• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.13 no.2
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• pp.169-175
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• 2020

This paper studied the SET situation in VLSI because the electronic devices exposed to SET can indicate irregular operation and output errors. The SET environment was established using the exponential static wave (iexp) in the fold-cascode comparator. The comparator was experimented with how it affected it by the SET. In a folded comparator that did not enter the SET situation, the propagation delay was measured at 0.26㎲ and the gain was 0.649. The MOSFET close to the output stage was measured sensitively in the folded comparator that entered the SET situation. And propagation delay was calculated from 0.36 to 0.37㎲ and the gain was 0.649. The mid-position MOSFET was calculated from 0.28 to 0.30㎲ and the gain was 0.649. The MOSFET, which is farthest from the output stage from the folded comparator, was calculated with the propagation delay between 0.25 and 0.26㎲ and the gain of 0.649. In SET situations, the MOSFET close to the output portion of the folded comparator was sensitive. And at the MOSFET far from the output, the same results were obtained as a normal folded comparator without the SET input.