• Proceedings of the KAIS Fall Conference
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• 2007.05a
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• pp.136-138
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• 2007

본 연구에서는 유기박막트랜지스터 (OTFT, Organic Thin film Transistor) 제작을 위한 채널막으로 pentacene의 soluble 공정 과 soluble 공정 올 통하여 제작된 pentacene 박막의 특성 을 분석 하여 유기박막트랜지스터에 적용 여부를 조사하였다. Pentacene을 용해시키기 위한 용제로는 toluene과 chloroform을 사용하였으며, 각각의 용제에 대하여 열처리를 하여 pentacene 용액을 준비하였다. Spin-coating 법으로 pentacene 유기 박막을 제작하여 각 박막의 결정화 특성을 관찰하였다. XRD 회절 분석 결과 chloroform 올 이용한 pentacene 박막에서만 결정화가 된 것이 확인이 되었다. Hall effect measurement 분석 결과 chloroform올 이 용한, pentacene 박막의 전하농도 (Carrier Concentration)는 $-3.225{\times}1014(c{\cdot}cm^{-3})$를 나타내었고, 이동도 (Mobility)는 $3.5{\times}10^{-l}(cm^2{\cdot}V^{-1}{\cdot}S^{-1})$를 각각 나타내었다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.07a
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• pp.135-138
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• 2001

We report the structural ,optical and electrical properties of ZnO thin films depending on the variation of the film thickness. The properties of the films deposited on sapphire (001) substrates using a pulsed laser deposition technique (PLD) were characterized with XRD, hall measurement and photoluminescence (PL). In our study, the increase of the thickness of ZnO thin films shows the improvement of the structural and optical properties. The electric properties of the films were also well matched with the structural and optical properties

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1991.10a
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• pp.12-16
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• 1991

Cadmium sulphide films with thickness of 0.6∼1.2$\mu\textrm{m}$ were deposited onto corning 7059 glass substrate under a vacuum of 5${\times}$10$\^$-6/ Torr. Source and substrate temperature ranges used were 800∼1100$^{\circ}C$ and 100∼200$^{\circ}C$, respectively. The microstructures and semiconducting properties of the films were studied using X-ray diffraction, UV-VIS-IR spectrophotometer and Hall measurement unit. Electrical resistivity and optical transmission of the CdS films decrease with an increase in source temperature while they increase with an increase in substrate temperature. The resistivity of the film evaporated at 1100$^{\circ}C$ varied from 7${\times}$10$^3$ohm-cm at the substrate temperature of 100$^{\circ}C$ to 2${\times}$10$\_$6/ohm-cm at 190$^{\circ}C$. All the films had hexagonal structure and strong texture with c-axis of grains normal to the substrate glass.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.11a
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• pp.290-291
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• 2006

We prepared the multilayer with Al doped ZnO (AZO)/Ag/AZO structure. The multilayer were deposited with various thickness of Ag layer on glass substrates at room temperature by using facing targets sputtering (FTS) method. To investigate the electrical, optical and structural properties, we used Hall Effect measurement system, four-point probes. UV-VIS spectrometer with a wavelength of 300 - 100nm, X-ray Diffractometer(XRD) and scanning electron microscopy (SEM). We obtained multilayer thin film with the low resistivity $5,9{\times}10^{-5}{\Omega}cm$ and the average transmittance of 86% m the visible range (400 - 800nm).

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.11a
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• pp.284-285
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• 2006

We prepared ITO thin films using Facing Targets Sputtering(FTS) method with various input currents at room temperature on Polycarbonate(PC) and Polyethersulfon(PES) substrates. As a function of sputtering conditions, electrical and optical properties of prepared ITO thin films were measured. The electrical, optical, structural characteristics of ITO thin films were evaluated by Hall Effect Measurement(EGK), X-Ray Diffractormeter(Rigaku) and UV-VIS spectrometer(HP) respectively. From the results, we obtained ITO thin films that have a resistivity of $4{\times}10^{-4}[{\Omega}-cm]$ on PC and $527{\times}10^{-4}[{\Omega}-cm]$ on PES. Also, the optical transmittances of all samples were over 80%.

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2006.10a
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• pp.56-59
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• 2006

The ITO thin films were prepared by FTS (Facing Targets Sputtering) system on polycarbonate (PC) substrate. The ITO thin films were deposited with a film thickness of 100nm at room temperature. As a function of sputtering conditions, electrical and optical properties of prepared ITO thin films were measured. The electrical and optical characteristics of the ITO thin films were evaluated by Hall Effect Measurement (EGK) and UV-VIS spectrometer (HP), respectively. From the results, the ITO thin film was deposited with a resistivity $8{\times}10^{-4}[{\Omega}-cm]$ and transmittance over 80%.

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2006.10a
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• pp.60-63
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• 2006

Preparing AZO thin films on the polymer substrate has been widely studied Because AZO thin film has the potential applications. In this study, we prepared AZO thin films on polyethersulfon (PES) at room temperature. The AZO thin films were prepared at $O_2$ gas flow rate of 0.05 and sputtering power of 100W with different film thickness by facing targets sputtering method. The electrical, optical and crystallographic properties of AZO thin films were measured by Hall Effect measurement system, UV/VIS spectrometer, SEM and XRD. From the results, we obtained AZO thin films with a low resistivity, a transmittance of over 80% and c-axis preferred orientation.

• Transactions of Materials Processing
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• v.15 no.1 s.82
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• pp.82-88
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• 2006

In this paper, the web-based monitoring system is developed for the effective process monitoring of mold manufacturing using web. In developed system, the cutting force for monitoring the manufacturing condition is measured using hall-sensor that is low cost and useful to be installed in a machine tool indirectly. Specially, the current of main spindle in a machine tool is converted into cutting force by various experiments. For effective web-based monitoring, the program which runs in the local computer of client is made to exchange message between a server and a client by making of ActiveX control and the result of manufacturing is shown on web-browser by Ch language. The developed system in this study is the foundation of establishing E-manufacturing in mold factory.

• Journal of the Korean Ceramic Society
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• v.43 no.3 s.286
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• pp.185-192
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• 2006

The effects of annealing on structural and electrical properties of ITO/PES (Indium Tin Oxide/Polyethersulfone) films was investigated. Amorphous ITO thin films were grown on plastic substrates, PES using low temperature DC magnetron sputtering. Various post annealing techniques were attempted to research variations of microstructure and electrical properties: i) conventional thermal annealing, ii) excimer laser annealing, iii) UV irradiation. The electrical properties were obtained using Hall effect measurements and DC 4-point resistance measurement. The microstructural features were characterized by FESEM, XRD, Raman spectroscopy in terms of morphology and crystallinity. Optimized UV treatment exhibits the enhanced conductivity and crystallinity, compared to those of conventional thermal annealing.

• 한국정보디스플레이학회:학술대회논문집
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• 2006.08a
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• pp.752-755
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• 2006

Reverse annealing was observed in $P^+/B^+$ ion shower doped poly-Si upon activation annealing. Phosphorous or boron was implanted by ion shower doping using a source gas mixture of $PH_3/H_2$ or $B_2H_6/H_2$. Activation annealing was conducted using a tube furnace in the temperature ranges from $350^{\circ}C$ to $650^{\circ}C$. Hall measurement revealed that reverse annealing begins at different annealing temperatures for poly-Si implanted with P and B, respectively. It was observed that reverse annealing starts at $550^{\circ}C$$ in $P^+$ ion shower doped poly-Si, while at $350^{\circ}C$ in the case of B-doping.