• JSTS:Journal of Semiconductor Technology and Science
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• 제13권6호
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• pp.589-593
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• 2013

An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using a four-port vector network analyzer (VNA) without the external un-terminated ports. By using the four-port VNA, the reflected waves from the un-terminated ports could be minimized. The proposed method significantly enhances the accuracy of the S-parameters with less number of measurements compared to the results of classical renormalization technique which uses two-port VNA. The proposed method is validated from the measured data with the coupled 8-port micro-strip lines.

• 전기학회논문지
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• 제56권6호
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• pp.1105-1110
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• 2007

This paper describes an equivalent circuit modeling of 4-port connector system. A coupled transmission line was designed and fabricated, mimicking a 4-port connector system, and then S-parameters were measured using 4 port VNA (Vector Network Analyzer). The S-parameters from measurement and from Full-wave simulator coincided quite nice. By using these S parameters, an equivalent circuit parameters for a 4-port system was obtained. The time domain response from the equivalent circuit model matched to the signals, which was measured using TDR(Time Domain Reflectometry) meter. We were also convinced that there should be enough bandwidth to get a meaningful time domain result from Fourier inverse transformation of the S parameters. In addition, we applied the conversion algorithm to the 4-port connector system, which calculates the S-parameters of a 4 port system using the data from a 2-port VNA with the other ports open. Comparison of the two data, one from measurement and the other one from the conversion algorithm, was made in this manuscript.