nm in the absolute distance measurement test under the laboratory environment.

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Absolute Distance Measurement using Synthetic Wavelength of Femto-second Laser (펨토초 레이저의 합성파를 이용한 절대거리 측정)

  • Kim Yun-Seok;Jin Jong-Han;Joo Ki-Nam;Kim Seung-Woo
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.06a
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    • pp.569-572
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    • 2005
  • Technological feasibility of using recently-available femtosecond ultra short pulse lasers for advanced precision length metrology is investigated with emphasis on absolute distance measurements with $10{\mu}m$ ??resolution over extensive ranges. The idea of using femtosecond lasers for the measurement of absolute distances is based on the fact that a short pulse train is a mode-locked combination of discrete monochromatic light components spanning a wide spectral bandwidth. The synthetic wavelength is created from the repetition frequency, $f_r$ of the femtosecond laser and for more precise resolution, higher-order harmonics of the repetition frequency may be selected as the synthetic wavelength by using appropriate electronic filters.

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Image Enhancement for Sub-Harmonic Phased Array by Removing Surface Wave Interference with Spatial Frequency Filter

  • Park, Choon-Su;Kim, Jun-Woo;Cho, Seung Hyun;Seo, Dae-Cheol
    • Journal of the Korean Society for Nondestructive Testing
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    • v.34 no.3
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    • pp.211-219
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    • 2014
  • Closed cracks are difficult to detect using conventional ultrasonic testing because most incident ultrasound passes completely through these cracks. Nonlinear ultrasound inspection using sub-harmonic frequencies a promising method for detecting closed cracks. To implement this method, a sub-harmonic phased array (PA) is proposed to visualize the length of closed cracks in solids. A sub-harmonic PA generally consists of a single transmitter and an array receiver, which detects sub-harmonic waves generated from closed cracks. The PA images are obtained using the total focusing method (TFM), which (with a transmitter and receiving array) employs a full matrix in the observation region to achieve fine image resolution. In particular, the receiving signals are measured using a laser Doppler vibrometer (LDV) to collect PA images for both fundamental and sub-harmonic frequencies. Oblique incidence, which is used to boost sub-harmonic generation, inevitably produces various surface waves that contaminate the signals measured in the receiving transducer. Surface wave interference often degrades PA images severely, and it becomes difficult to read the closed crack's position from the images. Various methods to prevent or eliminate this interference are possible. In particular, enhancing images with signal processing could be a highly cost-effective method. Because periodic patterns distributed in a PA image are the most frequent interference induced by surface waves, spatial frequency filtering is applicable for removing these waves. Experiments clearly demonstrate that the spatial frequency filter improves PA images.

150 nm Pitch Measurement using Metrological AFM (길이 소급성을 갖는 AFM을 이용한 150nm 피치 측정)

  • ;I. Misumi;S. Gonda;T. Kurosawa
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2003.06a
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    • pp.264-267
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    • 2003
  • Pitch measurements of 150 nm pitch one-dimensional grating standards were carried out using an contact mode atomic force microscopy(C-AFM) with a high resolution three-axis laser interferometer. It was called as 'Nano-metrological AFM' In Nano-metrological AFM, Three laser interferometers were aligned well to the end of AFM tip. Laser sources of the three-axis laser interferometer in the nano-metrological AFM were calibrated with an I$_2$-stablilzed He-Ne laser at a wavelength of 633 nm. So, the Abbe error was minimized and the result of the pitch measurement using the nano-metrological AFM has a traceability to the length standard directly. The uncertainty in the pitch measurement was estimated in accordance with the Guide to the Expression of Uncertainty in Measurement(GUM). The Primary source of uncertainty in the pitch-measurements was derived from repeatability of pitch-measurement, and its value was approx 0.186 nm. Expanded uncertainty(k=2) of less than 5.23 nm was obtained. It is suggested that the metrological AFM is a useful tool for the nano-metrological standard calibration.

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