• Journal of the Korean Society for Geothermal and Hydrothermal Energy
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• v.4 no.1
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• pp.11-19
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• 2008

Groundwater flow in confined aquifer and heat transport in underground geologic media are using same governing equation(line source) like well fuction. Therefore the conventional slope method using only later data obtained from in-situ thermal response test to determine the thermal conductivity of vertical geothermal heat exchanger(GHEX) is basically identical with one of Theis straight line method of aquifer test under artesian condition. In case that the pumping rate(Q, $m^3$/d) and drawdown(s,m) which are used for input data of existing hydrogeologic computer programs for aquifer test are replaced and converted to supplying heat energy per unit length of bore hole(Q/L,w/m or Kcal/h.m) and temperatures (T,$^{\circ}C$)measured at in and out-let of GHEX as in put data respectively, thermal conductivity around geothermal heat exchanger can be easily estimated without any special modification of the existing hydrogeologic computer program. Two numbers of time series temperature variation data obtained from in situ geothermal response test are analized using Theismethods(standard curve and straight line method) by using existing aquifer test program and conventional Slope method proposed by ASHRAE. The results show that thermal conductivity values estimated by two straight methods are identical and the difference of estimated values between standard curve methods and Slope method are also within acceptable ranges. In general,the thermal conductivity estimated from Theis straight linemethod gives more accurate value than the one of Slope method due to that Slope method uses only visual matching otherwise Theis method uses automatic curve matching estimation with reducing RSS.

• Korean Journal of Materials Research
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• v.28 no.4
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• pp.235-240
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• 2018

We propose a speedy two-step deposit process to form an Au electrode on hole transport layer(HTL) without any damage using a general thermal evaporator in a perovskite solar cell(PSC). An Au electrode with a thickness of 70 nm was prepared with one-step and two-step processes using a general thermal evaporator with a 30 cm source-substrate distance and $6.0{\times}10^{-6}$ torr vacuum. The one-step process deposits the Au film with the desirable thickness through a source power of 60 and 100 W at a time. The two-step process deposits a 7 nm-thick buffer layer with source power of 60, 70, and 80 W, and then deposits the remaining film thickness at higher source power of 80, 90, and 100 W. The photovoltaic properties and microstructure of these PSC devices with a glass/FTO/$TiO_2$/perovskite/HTL/Au electrode were measured by a solar simulator and field emission scanning electron microscope. The one-step process showed a low depo-temperature of $88.5^{\circ}C$ with a long deposition time of 90 minutes at 60 W. It showed a high depo-temperature of $135.4^{\circ}C$ with a short deposition time of 8 minutes at 100 W. All the samples showed an ECE lower than 2.8 % due to damage on the HTL. The two-step process offered an ECE higher than 6.25 % without HTL damage through a deposition temperature lower than $88^{\circ}C$ and a short deposition time within 20 minutes in general. Therefore, the proposed two-step process is favorable to produce an Au electrode layer for the PSC device with a general thermal evaporator.

• Journal of the Korean Institute of Telematics and Electronics
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• v.25 no.11
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• pp.1294-1303
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• 1988

Electron and hole traps in semi-insulating GaAs with activation energies ({\Delta}E_r) ranging from 0.16 $\pm$ 0.01 to 0.98 $\pm$ 0.01 eV, have been detected and characterized by photo-induced current transient measurements. SI undoped GaAs has fewer deep levels than SI GaAs: Cr. The thermal capture cross section and density of the traps have been estimated and some of the centers have been related to native defects. In particular, the activation energy of the compensating Cr, and "0" levels in semi-insulating GaAs were accurately measured. The transient measurements were complemented by Hall measurements at T > 300K and photocurrent spectra measurements. The transition energies for the deep compensating levels obtained by the analyses of data from these measurements, when compared with those from the transient measurements, indicate negligible lattice-coupling of these centers. Analysis of the transport data also indicates that neutral impurity scattering plays a significant role in semi-insulating materials at high temperatures.

• Bulletin of the Korean Chemical Society
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• v.35 no.3
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• pp.913-918
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• 2014

Five mol % tungsten-doped tin oxide ($W_{0.05}Sn_{0.95}O_2$, TTO5) was prepared by co-precipitation of $SnCl_4{\cdot}5H_2O$ and $WCl_4$, followed by calcination at $1000^{\circ}C$. The as-prepared TTO5 was in the pure cassiterite phase with a particle size of ~50 nm and optical bandgap of 2.51 eV. Herein it was applied for the formation of TTO5/$TiO_2$ heterojunctions by covering the TTO5 surface with $TiO_2$ by sol-gel method. Under visible-light irradiation (${\lambda}{\geq}420$ nm), TTO5/$TiO_2$ showed a significantly high photocatalytic activity in removing gaseous 2-propanol (IP) and evolving $CO_2$. It is deduced that its high visible-light activity is caused by inter-semiconductor holetransfer between the valence band (VB) of TTO5 and $TiO_2$, since the TTO5 nanoparticle (NP) exhibits the absorption edge at ~450 nm and its VB level is located more positive side than that of $TiO_2$. The evidence for the hole-transport mechanism between TTO5 and $TiO_2$ was also investigated by monitoring the holescavenging reaction with 1,4-terephthalic acid (TA).

• Proceedings of the KIEE Conference
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• 1998.07d
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• pp.1373-1376
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• 1998

Electroluminescent(EL) devices based on organic materials have been of great interest due to their possible applications for large-area flat-panel displays. They are attractive because of their capability of multicolor emission, and low operation voltage. In this study, glass substrate/ITO/TPD/$Eu(TTA)_3(phen)/Alq_3/Al$ structures were fabricated by evaporation method, where aromatic diamine(TPD) were used as a hole transporting material, $Eu(TTA)_3(phen)$ as an emitting material, and tris(8-hydroxyquinoline)Aluminum ($Alq_3$) as an electron transporting layer. Electroluminescent(EL) and I-V characteristics of $Eu(TTA)_3(phen)$ with a variety thickness was investigated. This structure shows the red EL spectrum, which is almost the same as the PL spectrum of $Eu(TTA)_3(phen)$. I-V characteristics of this structure show that turn-on voltage was 9V and current density of $0.01A/cm^2$ at a dc drive voltage of 9V. Details on the explanation of electrical transport phenomena of these structures with I-V characteristics using the trapped-charge-limited current model will be discussed.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.345-346
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• 2008

We have studied an emission spectra of top-emssion organic light-emitting diodes(TEOLED) due to a change of cathode and organic layer thickness. Device structure is Al(100nm)/TPD(xnm)/$Alq_3$(ynm)/LiF(0.5nm)/cathode. And two different types of cathode were used; one is LiF(0.5nm)/Al(25nm) and the other is LiF(0.5nm)/Al(2nm)/Ag(30nm). While a thickness of hole-transport layer of TPD was varied from 35 to 65nm, an emissive layer thickness of $Alq_3$ was varied from 50 to 100nm for two devices. A ratio of those two layer was kept to be about 2:3. Al and Al/Ag double layer cathode devices show that the emission spectra were changed from 490nm to 560nm and from 490nm to 560nm, respectively, when the total organic layer increase. Full width at half maximum was changed from 67nm to 49nm and from 90nm to 35nm as the organic layer thickness increases. All devices show that view angle dependent emission spectra show a blue shift. Blue shift is strong when the organic layer thickness is more than 140nm. Devece with Al/Ag double layer cathode is more vivid.

• Journal of the Microelectronics and Packaging Society
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• v.12 no.3 s.36
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• pp.213-217
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• 2005

The polymer light emitting diodes (PLED) with ITO/PEDOT:PSS/MEH-PPV/Al structure were prepared on ITO(indium tin oxide)/Glass substrates using PEDOT:PSS[poly(3,4-ethylenedioxythiophene):poly(styrene sulfolnate)] as the hole transport material and MEH-PPV[poly(2-methoxy-5-(2-ethyhexoxy)-1,4phenylenvinylene)] as emission material layer. The dependences on the surface roughnees and friction coefficient between film layers were investigated as a function of the MEH-PPV concentrations$(0.1\;wt\%\~0.9\;wt\%)$. The RMS values decreased from 1.72 nm to 1.00 nm as the concentration of MEH-PPV increased from $0.1\;wt\%\;to\;0.9\;wt\%$, indicating improvement of surface roughness. In addition, friction coefficients decreased from 0.048 to 0.035, which means the deteriorating of the adhesion condition. The PLED sample with $0.5\;wt\%$ of MEH-PPV showed the maximum luminance of $409\;cd/m^2$.

• Journal of the Korean Society for Nondestructive Testing
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• v.22 no.5
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• pp.474-482
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• 2002

One dimensional Radiometric scanning system was fabricated and tested as a filmless radiographic inspection system, which could be applied to the evaluation of the corrosion and deposits in the pipeline. This system is composed of the single radioactive source of the collimated focusing beam, and single scintillation detector of BGO, and the mechanical scanning system to transport and align the source and detector, and the operating software to automatically control the mechanical scan system. The performance of the system was simulated using GEANT4 software. This system is applied to one specimen having an artificial falw(flat bottom hole) in the pipe and the other specimen with thickness variation. For the inspection by using the radioactive source in the pipeline, it is possible to evaluate the corrosion and deposits in real time and without film.

• Journal of Sensor Science and Technology
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• v.7 no.2
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• pp.97-102
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• 1998

Organic thin film EL devices using PPV(poly (p-phenylenevinylene)) as emitter were fabricated on various conditions and structures, their electro-optical properties were estimated. Fabricated EL devices had structures of single layer(ITO(indium tin oxide)/PPV/Mg), double layer(ITO/PVK(poly(N-vinylcarbazole))/PPV/Mg and ITO/PPV/Polymer matrix + PBD/Mg) and three layer (ITO/PVK/PPV/PS(polystyrene)+PBD(butyl-2-(4-bipheny])-5-(4-tert-butylphenyl-1,3,4-oxadiazole))/Mg), their electro-optical characteristics were compared with each other. In structure of double layer (ITO/PPV /Polymer matrix + PBD/Mg), the used polymer-matrices were PMMA(poly(methyl methacrylate), PC(polycarbonate), PS and MCH(side chain liquid crystalline homopolymer). When PS as a hole transport layer was used, the luminance characteristics on concentration of PBD was obtained. In results, current-voltage-luminance curves of fabricated devices had characteristics of tunneling effect and the device showed a stable light emitting.

• Steel and Composite Structures
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• v.1 no.1
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• pp.17-32
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• 2001

The Rosette-joining system is a completely new press-joining method for cold-formed steel structures. One Rosette-joint has a shear capacity equal to that of approximately four screws or rivets. The Rosette thin-walled steel truss system presents a new fully integrated prefabricated alternative to light-weight roof truss structures. The trusses are built up on special industrial production lines from modified top hat sections used as top and bottom chords and channel sections used as webs which are joined together with the Rosette press-joining technique to form a completed structure easy to transport and install. A single web section is used when sufficient but can be strengthened by double-nesting two separate sections or by using two lateral profiles where greater compressive axial forces are met. An individual joint in the truss can be strengthened by introducing a hollow bolt into the joint hole. The bolt gives the connection capacity a boost of approximately 20%. A series of laboratory tests have been carried out in order to verify the Rosette truss system in practice. In addition to compression tests on individual sections of different lengths, tests have also been done on small structural assemblies and on actual full-scale trusses of a span of 10 metres. Design calculations have been performed on selected roof truss geometries based on the test results, FE-analysis and on the Eurocode 3 and U.S.(AISI) design codes.