• Proceedings of the Korean Vacuum Society Conference
• /
• 2015.08a
• /
• pp.160-160
• /
• 2015

InGaZnO (IGZO) thin-film transistors (TFTs) are very promising due to their potential use in high performance display backplane [1]. However, the stability of IGZO TFTs under the various stresses has been issued for the practical IGZO applications [2]. Up to now, many researchers have studied to understand the sub-gap density of states (DOS) as the root cause of instability [3]. Nomura et al. reported that these deep defects are located in the surface layer of the IGZO channel [4]. Also, Kim et al. reported that the interfacial traps can be affected by different RF-power during RF magnetron sputtering process [5]. It is well known that these trap states can influence on the performances and stabilities of IGZO TFTs. Nevertheless, it has not been reported how these defect states are created during conventional RF magnetron sputtering. In general, during conventional RF magnetron sputtering process, negative oxygen ions (NOI) can be generated by electron attachment in oxygen atom near target surface and accelerated up to few hundreds eV by self-bias of RF magnetron sputter; the high energy bombardment of NOIs generates bulk defects in oxide thin films [6-10] and can change the defect states of IGZO thin film. In this study, we have confirmed that the NOIs accelerated by the self-bias were one of the dominant causes of instability in IGZO TFTs when the channel layer was deposited by conventional RF magnetron sputtering system. Finally, we will introduce our novel technology named as Magnetic Field Shielded Sputtering (MFSS) process [9-10] to eliminate the NOI bombardment effects and present how much to be improved the instability of IGZO TFTs by this new deposition method.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2012.02a
• /
• pp.466-468
• /
• 2012

Amorphous InGaZnO (${\alpha}$-IGZO) thin-film transistors (TFTs) are are very promising due to their potential use in thin film electronics and display drivers [1]. However, the stability of AOS-TFTs under the various stresses has been issued for the practical AOSs applications [2]. Up to now, many researchers have studied to understand the sub-gap density of states (DOS) as the root cause of instability [3]. Nomura et al. reported that these deep defects are located in the surface layer of the ${\alpha}$-IGZO channel [4]. Also, Kim et al. reported that the interfacial traps can be affected by different RF-power during RF magnetron sputtering process [5]. It is well known that these trap states can influence on the performances and stabilities of ${\alpha}$-IGZO TFTs. Nevertheless, it has not been reported how these defect states are created during conventional RF magnetron sputtering. In general, during conventional RF magnetron sputtering process, negative oxygen ions (NOI) can be generated by electron attachment in oxygen atom near target surface and accelerated up to few hundreds eV by self-bias of RF magnetron sputter; the high energy bombardment of NOIs generates bulk defects in oxide thin films [6-10] and can change the defect states of ${\alpha}$-IGZO thin film. In this paper, we have confirmed that the NOIs accelerated by the self-bias were one of the dominant causes of instability in ${\alpha}$-IGZO TFTs when the channel layer was deposited by conventional RF magnetron sputtering system. Finally, we will introduce our novel technology named as Magnetic Field Shielded Sputtering (MFSS) process [9-10] to eliminate the NOI bombardment effects and present how much to be improved the instability of ${\alpha}$-IGZO TFTs by this new deposition method.

• Transactions on Electrical and Electronic Materials
• /
• v.17 no.6
• /
• pp.380-382
• /
• 2016

The mechanism for instability under PBS (positive bias stress) in amorphous SIZO (Si-In-Zn-O) thin-film transistors was investigated by analyzing the charge trapping mechanism. It was found that the bulk traps in the SIZO channel layer and the channel/dielectric interfacial traps are not created during the PBS duration. This result suggests that charge trapping in gate dielectric, and/or in oxide semiconductor bulk, and/or at the channel/dielectric interface is a more dominant mechanism than the creation of defects in the SIZO-TFTs.

• 한국연소학회:학술대회논문집
• /
• 2012.11a
• /
• pp.85-87
• /
• 2012

We present a numerical investigation on gaseous (ethylene-air mixture) detonation in the elastoplastical metal tubes to understand the wall effects associated with the developing detonation instability. The acoustic disturbances originating from the rapidly expanding tube walls reach the detonating flame surface, thereby causing flame distortions and total energy losses. The compressible Navier-Stokes equations with equation of state for gas and elasto-plastic deformation field equations for inert tubes are solved simultaneously to understand the complex multi-material interaction in the rapidly expanding gas pipe. In order to track governing variables across the material interface, we use the hybrid particle level-set and ghost fluid methods to precisely estimate the interfacial quantities. Features observed from the deforming (thin) tube show substantially different behavior when a detonation propagates in the rigid (thick) tube with no acoustically responding wall conditions.

• 유체기계공업학회:학술대회논문집
• /
• 2006.08a
• /
• pp.557-560
• /
• 2006

The contact angle of a meniscus and a droplet can be controlled by using electrowetting phenomena. We investigated the dynamic aspect of electrowetting for an oil-electrolyte interface formed inside a closed glass tube. A step input voltage is applied and the subsequent motion of the interface is recorded by a high-speed camera. A kind of capillary instability is observed near the three-phase contact line, which could degrade the reliability of device utilizing electrowetting such as electrowetting liquid lens. The dynamics of interface motion for different input voltages and the fluid viscosities are analyzed and discussed based on the experimental results.

• Korea-Australia Rheology Journal
• /
• v.16 no.4
• /
• pp.219-226
• /
• 2004

In this study the deformation of liquid-air interface of Newtonian or Boger fluids filled between two par­allel-plates geometry was investigated when two surfaces were separated at a constant speed. The interface between the fluid and air showed either stable or unstable deformation depending on experimental con­ditions. Repeated experiments for a wide range of experimental conditions revealed that the deformation mode could be classified into three types: 'stable region', 'fingering' and 'cavitation'. The experimental condition for the mode of deformation was plotted in a capillary number vs. Deborah number phase plane. It has been found that the elasticity of Boger fluids destabilize the interface deformation. On the other hand, the elasticity suppresses the formation and growth of cavities.

• Journal of the Society of Cosmetic Scientists of Korea
• /
• v.25 no.4 s.34
• /
• pp.65-74
• /
• 1999

We have studied the stability of W/O high internal phase emulsions(HIPE) containing water, cetyl dimethicone copolyol and oils varying magnesium sulfate in the range 0 to 0.5 wt% and oil polarities, respectively. The rheological consistency was mainly destroyed by the coalescence of the deformed water droplets. The greater the increase of complex modulus was, the less coalescence occurred and the more consistent the concentrated emulsions were. The increasing pattern of complex modulus versus volume fraction has been explained with the resistance to coalescence of the deformed interfacial film of water droplets in concentrated W/O emulsion. The stability is dependent on: (i) the choice of the oil is important, the requirements coincide with the requirements for the formation of the rigid liquid crystalline phases; and (ii) addition of salts the aqueous phase opposes the instability due to coalescence. Increasing the salt concentration increases the refractive index of the aqueous phase. It lowers the difference in the refractive index between the oil and aqueous phases. This decreases the attraction between the water domains, thus increasing the stability.

• Transactions on Electrical and Electronic Materials
• /
• v.18 no.6
• /
• pp.316-319
• /
• 2017

A new approach to improving the electrical characteristics and optical response of a polysilicon-based metal-semiconductor-metal (MSM) photodetector is proposed. To understand the cause of current restriction in the MSM photodetector, modified trap mechanisms are suggested, which include interfacial electron traps at the metal/polysilicon interface and silicon dangling bonds between silicon crystallite grains. Those traps were passivated using hydrogen ion implantation with subsequent post-annealing. Photodetectors that were ion-implanted under optima conditions exhibited improved photoconductivity and reduced dark current instability, implying that the hydrogen bonds in the polysilicon influence the simultaneous decreases in the density of dangling bonds at grain boundaries and the trapped positive charges at the contact interface.

• Proceedings of the Korean Society for Applied Microbiology Conference
• /
• 2001.06a
• /
• pp.146-148
• /
• 2001

The objective of this study was to investigate the behavior of ribonuclease A (RNase) at the water/methylene chloride interface. It was aimed at better understanding the denaturation of proteins upon emulsification. RNase was vulnerable to the interface-induced aggregation reactions that led to formation of water-insoluble aggregates upon emulsification. Biochemical analyses demonstrated that intermolecular covalent linkages might have been involved in the aggregation reactions. The protein instability observed with emulsification was traced to consequences of protein adsorption and conformational rearrangements at the interface. These results indicated that emulsifying aqueous protein solutions in organic solvents should be handled with care, since emulsification could bring denaturation and aggregation to proteins.

• Proceedings of the SCSK Conference
• /
• 1999.10a
• /
• pp.65-74
• /
• 1999

We have studied the stability of W/O high internal phase emulsions(HIPE) containing water, cetyl dimethicone copolyol and oils varying magnesium sulfate in the range 0 to 0.5wt% and oil polarities, respectively. The rheological consistency was mainly destroyed by the coalescence of the deformed water droplets. The greater the increase of concentrated modulus was, the less coalescence occurred and the more consistent the concentrated emulsions were. The increasing pattern of complex modulus versus volume fraction has been explained with the resistance to coalescence of the deformed interfacial film of water droplets in concentrated W/O emulsion. The stability is dependent on: (i) the choice of the oil is important, the requirements coincide with the requirements for the formation of the rigid liquid crystalline phases :5; and (ii) addition of salts the aqueous phase opposes the instability due to coalescence:. Increasing the salt concentration increases the refractive index of the aqueous phase. It lowers the difference in the refractive index between the oil and aqueous phases. This decreases the attraction between the water domains, thus increasing the stability.