• 제목/요약/키워드: inspection line

검색결과 590건 처리시간 0.027초

A New Robotic 3D Inspection System of Automotive Screw Hole

  • Baeg, Moon-Hong;Baeg, Seung-Ho;Moon, Chan-Woo;Jeong, Gu-Min;Ahn, Hyun-Sik;Kim, Do-Hyun
    • International Journal of Control, Automation, and Systems
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    • 제6권5호
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    • pp.740-745
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    • 2008
  • This paper presents a new non-contact 3D robotic inspection system to measure the precise positions of screw and punch holes on a car body frame. The newly developed sensor consists of a CCD camera, two laser line generators and LED light. This lightweight sensor can be mounted on an industrial robot hand. An inspection algorithm and system that work with this sensor is presented. In performance evaluation tests, the measurement accuracy of this inspection system was about 200 ${\mu}m$, which is a sufficient accuracy in the automotive industry.

신경망 데이타 압축과 JPEG(표준정지영상압축기법)에 의한 원거리에 위치한 제조공정의 온라인 자동검사 (An Automatic On-Line Inspection of the Remotely Located Manufacturing Process Based on Neural Network Data Compression and Joint Photographic Experts Group)

  • 김상철;왕지남
    • 한국정밀공학회지
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    • 제13권2호
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    • pp.37-47
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    • 1996
  • This paper presents an automatic tele-inspection scheme for the remotely manufacturing process. The remote-manufacturing process is continuously monitored and a crucial process is captured by CCD Camera. The captured image is compressed by neural network and JPEG, and it is sent directly to the assembly plant for incoming inspection. Massive image data require broadband channel to transmit them to remote distance, but sender is able to transmit them to receiver in use common channel by compressing massive image data in the high ratio. After the receiver reconstructs the compressed image to be transmitted, the reconstructed image is also directly used for automatic inspection of the process. The Experimental results show that the proposed inspection mechanism could be effectively implemented for real applications.

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패턴이 있는 TFT-LCD 패널의 결함검사를 위하여 근접패턴비교와 경계확장 알고리즘을 이용한 자동광학검사기(AOI) 개발 (Development of AOI(Automatic Optical Inspection) System for Defect Inspection of Patterned TFT-LCD Panels Using Adjacent Pattern Comparison and Border Expansion Algorithms)

  • 강성범;이명선;박희재
    • 제어로봇시스템학회논문지
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    • 제14권5호
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    • pp.444-452
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    • 2008
  • This paper presents an overall image processing approach of defect inspection of patterned TFT-LCD panels for the real manufacturing process. A prototype of AOI(Automatic Optical Inspection) system which is composed of air floating stage and multi line scan cameras is developed. Adjacent pattern comparison algorithm is enhanced and used for pattern elimination to extract defects in the patterned image of TFT-LCD panels. New region merging algorithm which is based on border expansion is proposed to identify defects from the pattern eliminated defect image. Experimental results show that a developed AOI system has acceptable performance and the proposed algorithm reduces environmental effects and processing time effectively for applying to the real manufacturing process.

실시간 영상처리를 이용한 표면흠검사기 개발 (The Development of Surface Inspection System Using the Real-time Image Processing)

  • 이종학;박창현;정진양
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2000년도 제15차 학술회의논문집
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    • pp.171-171
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    • 2000
  • We have developed m innovative surface inspection system for automated quality control for steel products in POSCO. We had ever installed the various kinds of surface inspection systems, such as a linear CCD and a laser typed surface inspection systems at cold rolled strips production lines. But, these systems cannot fulfill the sufficient detection and classification rate, and real time processing performance. In order to increase detection and classification rate, we have used the Dark, Bright and Transition Field illumination and area type CCD camera, and fur the real time image processing, parallel computing has been used. In this paper, we introduced the automatic surface inspection system and real time image processing technique using the Object Detection, Defect Detection, Classification algorithms and its performance obtained at the production line.

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클러스터링 알고리즘을 이용한 SMT 검사기의 검사시간 단축 방법 (The Reduction Methods of Inspection Time for SMT Inspection Machines Using Clustering Algorithms)

  • 김화중;박태형
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 하계학술대회 논문집 D
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    • pp.2453-2455
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    • 2003
  • We propose a path planning method to reduce the inspection time of AOI (automatic optical inspection) machines in SMT (surface mount technology) in-line system. Inspection windows of board should be clustered to consider the FOV (field-of-view) of camera. The number of clusters is desirable to be minimized in order to reduce the overall inspection time. We newly propose a genetic algorithm to minimize the number of clusters for a given board. Comparative simulation results are presented to verify the usefulness of proposed algorithm.

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Bi-directional fault analysis of evaporator inspection system

  • Kang, Dae-Ki;Kang, Jeong-Jin
    • International journal of advanced smart convergence
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    • 제1권1호
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    • pp.57-60
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    • 2012
  • In this paper, we have performed a safety analysis on an automotive evaporator inspection system. We performed the bi-directional analysis on the manufacturing line. Software Fault Tree Analysis (SFTA) as backward analysis and Software Failure Modes, Effects, & Criticality Analysis (SFMECA) as forward analysis are performed alternately to detect potential cause-to-effect relations. The analysis results indicate the possibility of searching and summarizing fault patterns for future reusability.

In-line Automatic defect inspection and repair method for TFT-LCD production

  • Honoki, Hideyuki;Arai, T.;Edamura, T.;Yoshimura, K.;Nakasu, N.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권1호
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    • pp.286-289
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    • 2007
  • We have developed an automated circuit defect inspection and repair method that can be used to improve the yield ratio of TFT-LCD. The method focuses on correcting resist patterns after the development process to ensure shape regularity. We built a prototype system and confirmed that the method is valid.

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LCD(Liquid Crystal Display) Panel의 결점 검사 (Automatic Inspection for LCD Panel Defect)

  • 이유진;이중현;고국원;조수용;이정훈
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2005년도 춘계학술대회 논문집
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    • pp.946-949
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    • 2005
  • This paper deals with the algorithm development that inspects defects such as Bright Defect Dots, Dark Defect Dots, and Line Defect caused by the process of LCD(Liquid Crystal Display). While most of LCD production process is automated, the inspection of LCD panel and its appearance depends on manual process. So, the quality of the inspection is affected by the condition of worker. Especially, the more LCD size increases, the more the worker feels fatigued, which causes the probability of miss judgement. So, the automated inspection is required to manage the consistent quality of the product and reduce the production costs. In this paper, to solve these problems, we developed the imaging processing algorithm to inspect the defects in captured image of LCD. Experimental results reveal that we can recognize various types of defect of LCD with good accuracy and high speed.

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기존터널 안전진단 결과를 통한 근접시공 시 터널 안정성 평가 (Tunnel Safety Diagnosis in Near-excavation by In-depth Inspection of Tunnel)

  • 김석재;김민석;김준철;유영일;오정배;오세준
    • 터널과지하공간
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    • 제16권4호
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    • pp.347-356
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    • 2006
  • 기존의 단선터널에 근접하여 신설터널의 시공시 기존터널의 안정성 확보를 최우선하기 위해 건전도 평가를 반영한 안정성 검토 수행 및 터널의 안전확보를 위해 검토 반영된 사례를 분석하였다. 건전도 평가결과 및 근접도 구분에 따른 신설터널에 대한 대책으로 선대구경수평심발과 Line Drilling을 병용하고 민가구간은 무진동암파쇄공법을 적용하여 진동과 소음을 허용치 이내로 제어하였다. 또한 신설터널 시공중에 발생할 수 있는 기존구조물에 대한 영향을 평가하여 열차의 운행과 사용중인 구조물의 안정성 확보를 위하여 Basset System을 계획하였다.

Mechanism and Application of NMOS Leakage with Intra-Well Isolation Breakdown by Voltage Contrast Detection

  • Chen, Hunglin;Fan, Rongwei;Lou, Hsiaochi;Kuo, Mingsheng;Huang, Yiping
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제13권4호
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    • pp.402-409
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    • 2013
  • An innovative application of voltage-contrast (VC) inspection allowed inline detection of NMOS leakage in dense SRAM cells is presented. Cell sizes of SRAM are continual to do the shrinkage with bit density promotion as semiconductor technology advanced, but the resulting challenges include not only development of smaller-scale devices, but also intra-devices isolation. The NMOS leakage caused by the underneath n+/P-well shorted to the adjacent PMOS/N-well was inspected by the proposed electron-beam (e-beam) scan in which VC images were compared during the in-line process step of post contact tungsten (W) CMP (Chemical Mechanical Planarization) instead of end-of-line electrical test, which has a long response time. A series of experiments based on the mechanism for improving the intra-well isolation was performed and verified by the inline VC inspection. An optimal process-integration condition involved to the tradeoff between the implant dosage and photo CD was carried out.