• 제목/요약/키워드: inner-outer dependence method

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내부-외부 종속법을 이용한 수색.구조 구역의 위험성 평가 (Evaluation of Risk Level for Damage of Marine Accidents in SRRs using Inner-Outer Dependence Method)

  • 장운재;금종수
    • 해양환경안전학회:학술대회논문집
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    • 해양환경안전학회 2006년도 춘계학술발표회
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    • pp.59-64
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    • 2006
  • 본 연구는 해양사고 피해규모에 의해 우리나라 수색 구조 구역의 위험성을 평가하였다. 위험성 평가를 위해서 전문가 지식에 기반 한 퍼지로직, 내부-외부 종속법을 이용하였다. 본 연구에서 평가치 중요도 산출을 위해 이용한 퍼지로직은 퍼지 확장원리에 의한 최대최소화 합성이고, 비퍼지화는 무게중심법을 이용하였다. 평가항목에 대한 중요도 산출을 위해서는 내부-외부 종속법을 이용하였으며, 최종 종합 평가 중요도는 마아코브 분석법을 이용하였다. 그 결과 통영, 여수 수색 구조 구역의 위험성이 비교적 높은 것으로 평가되어, 향후 위험성을 경감하기 위해 많은 구조선과 구조장비가 필요 할 것으로 판단된다.

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내부-외부 종속법을 이용한 수색.구조 구역의 위험성 평가 (Evaluation of Risk Level for Damage of Marine Accidents in SRRs using Inner-Outer Dependence Method)

  • 장운재;금종수
    • 해양환경안전학회지
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    • 제12권3호
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    • pp.219-224
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    • 2006
  • 본 연구는 해양사고 피해규모에 의한 우리나라 수색.구조 구역의 위험성을 평가하였다. 이러한 위험성 평가를 위해서 본 연구에서는 전문가 지식에 기반한 퍼지로직과 내부-외부 종속법을 이용하였다. 본 연구에서 이용한 퍼지로직은 퍼지 확장원리에 의한 최대최소화 합성이고, 중요도 산출을 위한 비퍼지화는 무게중심법을 이용하였다. 또한 평가항목에 대한 중요도 산출을 위해서는 내부-외부 종속법을 이용하였으며, 최종 종합 평가 중요도는 마아코브 분석법을 이용하였다. 그 결과 통영, 목포, 여수 수색.구조 구역의 위험성이 비교적 높은 것으로 평가되어, 향후 위험성을 경감하기 위해 우선적으로 구조선과 구조장비가 필요할 것으로 판단된다.

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AHP와 ANP의 결합을 통한 합리적 예측모델구축

  • 이태희;김홍재
    • 한국경영과학회:학술대회논문집
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    • 한국경영과학회 1997년도 추계학술대회발표논문집; 홍익대학교, 서울; 1 Nov. 1997
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    • pp.229-232
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    • 1997
  • This study is pursuited to construct the reasonable forecasting model through the combining AHP with ANP. It may be considered to be advanced study for prior various combining forecasts methods. Although prior studies are constrained to single or two criteria in selecting the optimal forecasting method, this study extend it to multi-criteria, inner and outer-dependence of clusters and elements, and feedback effect in hierarchy. A brief illustration is provided, and limitations of this study are presented.

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AC transport current loss analysis for a face-to-face stack of superconducting tapes

  • Yoo, Jaeun;Youm, Dojun;Oh, SangSoo
    • 한국초전도ㆍ저온공학회논문지
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    • 제15권2호
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    • pp.34-38
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    • 2013
  • AC Losses for face to face stacks of four identical coated conductors (CCs) were numerically calculated using the H-formulation combined with the E-J power law and the Kim model. The motive sample was the face to face stack of four 2 mm-wide CC tapes with 2 ${\mu}m$ thick superconducting layer of which the critical current density, $J_c$, was $2.16{\times}10^6A/cm^2$ on IBAD-MgO template, which was suggested for the mitigation of ac loss as a round shaped wire by Korea Electrotechnology Research Institute. For the calculation the cross section of the stack was simply modeled as vertically aligned 4 rectangles of superconducting (SC) layers with $E=E_o(J(x,y,t)/J_c(B))^n$ in x-y plane where $E_o$ was $10^{-6}$ V/cm, $J_c$(B) was the field dependence of current density and n was 21. The field dependence of the critical current of the sample measured in four-probe method was employed for $J_c$(B) in the equation. The model was implemented in the finite element method program by commercial software. The ac loss properties for the stacks were compared with those of single 4 cm-wide SC layers with the same critical current density or the same critical current. The constraint for the simulation was imposed in two different ways that the total current of the stack obtained by integrating J(x,y,t) over the cross sections was the same as that of the applied transport current: one is that one fourth of the external current was enforced to flow through each SC. In this case, the ac loss values for the stacks were lower than those of single wide SC layer. This mitigation of the loss is attributed to the reduction of the normal component of the magnetic field near the SC layers due to the strong expulsion of the magnetic field by the enforced transport current. On the contrary, for the other case of no such enforcement, the ac loss values were greater than those of single 4cm-wide SC layer and. In this case, the phase difference of the current flowing through the inner and the outer SC layers of the stack was observed as the transport current was increased, which was a cause of the abrupt increase of ac loss for higher transport current.