• Journal of the Korean Society of Surveying, Geodesy, Photogrammetry and Cartography
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• v.28 no.4
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• pp.431-439
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• 2010

Cross-interferometic synthetic aperture radar (CInSAR) technique from ERS-2 and Envisat images is capable of generating submeter-accuracy digital elevation model (DEM). However, it is very difficult to produce high-quality CInSAR-derived DEM due to the difference in the azimuth and range pixel size between ERS-2 and Envisat images as well as the small height ambiguity of CInSAR interferogram. In this study, we have proposed an efficient method to overcome the problems, produced a high-quality DEM over northern Alaska, and compared the CInSAR-derived DEM with the national elevation dataset (NED) DEM from U.S. Geological Survey. In the proposed method, azimuth common band filtering is applied in the radar raw data processing to mitigate the mis-registation due to the difference in the azimuth and range pixel size, and differential SAR interferogram (DInSAR) is used for reducing the unwrapping error occurred by the high fringe rate of CInSAR interferogram. Using the CInSAR DEM, we have identified and corrected man-made artifacts in the NED DEM. The wave number analysis further confirms that the CInSAR DEM has valid Signal in the high frequency of more than 0.08 radians/m (about 40m) while the NED DEM does not. Our results indicate that the CInSAR DEM is superior to the NED DEM in terms of both height precision and ground resolution.

• Korean Journal of Remote Sensing
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• v.24 no.2
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• pp.165-177
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• 2008

Small baseline subset (SBAS) algorithm has been recently developed using an appropriate combination of differential interferograms, which are characterized by a small baseline in order to minimize the spatial decorrelation. This algorithm uses the singular value decomposition (SVD) to measure the time-series surface deformation from the differential interferograms which are not temporally connected. And it mitigates the atmospheric effect in the time-series surface deformation by using spatially low-pass and temporally high-pass filter. Nevertheless, it is not easy to correct the phase unwrapping error of each interferogram and to mitigate the time-varying noise component of the surface deformation from this algorithm due to the assumption of the linear surface deformation in the beginning of the observation. In this paper, we present an improved SBAS technique to complement these problems. Our improved SBAS algorithm uses an iterative approach to minimize the phase unwrapping error of each differential interferogram. This algorithm also uses finite difference method to suppress the time-varying noise component of the surface deformation. We tested our improved SBAS algorithm and evaluated its performance using 26 images of ERS-1/2 data and 21 images of RADARSAT-1 fine beam (F5) data at each different locations. Maximum deformation amount of 40cm in the radar line of sight (LOS) was estimated from ERS-l/2 datasets during about 13 years, whereas 3 cm deformation was estimated from RADARSAT-1 ones during about two years.

• Bulletin of the Korean Chemical Society
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• v.34 no.3
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• pp.892-898
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• 2013

A field emission projection microscope was constructed to investigate the atomic and chemical-bonding structure of molecules using electron in-line holography. Fringes of carbon nanotube images were found to be interferograms equivalent to those created by the electron biprism in conventional electron microscopy. By exploiting carbon nanotubes as the filament of the electron biprism, we measured the transverse coherence length of the electron beam from tungsten field emitters. The measurements revealed that a partially coherent electron-beam was emitted from a finite area.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1997.04a
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• pp.161-166
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• 1997

A improved method to measure the wavefront aberration of aspheric lens is described. In this study, which is a kind of lateral shearing interferometry, a sinusoidal diffraction grating is used for better quality of interferogram. Also,the grating is inclined to horizontal axis for obtaining the two orthogonal derivatives and minimizing moving error simultaneously. Measurement result shows that the repeatability is about 6 times better then that of previouse Ronchi Test.

• Proceedings of the Optical Society of Korea Conference
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• 2006.02a
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• pp.335-336
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• 2006

We propose a method of encryption and decryption of binary data using 2-step phase-shifting digital interferometry. This technique reduces the number of interferograms in the phase-shifting interferometry. The binary data has been expressed with random code and random phase. We remove the dc-term of the phase-shifting digital interferogram to restore the original binary data. Simulation results shows that the proposed technique can be used for binary data encryption and decryption.

• Proceedings of the KSRS Conference
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• 2000.04a
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• pp.85-90
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• 2000

백두산 지역의 JERS-1 SLC 영상과 볼리비아 지역의 RADARSAT 영상에 대해 각각 interferometry와 radargrammetry를 이용하여 수치표고모형을 제작하였다. Interferometry 는 coregistration, interferogram 작성, phase unwrapping 과정으로 나눠지는데 temporal decorrelation으로 낮은 coherence, 부정확한 궤도정보가 DEM의 정확도를 저하시키는 주요 원인으로 작용하였다. Radargrammetry는 photogrammetry와 동일한 처리과정, 즉 GCP를 이용한 stereo model 설정, 영상 matching, 고도추출단계로 이루어지지만 광학영상 과는 다른 SAR 영상의 기하학적, 방사적 특성이 고려되어야 한다.

• Proceedings of the Optical Society of Korea Conference
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• 2003.07a
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• pp.274-275
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• 2003

광통신 분야의 연구 중 근거리 광통신 분야에 적용하기 위한 Plastic Optical Fiber(POF)에 관한 연구와 개발이 활발히 이루어지고 있다. POF의 광전송 특성을 결정짓는 요소 중 가장 중요한 특성이 바로 굴절률 분포이다. 이에 따라 그동안 다양한 형태의 POF 굴절률 측정 방법이 연구되어 왔다. 기존 Glass Optical Fiber의 굴절률 분포 측정 방법 중 가장 일반적이고 효과적인 방법 중 하나는 coherent 빛의 간섭을 이용한 transverse interferograms을 분석하는 방법으로 Fizeau 간섭계와 같은 간섭계를 이용하여 위상변화를 측정하고 측정한 위상을 tomography적인 해석방법을 통해 굴절률 분포를 계산하는 방법이다. (중략)

• 한국전산유체공학회:학술대회논문집
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• 1995.04a
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• pp.44-68
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• 1995

In the present paper, visualization techniques in fluid dynamic experiments such as Schlieren photograph are numerically simulated so that the same output as the experimental flow visualization can be obtained from the computed results for the fair comparison. Numerical methods to simulate optical visualizations, that are Schlieren photograph, shadowgraph and interferogram, are considered. Some examples of pictures obtained by the present methods show the importance of the simulations of visualization techniques for the correct comparisons of the computations and experiments.

• The Journal of the Korea Contents Association
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• v.7 no.3
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• pp.176-186
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• 2007

As SAR data have the strong point that is not influenced by weather or light amount in comparison with optical sensor data, they are highly useful for temporary analysis and can be collected in time of unforeseen circumstances like disaster. This study is to extract DEM from L-band data of JERS-1 SAR imagery using InSAR and DInSAR processing techniques. As a result of analyzing the extracted coherence and interferogram images, it was shown that the DInSAR 3-pass method produces more suitable coherence values than the InSAR method. The accuracies of DEM extracted from the SAR data were evaluated by employing the DEM derived from the digital topographic maps of 1:5000 scale as reference data. And it was ascertained that baselines between antenna locations largely affect the accuracy of extracted DEM.

• Journal of the Optical Society of Korea
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• v.18 no.3
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• pp.236-243
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• 2014

Surface profiling and film thickness measurement play an important role for inspection. White light interferometry is widely used for engineering surfaces profiling, but its applications are limited primarily to opaque surfaces with relatively simple optical reflection behavior. The conventional bucket algorithm had given inaccurate surface profiles because of the phase error that occurs when a thin-film exists on the top of the surface. Recently, reflectometry and white light scanning interferometry were combined to measure the film thickness and surface profile. These techniques, however, have found that many local minima exist, so it is necessary to make proper initial guesses to reach the global minimum quickly. In this paper we propose combing reflectometry and white light scanning interferometry to measure the thin-film thickness and surface profile. The key idea is to divide the measurement into two states; reflectometry mode and interferometry mode to obtain the thickness and profile separately. Interferogram modeling, which considers transparent thin-film, was proposed to determine parameters such as height and thickness. With the proposed method, the ambiguity in determining the thickness and the surface has been eliminated. Standard thickness specimens were measured using the proposed method. Multi-layered film measurement results were compared with AFM measurement results. The comparison showed that surface profile and thin-film thickness can be measured successfully through the proposed method.