• Title/Summary/Keyword: laser measurement

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Measurement of High Voltage and Large Current Pulse Using Laser System (레이저를 이용한 펄스형 고전압 및 대전류 측정)

  • Lee, Yoon-Seok;Chang, Yong-Moo;Kim, Jung-Tae;Koo, Ja-Yoon;Kang, Hyung-Boo
    • Proceedings of the KIEE Conference
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    • 1991.07a
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    • pp.314-317
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    • 1991
  • The waveforms of high voltage and current pulse were measured using laser measuring systems. Existing potential transformer and current transformer have low measuring precision because of resonance phenomena and waveform distortion due to the magnetic saturation. But using laser measurement, it is possible to obtain clear waveforms which have no effect of distortion and harmonic resonances. And electromagnetic interferences (EMI) in the measuring of high voltage and current pulse, but the optical measuring systems are not subjet to the influence of EMI. Using laser measuring systems based upon Pockels effect and Faraday effect is not free from any errors yet, but it could replace existing measuring systems by routine experiments and error corrections. And it needs that more research and development of optical crystals and equipments would be taken.

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Nondestructive Measurement on Electrical Characteristics of Amorphous Silicon by Using the Laser Beam (레이저 빔을 이용한 비정질실리콘 전기적 특성의 비파괴 측정)

  • 박남천
    • Proceedings of the Korean Institute of Navigation and Port Research Conference
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    • 2000.11a
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    • pp.36-39
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    • 2000
  • A small electrical potential difference which appears on any solid body when subjected to illumination by a modulated light beam generated by laser is called photocharge voltage(PCV)[1,2]. This voltage is proportional to the induced change in the surface electrical charge and is capacitatively measured on various materials such as conductors, semiconductors, ceramics, dielectrics and biological objects. The amplitude of the detected signal depends on the type of material under investigation, and on the surface properties of the sample. In photocharge voltage spectroscopy measurements[3], the sample is illuminated by both a steady state monochromatic bias light and the pulsed laser. The monochromatic light is used to created a variation in the steady state population of trap levels in the surface and space charge region of semiconductor samples which does result in a change in the measured voltage. Using this technique the spatial variation of PCV can be utilized to evalulate the surface conditions of the sample and the variation of the PCV due to the monochromatic bias light are utilized to charactrize the surface states. A qualitative analysis of the proposed measuremen is present along with experimental results performed on amorphous silicon samples. The deposition temperature was varied in order to obtain samples with different structural, optical and electronic properties and measurements are related to the defect density in amorphous thin film.

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Ultra-narrow linewidth single frequency DFB laser with FBG ring cavity (극미세선폭 단일모드 FBG 고리구조 공동 DFB 레이저)

  • 김준원;진용옥;최규남
    • Korean Journal of Optics and Photonics
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    • v.13 no.3
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    • pp.235-239
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    • 2002
  • A novel ultra-narrow linewidth DFB laser in the extended FBG ring cavity having kHz linewidth is presented. The method of linewidth compression was realized by introducing an extended fiber ring cavity into the cavity between the external FBG and the Bragg grating inside a DFB laser diode. Optimum optical feedback control was achieved by using an optical circulator and a variable optical attenuator to prevent mode hopping induced by spatial hole burning. To prove the validity of the proposed scheme, a self-heterodyne measurement set-up with fiber delay line of 63 km was utilized for the ultra-narrow linewidth measurement. A 3 dB linewidth of less than 3 kHz was demonstrated, which is resolution limited performance. This linewidth is equivalent to 3 dB linewidth of 2$\times$10$^{-8}$ nm.

The estimation characteristics of cultured pearls (양식 진주의 특성평가)

  • 오정욱;김종식;최종건;김판채
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.13 no.6
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    • pp.315-319
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    • 2003
  • The quality, quantity, color, and characteristics were found out cultured seawater pearls and freshwater pearls. In the XRF measurement Ca chemical combinations were the main elements and Sr was detected at higher levels for the sea-water pearl and Si, S, Ca, Mn, P and other elements were found at higher levels for the fresh-water pearls. Such differences is judged to be caused by the ion diluted in sea and fresh water which affects the pearl elements. Although near similar structural peak was shown for the FT-IR measurement, the fresh-water pearl showed a lower peak for the 2344 wave. For the results of PL, the peak for fresh-water measured with Hd-Cd Laser at 455 nm was higher and with the Ar-ion Laser measurements, peaks were high at 545 nm and 570 nm for fresh-water pearl and sea-water pearls respectively.

A Study on Quantitative Measurements of Equivalence Ratio in Constant Volume Chamber Using UV Laser Raman Scattering (UV Laser Raman Scattering을 이용한 정적 연소기내 분사된 연료의 정량적 당량비 측정에 관한 연구)

  • Jin, S.H.;Heo, H.S.;Kim, G.S.;Park, K.S.
    • Journal of ILASS-Korea
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    • v.3 no.4
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    • pp.35-42
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    • 1998
  • Laser Raman scattering method has been applied to measure equivalence ratio of methane/air and propane/air mixture in constant volume combustion chamber. We used high power KrF excimer laser$(\lambda=248nm)$ and a high gain ICCD camera to capture low intensity Raman signal. Raman shifts and Ram cross-sections of $H_2,\;O_2,\;N_2,\;CO_2,\;CH_4\;and\;C_3H_8$ were measured precisely. Our results showed an excellent agreement with other groups. Mole fraction measurement of $O_2\;and\;N_2$ from air showed that $O_2\;:\;N_2$ = 0.206 : 0.794. We used constant volume combustion chamber and gas injector which is operated at $5\sim10barg$. Methane and propane are used as a fuel. 50 Raman signal are obtained and ensemble averaged for measurement of equivalence ratio. Our measured results showed that the equivalence ratio of fuel/air mixture is reasonable at ${\pm}5%$ error range.

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A Study of Measurement of In-plane Displacement by CW Laser Speckle Photography and Image Processing (연속파 레이저 스페클 사진법(寫眞法)과 화상처리(畵像處理)에 의한 면내섭위(面內燮位) 측정(測定)에 관한 연구(硏究))

  • Kim, K.S.;Na, G.D.;Kim, T.H.;Chung, N.K.;Kim, C.W.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.10 no.1
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    • pp.47-55
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    • 1990
  • This paper presents experimental results which explore the capability of a CW laser speckle photography for tile measurement of in-plane displacement at high temperature. The serious restrictions on the application of the method seem to be the ambient air turbulence and the change of surface texture caused by the oxidation, as they tend to decorrelate the double exposured speckle patterns. In order to assess only the effect of air turbulence, a ceramics-coated stainless steel plate is heated in air and Ar-laser specklegrams are made with combination of temperature and lateral translation displacement. The slight reduction in visibility of Young's fringes is observed at $1000^{\circ}C$. The analyses of Young's fringes are carried out by a image processing system using a TV-camera and computers, and the result agrees well with the micrometer reading. Futhermore, uncoated stainless steel and Hastelloy X plates are tested and the effect of oxidation is also evaluated. The experimental results demonstrate that a CW laser speckle photography is applicable at temperatures up to $1000^{\circ}C$.

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Adjustment Algorithm of Incident Light Power for Improving Performance of Laser Surface Roughness Measurement (레이저 표면 거칠기 측정 성능 향상을 위한 입사 광강도 조정 알고리즘)

  • 서영호;김화영;안중환
    • Journal of the Korean Society for Precision Engineering
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    • v.21 no.4
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    • pp.79-87
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    • 2004
  • The light pattern reflected from a machined surface contains some information like roughness and profile on the projected surface as expected in the Beckmann-Spizzichino model. In applying the theory into a real reliable measuring device, many parameters such as incident light power, wave length, spot size should be kept a constant optical value. However, the reflected light power is likely to change with the environmental noise, the variations of the light source, the reflectivity of the surface, etc. even though the incident light power is constant. In this study, a method for adjusting the incident light power to keep the reflected light power projected on a CMOS image sensor constant was proposed and a simple adjustment algorithm based on PI digital control was examined. Experiments verified that the proposed method made the surface roughness measurement better and more reliable even under variations of the height of light source.

Measured Intensity Control Method of a Phase-shift Measurement Based Laser Scanner by using APD Bias Voltage Characteristic (위상 검출 방식 레이저 스캐너의 APD bias 전압 특성을 이용한 검출신호세기 제어 방법)

  • Jang, Jun-Hwan;Yoon, Hee-Sun;Hwang, Sung-Ui;Park, Kyi-Hwan
    • Journal of the Korean Society for Precision Engineering
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    • v.29 no.10
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    • pp.1096-1100
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    • 2012
  • In the phase-shift measurement method, the distance light travels can be obtained based on the phase difference between the reference signal and the measured signal. When the object having various colors is measured, the intensity of the measured signal much varies even at the same distance, and it causes different phase delay due to wide dynamic range input to a signal processing circuit. In this work, an measured intensity control method is proposed to solve this phase delay problem.

A Study on the Determination of Displacement by Applied Laser Measurement (레이저응용계측에 의한 변위 정량화에 관한 연구)

  • 김경석;홍진후;강기수;최지은
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2000.11a
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    • pp.93-96
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    • 2000
  • This study discusses a non-contact optical technique, phase shifting electronic speckle pattern interferometry, that is well suited for a deformation measurement. However, the phase shifting method has difficulties for determinating a deformation quantitatively beacuse of the characteristics of arctan function. In order to solve this problem, phase unwrapping methods has been studied during the last few years. In this study, using phase unwrapping based on line by line scanning phase shifted fringe patterns are studied to determinate a deformation quantitatively. Also least square fitting method is applied to reduce noise and improve image resolution.

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Cantilever deflection measurement system for AFM with PSD (PSD를 이요한 AFM용 미세 탐촉자의 변위측정장치)

  • 김홍준;장경영
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2000.11a
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    • pp.31-35
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    • 2000
  • A cantilever deflection measurement system for AFM(atomic force microscope) was constructed by the laser deflection method using LEP type PSD. Design process including sensitivity analysis was presented and the performance of the system was demonstrated by several experiments using a sample specimen with 50nm-step on the surface. The measured displacement-amplification-factor showed good agreement with the expected one with about 8% deviation. The step height measurement data were compared to what were acquired by commercial AFM, and the result showed that there were about 5nm-deviation between the two data. These results satisfies our expectation in the stage of system design.

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