• Title/Summary/Keyword: featue from accelerated segment test

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An Embedded FAST Hardware Accelerator for Image Feature Detection (영상 특징 추출을 위한 내장형 FAST 하드웨어 가속기)

  • Kim, Taek-Kyu
    • Journal of the Institute of Electronics Engineers of Korea SP
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    • v.49 no.2
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    • pp.28-34
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    • 2012
  • Various feature extraction algorithms are widely applied to real-time image processing applications for extracting significant features from images. Feature extraction algorithms are mostly combined with image processing algorithms mostly for image tracking and recognition. Feature extraction function is used to supply feature information to the other image processing algorithms and it is mainly implemented in a preprocessing stage. Nowadays, image processing applications are faced with embedded system implementation for a real-time processing. In order to satisfy this requirement, it is necessary to reduce execution time so as to improve the performance. Reducing the time for executing a feature extraction function dose not only extend the execution time for the other image processing algorithms, but it also helps satisfy a real-time requirement. This paper explains FAST (Feature from Accelerated Segment Test algorithm) of E. Rosten and presents FPGA-based embedded hardware accelerator architecture. The proposed acceleration scheme can be implemented by using approximately 2,217 Flip Flops, 5,034 LUTs, 2,833 Slices, and 18 Block RAMs in the Xilinx Vertex IV FPGA. In the Modelsim - based simulation result, the proposed hardware accelerator takes 3.06 ms to extract 954 features from a image with $640{\times}480$ pixels and this result shows the cost effectiveness of the propose scheme.