Browse > Article
http://dx.doi.org/10.5573/JSTS.2013.13.6.589

Measurement of Multi-Port S-Parameters using Four-Port Network Analyzer  

Kim, Jongmin (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University)
Luong, Duc Long (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University)
Nah, Wansoo (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University)
Kim, SoYoung (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University)
Publication Information
JSTS:Journal of Semiconductor Technology and Science / v.13, no.6, 2013 , pp. 589-593 More about this Journal
Abstract
An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using a four-port vector network analyzer (VNA) without the external un-terminated ports. By using the four-port VNA, the reflected waves from the un-terminated ports could be minimized. The proposed method significantly enhances the accuracy of the S-parameters with less number of measurements compared to the results of classical renormalization technique which uses two-port VNA. The proposed method is validated from the measured data with the coupled 8-port micro-strip lines.
Keywords
Scattering parameter measurement; multi-port device; renormalization; four-port VNA;
Citations & Related Records
연도 인용수 순위
  • Reference
1 J. Tippet and R. Speciale, "A rigorous technique for measuring the scattering matrix of a multiport device with a 2-port network analyzer," Microwave Theory Tecnique., IEEE Transactions on, vol. 30, no. 5, pp. 661-667, May 1982.   DOI   ScienceOn
2 H. Dropkin, "Comments on 'A rigorous technique for measuring the scattering matrix of a multiport device with a 2-port network analyzer," Microwave Theory Tecnique., IEEE Transactions on, vol. 31, no. 1, pp. 79-81, Jan. 1983.   DOI   ScienceOn
3 I. Rolfes and B. Schiek, "Multiport method for the measurement of scattering parameters of n-ports," Microwave Theory Tecnique., IEEE Transactions on, vol. 53, no. 6, pp. 1990-1996, Jun. 2005.   DOI   ScienceOn
4 D. Kam and J. Kim, "Multiport Measurement Method Using a Two-Port Network Analyzer With Remaining Ports Unterminated," IEEE Microwave Wireless Components Lettter, vol. 17, no. 9, pp. 694-696, Sep. 2007.   DOI   ScienceOn
5 C. Chen and T. Chu, "An Error Analysis of the Scattering Matrix Renormalization Transform," Microwave Theory Tecnique., IEEE Transactions on, vol. 57, no.4, pp. 863-868, Apr. 2009.   DOI   ScienceOn
6 C. Chen and T. Chu, "Accuracy Criterion for SMatrix Reconstruction Transformson Multiport Networks," Microwave Theory Tecnique., IEEE Transactions on, no.9, pp. 2331-2339, September. 2011.