• Title/Summary/Keyword: laser diffraction

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Effects of Post-Annealing Treatment of ZnO Thin Films by Pulsed Laser (PLD를 이용한 ZnO 박막의 후열처리에 관한 연구)

  • Lee Cheon;Kim Jae-Hong
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.54 no.3
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    • pp.103-108
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    • 2005
  • ZnO thin films on (001) sapphire substrates have been deposited by pulsed laser deposition(PLD) technique using an Nd:YAG laser with a wavelength of 266nm. Before post-annealing treatment in the oxygen ambient, the experiment of the deposition of ZnO thin films has been performed for substrate temperatures in the range of $300\~450^{\circ}C$ and oxygen gas flow rate of $100\~700\;sccm$. In order to investigate the effect of post-annealing treatment of ZnO thin films, films have been annealed at various temperatures after deposition. After post-annealing treatment in the oxygen ambient, the structural properties of ZnO thin films were characterized by X-ray diffraction(XRD), scanning electron microscopy(SEM) and the optical properties of the ZnO were characterized by photoluminescence(PL).

Laser Ablation of a ZnO:P2O5 Target under the Presence of a Transverse Magnetic Field

  • Alauddin, Md.;Park, Jin-Jae;Gwak, Doc-Yong;Song, Jae-Kyu;Park, Seung-Min
    • Bulletin of the Korean Chemical Society
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    • v.31 no.4
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    • pp.798-802
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    • 2010
  • From time-resolved optical emission spectra, we have investigated the effects of a transverse magnetic field on the expansion of a plasma plume produced by laser ablation of a ZnO:$P_2O_5$ ceramic target in oxygen active atmosphere. The emission spectra of $Zn^{+*}$, $P^{+*}$, and $Zn^*$ neutrals in the presence of magnetic field turn out to be considerably different from those without magnetic field. The characteristics of the deposited films grown on amorphous fused silica substrates by pulsed laser deposition (PLD) are examined by analyzing their photoluminescence (PL), X-ray diffraction (XRD), and UV-visible spectra.

A Fiber Laser Spectrometer Demodulation of Fiber Bragg Grating Sensors for Measurement Linearity Enhancement

  • Kim, Hyunjin;Song, Minho
    • Journal of the Optical Society of Korea
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    • v.17 no.4
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    • pp.312-316
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    • 2013
  • A novel fiber-optic sensor system is suggested in which fiber Bragg grating sensors are demodulated by a wavelength-sweeping fiber laser source and a spectrometer. The spectrometer consists of a diffraction grating and a 512-pixel photo-diode array. The reflected Bragg wavelength information is transformed into spatial intensity distribution on the photo-diode array. The peak locations linearly correspond to the Bragg wavelengths, regardless of the nonlinearities in the wavelength tuning mechanism of the fiber laser. The high power density of the fiber laser enables obtaining high signal-to-noise ratio outputs. The improved demodulation characteristics were experimentally demonstrated with a fiber Bragg grating sensor array with 5 gratings. The sensor outputs were in much more linear fashion compared with the conventional tunable band-pass filter demodulation. Also it showed advantages in signal processing, due to the high level of photo-diode array signals, over the broadband light source system, especially in measurement of fast varying dynamic physical quantities.

Improving the Residual Stress Characteristics of the Metal Surface by Nd:YAG Laser Shock Peening (Nd:YAG 레이저 충격 피닝에 의한 금속표면의 잔류응력 특성 개선)

  • Yang, Se-Young;Choi, Seong-Dae;Jun, Jea-Mok;Gong, Byeong-Chae
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.19 no.4
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    • pp.539-547
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    • 2010
  • Laser shock peening is useful to improve fatigue characteristic of multiple number of metals and alloys. This process induces a compressive residual stress on the metal surface, and when tensile load is applied, growth of crack is delayed and which changes the characteristic of the metal surface. It is an innovative surface treatment technique for strengthening metals. Specimens of SM45C are used in this study. The effect of an inertial tamping layer on the residual stress field using laser shock peening setup and Nd:YAG laser power is evaluated. Residual stress distribution measured by X-ray diffraction. As a result of this study it can be presented that following condition of Nd:YAG laser power and inertial tamping layer parameters, compressive residual stress is generated on the surface of the SM45C. Results to experimental data indicate that laser shock peening has great potential as a means of improving the mechanical performance of the metal surface.

Optical Error Analysis and Compensation of Six Degrees of Freedom Measurement System Using a Diffraction Grating Target (회절 격자 표식을 이용한 6자유도 측정 시스템의 광학적 오차 해석 및 보상)

  • Kim, Jong-Ahn;Bae, Eui-Won;Kim, Soo-Hyun;Kwak, Yoon-Keun
    • Journal of the Korean Society for Precision Engineering
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    • v.18 no.2
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    • pp.152-160
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    • 2001
  • Six degrees of freedom measurement systems are required in many fields: Precision machine control. precision assembly, vibration analysis, and so on. This paper presents a new six degrees of freedom measurement system utilizing typical features of a diffraction grating. It is composed of a laser source, three position sensitive detectors, a diffraction grating target, and several optical components. Six degrees of freedom displacement is calculated kinematically from the coordinates of diffracted rays on the detectors. Optical measurement error was caused by the fact that a laser source had a Gaussian intensity distribution. This error was analyzed and compensated using simple equations. The performance of the compensation equation was verified in the experiment. The experimental results showed that the compensation equation could reduce the optical measurement error remarkably and the error in six degrees of freedom measurement less than $\pm$10$\mu$m for translation and $\pm$0.012$^{\circ}$for rotation.

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Characteristics of Holographic Diffraction Grating Formation on $AS_{40}Se_{15}S_{35}Ge_{10}$ Thin Film with the Polarization State of Recording Beam (기록빔의 편광상태에 따른 $AS_{40}Se_{15}S_{35}Ge_{10}$ 박막에서 홀로그래피 회절격자형성 특성)

  • Park, Jeong-Il;Chung, Hong-Bay
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.55 no.9
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    • pp.423-428
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    • 2006
  • We have been carried out the two-beam interference method to form the diffraction grating on chalcogenide $AS_{40}Se_{15}S_{35}Ge_{10}$ thin films for Holography Data Storage (HDS). In the present work, we have been formed holographic diffraction gratings using He-Ne laser (632.8nm) under different Polarization state combinations (intensity polarization holography, phase polarization holography). It was obtained the diffraction grating efficiency by 11st order intensity and investigated the formed grating structure using Atomic Force Microscopy (AFM). As the results, it is shown that the diffraction efficiency of (P: P) polarized recording was maximum 2.4% and we found that its value was rather higher than that of other-polarized recordings. From the results, it is confirmed that the efficient holographic grating formation on amorphous chalcogenide $AS_{40}Se_{15}S_{35}Ge_{10}$ films depend on both the spatial variation of intensity and the polarization state of the incident field pattern.

Deposition of Polytetrafluoroethylene Thin Films by IR-pulsed Laser Ablation (Nd:YAG 레이저에 의한 폴리테트라플루오르에틸렌 박막 증착)

  • Park Hoon;Seo Yu-Suk;Hong Jin-Soo;Chae Hee-Baik
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.6 no.1
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    • pp.58-63
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    • 2005
  • PTFE (polytetrafluoroethylene) thin films were prepared from the pellets of the graphite doped PTFE via pulsed laser ablation with 1064 nm Nd:YAG laser. The graphite powder converts the absorbed photon energy into thermal energy which is transmitted to nearby PTFE. The PTFE is decomposed by thermal process. The deposited films were transparent and crystalline. SEM (scanning electron microscopy) and AFM (atomic force microscopy) analyses indicated that the film surface morphology changed to fibrous structure with increasing thickness. The fluorine to carbon ratios of the film were 1.7 and molecular axis was parallel with (100) Si-wafer substrate. These results obtained by XPS (X-ray photoelectron spectroscopy), FTIR (fourier transform infrared spectroscopy) and XRD (X-ray diffraction).

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Analysis of Laser-protection Performance of Asymmetric-phase-mask Wavefront-coding Imaging Systems

  • Yangliang, Li;Qing, Ye;Lei, Wang;Hao, Zhang;Yunlong, Wu;Xian'an, Dou;Xiaoquan, Sun
    • Current Optics and Photonics
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    • v.7 no.1
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    • pp.1-14
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    • 2023
  • Wavefront-coding imaging can achieve high-quality imaging along with a wide range of defocus. In this paper, the anti-laser detection and damage performance of wavefront-coding imaging systems using different asymmetric phase masks are studied, through modeling and simulation. Based on FresnelKirchhoff diffraction theory, the laser-propagation model of the wavefront-coding imaging system is established. The model uses defocus distance rather than wave aberration to characterize the degree of defocus of an imaging system. Then, based on a given defocus range, an optimization method based on Fisher information is used to determine the optimal phase-mask parameters. Finally, the anti-laser detection and damage performance of asymmetric phase masks at different defocus distances and propagation distances are simulated and analyzed. When studying the influence of defocus distance, compared to conventional imaging, the maximum single-pixel receiving power and echo-detection receiving power of asymmetric phase masks are reduced by about one and two orders of magnitude respectively. When exploring the influence of propagation distance, the maximum single-pixel receiving power of asymmetric phase masks decreases by about one order of magnitude and remains stable, and the echodetection receiving power gradually decreases with increasing propagation distance, until it approaches zero.

Strain relaxed Co nanocrystals formation from thin films on sapphire substrate induced by nano-second laser irradiation

  • Seo, Ok-Gyun;Gang, Deok-Ho;Son, Jun-Gon;Choe, Jeong-Won;Ha, Seong-Su;Kim, Seon-Min;Gang, Hyeon-Cheol;No, Do-Yeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.145.2-145.2
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    • 2016
  • We report the phase transformation of Co thin films on a sapphire substrate induced by laser irradiation. As grown Co films were initially strained and tetragonally distorted. With low power laser irradiation, the surface was ruptured and irregular holes were formed. As the laser power was increased, the films changed into round shape Co nanocrystals with well-defined 6-fold structure. By measuring the XRD of Co nanostructure as a function of laser energy densities, we found that the change of morphological shapes from films to nanocrystals was accompanied with decrease of the tetragonal distortion as well as strain relaxation. By measuring the size distribution of nanocrystals as a function of film thickness, the average diameter is proportional to 1.7 power of the film thickness which was consistent with the prediction of thin film hydrodynamic (TFT) dwetting theory. Finally, we fabricated the formation of size controlling nanocrystals on the sapphire substrate without strain.

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Frequency Swept Laser at 1300 nm Using a Wavelength Scanning Filter Based on a Rotating Slit Disk

  • Jeon, Man-Sik;Jung, Un-Sang;Song, Jae-Won;Kim, Jee-Hyun;Oh, Jung-Hwan;Eom, Jin-Seob;Kim, Chang-Seok;Park, Young-Ho
    • Journal of the Optical Society of Korea
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    • v.13 no.3
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    • pp.330-334
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    • 2009
  • A simple and compact frequency swept laser is demonstrated at $1.3{\mu}m$ using a wavelength scanning filter based on a rotating slit disk. The laser is comprised of a pigtailed semiconductor optical amplifier, a circulator, and a wavelength scanning filter in an extended cavity configuration. The wavelength scanning filter is composed of a collimator, a diffraction grating, a rotating slit disk, and a mirror. The instantaneous laser output power is more than 5 mW. The scanning range of the laser is extended to 80 nm at the maximum level, and 55 nm in the full width at half maximum at a scanning rate of 2 kHz.