• Korean Journal of Materials Research
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• v.17 no.7
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• pp.371-375
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• 2007

In-situ observation of electromigration behavior of eutectic SnPb solder was performed as a function of line length at $100^{\circ}C$, $6{\times}10^4A/cm$ condition in a scanning electron microscope chamber. The incubation time for edge drift and the edge drift velocity increase as line length increases, which are discussed with the void nucleation stage of solder bump and the electromigration back flux force, respectively. Finally, the existence of electromigration product (jL) and its line length dependency are also discussed.

• Journal of the Korean Society of Combustion
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• v.7 no.2
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• pp.24-33
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• 2002

The morphology of deposits on $15-{\mu}m$ thin SiC filaments has been investigated with SEM in a co-flowing, propane/air laminar diffusion flame. The average size of mature soot particles deposited in the luminous flame edge is strongly dependent on their axial position in a typical heavily sooting flame. The surface growth of liquid-phase PAHs molecules and the transition to soots from fully-developed precursors could be observed in the radial deposition of the flame. Two sooting regimes were found: one is the transition from the condensed-phase precursors; the other is the aggregation of smaller soot particles (or chains of them) to be carried along particle path lines. In the high temperature flame edge outside the soot luminous flame surface, the very thin fiber-like structures, which are about 10 nm thick, were found.

• Korean Journal of Optics and Photonics
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• v.6 no.3
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• pp.173-177
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• 1995

The scanning type modulation transfer function (MTF) measurement system of linear charge coupled device (CCD) imagers is fabricated and the MTF of a linear CCD imager is tested. Measured MTF values are very sensitive to small angle knife-edge skew within 1 degree and show different results in several wavelengths. The MTF of the linear CCD imager is measured in different color temperatures of a tungsten filament lamp and the MTF uniformity of ti,t eel) pixels is tested.tested.

• Applied Microscopy
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• v.50
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• pp.27.1-27.6
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• 2020

Transition metal dichalcogenides (TMD), which is composed of a transition metal atom and chalcogen ion atoms, usually form vacancies based on the knock-on threshold of each atom. In particular, when electron beam is irradiated on a monolayer TMD such as MoS₂ and WS₂, S vacancies are formed preferentially, and they are aligned linearly to constitute line defects. And then, a hole is formed at the point where the successively formed line defects collide, and metal clusters are also formed at the edge of the hole. This study reports a process in which the line defects formed in a monolayer WS₂ sheet expends into holes. Here, the process in which the W cluster, which always occurs at the edge of the formed hole, goes through a uniform intermediate phase is explained based on the line defects and the formation behavior of the hole. Further investigation confirms the atomic structure of the intermediate phase using annular dark field scanning transition electron microscopy (ADF-STEM) and image simulation.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.5
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• pp.511-515
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• 2013

A Monte Carlo (MC) simulation study has been done in order to investigate the effects of line-edge-roughness (LER) induced by either 1P1E (single-patterning and single-etching) or 2P2E (double-patterning and double-etching) on fully-depleted silicon-on-insulator (FDSOI) tri-gate metal-oxide-semiconductor field-effect transistors (MOSFETs). Three parameters for characterizing the LER profile [i.e., root-mean square deviation (${\sigma}$), correlation length (${\zeta}$), and fractal dimension (D)] are extracted from the image-processed scanning electron microscopy (SEM) image for each photolithography method. It is experimentally verified that two parameters (i.e., ${\sigma}$ and D) are almost the same in each case, but the correlation length in the 2P2E case is longer than that in the 1P1E case. The 2P2E-LER-induced $V_TH$ variation in FDSOI tri-gate MOSFETs is smaller than the 1P1E-LER-induced $V_TH$ variation. The total random variation in $V_TH$, however, is very dependent on the other major random variation sources, such as random dopant fluctuation (RDF) and work-function variation (WFV).

• Korean Journal of Materials Research
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• v.19 no.6
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• pp.330-336
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• 2009

The size of crystallites in mono-dispersed cubic silver bromide grains was measured by applying a powder X-ray diffraction method and Scherrer's equation to grains that were suspended in swollen gelatin layers. In order to evaluate the existence of defects, the measured crystallite size was compared to those measured by using a scanning electron microscope. In the case of the grains prepared by the controlled double jet method, the size of crystallites was equal to the edge length of the grains that had edge lengths smaller than 400 nm. This result proved the usefulness of the above-stated method for measuring the size of crystallites and also evaluating the presence of any crystal defect in each grain. In the case of the grains, which were precipitated in the presence of a sensitizing dye and potassium iodide, the size of crystallites was smaller than the edge's length, indicating the discontinuities in the grains introduced during the precipitation process.

• Proceedings of the Optical Society of Korea Conference
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• 2002.07a
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• pp.162-163
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• 2002

1-D photonic band-gap structure is identified in a cholesteric liquid crystal system. The optical transmission spectrum is measured and compared with the theoretical analysis. Nonlinear transmission is measured near the band edge. Also 3-D photonic band-gap structures are fabricated from dielectric colloidal polystyrene beads through a centrifuge method. The fabricated photonic crystals exhibit opalescent colors under white light and show a clear diffraction peak dependent on the incident angle of the light beam. Also the scanning electron microscope image was taken to verify the face-centered cubic crystal structure. Bragg's law and Snell's law are employed to describe the position of angle resolved diffraction peaks. It was shown that the optically deduced effective refractive index and lattice constants were in good agreement with the crystal structure identified by scanning electron microscope.

• 제어로봇시스템학회:학술대회논문집
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• 2002.10a
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• pp.99.1-99
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• 2002

In this paper, a computer-vision based pipe-inspection algorithm is developed. The algorithm uses the modified Hough transformation and a line-scanning approach to identify the edge line and radius of the pipe image, from which the eccentricity and dimension of the pipe-end is calculated. Line and circle detection was performed using Laplacian operator with input image which are acquired from the front and side cameras. In order to minimize the memory usage and the processing time, a clustering method with the modified Hough transformation for line detection. The dimension of inner and outer radius of pipe is calculated by proposed line-scanning method. The method scans several lines along t...

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2003.06a
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• pp.946-950
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• 2003

In this paper, a computer-vision based pipe shape inspection algorithm is developed. The algorithm uses the modified Hough transformation and a line-scanning approach to identify the edge line and radius of the pipe image, from which the eccentricity and dimension of the pipe-end is calculated. Line and circle detection was performed using Laplace operator with input image, which are acquired from the front and side cameras. In order to minimize the memory usage and the processing time, a clustering method with the modified Hough transformation for line detection. The dimension of inner and outer radius of pipe is calculated by proposed line-scanning method. The method scans several lines along the X and Y axes, calculating the eccentricity of inner and outer circle. by which pipes with wrong end-shape can be classified removed.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2002.10a
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• pp.521-525
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• 2002

In this paper, a computer-vision based pipe-inspection algorithm is developed. The algorithm uses the modified Hough transformation and a line-scanning approach to identify the edge line and radius of the pipe image, from which the eccentricity and dimension of the pipe-end is calculated. Line and circle detection was performed using Laplace operator with input image, which are acquired from the front and side cameras. In order to minimize the memory usage and the processing time, a clustering method with the modified Hough transformation for line detection. The dimension of inner and outer radius of pipe is calculated by proposed line-scanning method. The method scans several lines along the X and Y axes, calculating the eccentricity of inner and outer circle, by which pipes with wrong end-shape can be classified removed.