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http://dx.doi.org/10.7736/KSPE.2012.29.10.1096

Measured Intensity Control Method of a Phase-shift Measurement Based Laser Scanner by using APD Bias Voltage Characteristic  

Jang, Jun-Hwan (School of Mechatronics, Gwangju Institute of Science and Technology)
Yoon, Hee-Sun (Advanced Institute of Technology, Samsung Electronics)
Hwang, Sung-Ui (School of Mechatronics, Gwangju Institute of Science and Technology)
Park, Kyi-Hwan (School of Mechatronics, Gwangju Institute of Science and Technology)
Publication Information
Journal of the Korean Society for Precision Engineering / v.29, no.10, 2012 , pp. 1096-1100 More about this Journal
Abstract
In the phase-shift measurement method, the distance light travels can be obtained based on the phase difference between the reference signal and the measured signal. When the object having various colors is measured, the intensity of the measured signal much varies even at the same distance, and it causes different phase delay due to wide dynamic range input to a signal processing circuit. In this work, an measured intensity control method is proposed to solve this phase delay problem.
Keywords
Laser Scanner; Phase-Shift Measurement; Measured Intensity Control;
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