• 한국진공학회:학술대회논문집
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• 한국진공학회 2011년도 제40회 동계학술대회 초록집
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• pp.347-347
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• 2011

Secondary ion mass spectrometry (SIMS) was fascinated by a quantitative analysis and a depth profiling and it was convinced of a in-depth analysis of multi-layer films. Precision determination of the interfaces of multi-layer films is important for conversion from the original SIMS depth profiling to the compositional depth profiling and the investigation of structure of multi-layer films. However, the determining of the interface between two kinds of species of the SIMS depth profile is distorted from original structure by the several effects due to sputtering with energetic ions. In this study, the feasibility of 50 atomic % definition for the determination of interface between two kinds of species in SIMS depth profiling of multilayer films was investigated by Si/Ge and Ti/Si multi-layer films. The original SIMS depth profiles were converted into compositional depth profiles by the relative sensitivity factors from Si-Ge and Si-Ti alloy reference films. The atomic compositions of Si-Ge and Si-Ti alloy films determined by Rutherford backscattering spectroscopy (RBS).

• 한국지반공학회:학술대회논문집
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• 한국지반공학회 2003년도 봄 학술발표회 논문집
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• pp.701-708
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• 2003

Recently, piezocone penetration test is frequently conformed in order to estimate the characteristics of soft ground with standard penetration test, generally used in the past. The soil characteristics, such as cone penetration resistance, friction resistence and excessive pore water pressure, can be evaluated continuously through the piezocone penetration test. In Incheon International Airport 2nd phase site preparation, standard penetration test and piezocone penetration test were used in order to increase the confidence for determination of soft ground depth. And the compressible layer was determined by the comparison between the preconsolidation pressure and the designed increase pressure. As the results, the relation between standard penetration test and piezocone penetration test shows q$_{c}$=(1.09~l.63)N at the soft ground, determined by 5/30 N value. And q$_{c}$=(1.21~l.98)N was shown at the point of compressible layer, evaluated by the preconsolidation pressure. These results were applied to determination for the depth of soft ground and to design the improvement for the soft clay.lay.

• 한국산업정보학회논문지
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• 제25권1호
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• pp.13-23
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• 2020

본 논문에서는 얼굴 인식 정확도에 미치는 영향을 최소화하면서 효율적으로 깊이 얼굴 영상을 압축하기 위한 양자화 변수 결정 방법을 제안한다. H.264/AVC의 양자화를 적용하여 깊이 얼굴 영상을 압축 할 때 얼굴 특징을 최대한 유지할 수 있도록 타원체 모델링의 예측 정확도와 각각의 양자화 단위 블록의 얼굴 인식에서의 중요도를 이용하여 양자화 인자를 차등적으로 부여한다. 모의실험 결과 제안된 방법을 통해 같은 압축율에서 얼굴 인식 성공률이 최대 6% 개선되었다.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1999년도 하계종합학술대회 논문집
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• pp.627-630
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• 1999

For depth extraction from the focus and recovery the shape, determination of criterion function for focus measure and size of the criterion window are very important. However, Texture, illumination, and magnification have an effect on focus measure. For that reason, depth map has a partial high and low peak. In this paper, we propose a depth extraction method from focused images using the error interpolation. This method is modified the error depth into mean value between two normal depth in order to improve the depth map.

• 한국의학물리학회지:의학물리
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• 제20권3호
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• pp.180-190
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• 2009

전립선암의 위치는 방사선 치료도중 변하는 경우가 많으며 이는 종양선량을 낮추고 정상조직선량이 높아질 수 있다. 이 논문의 목적은 방사선 치료중에 전립선암의 위치 및 깊이 변화를 자동적으로 감지하는 시스템을 개발하고 이를 적용해 환자의 국부에 조사되는 방사선량의 변화를 최소화 하는 데 있다. 이 연구에서는 10명의 환자로부터 38장의 영상자료를 통해 수행되었으며 전립선암에 부착된 금-표지자를 이용해 종양의 질량중심을 구하고 이를 기반으로 종양의 위치변화를 감지하였다. 전립선암의 평균적인 위치변화는 좌우와 위아래로 각각 0.9 mm와 2.3 mm이었으며 최고 위치변화는 각 각 3.3 mm와 7.2 mm였다. 일상적으로 전립선암의 양성자치료에 많이 사용되는 마주보는 두 개의 양성자빔(bilateral beam configuration) 조건에서 좌우의 위치변화는 깊이 변화를 의미하며 이는 약 0.7 mm에서 3.3 mm까지 변화하고 있음을 알 수 있었다. 실험결과 종양의 깊이 변화가 1 mm, 2 mm 그리고 3 mm 보다 많이 차이 나는 경우가 각각 42.1%, 26.3% 그리고 2.6%로 나타났다. 이러한 결과를 토대로 봤을 때 양성자치료에서 자동적으로 종양의 깊이 변화를 분석하는 것이 가능하다는 것을 알 수 있었으며 이를 이용한다면 종양선량을 높이고 정상조직선량을 낮추어 치료효과를 높일 수 있다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
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• pp.231-231
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• 2012

Correct determination of the interface locations is critical for the calibration of the depth scale and measurement of layer thickness in SIMS depth profiling analysis of multilayer films. However, the interface locations are difficult to determine due to the unwanted distortion from the real ones by the several effects due to sputtering with energetic ions. In this study, the layer thicknesses of Si/Ge and Si/Ti multilayer films were measured by SIMS depth profiling analysis using the oxygen and cesium primary ion beam. The interface locations in the multilayer films could be determined by two methods. The interfaces can be determined by the 50 at% definition where the atomic fractions of the constituent layer elements drop or rise to 50 at% at the interfaces. In this method, the raw depth profiles were converted to compositional depth profiles through the two-step conversion process using the alloy reference relative sensitivity factors (AR-RSF) determined by the alloy reference films with well-known compositions determined by Rutherford backscattering spectroscopy (RBS). The interface locations of the Si/Ge and Si/Ti multilayer films were also determined from the intensities of the interfacial composited ions (SiGe+, SiTi+). The determination of the interface locations from the composited ions was found to be difficult to apply due to the small intensity and the unclear variation at the interfaces.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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• pp.274-274
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• 2012

In-depth analysis by secondary ion mass spectrometry (SIMS) is very important for the development of electronic devices using multilayered structures, because the quantity and depth distribution of some elements are critical for the electronic properties. Correct determination of the interface locations is critical for the calibration of the depth scale in SIMS depth profiling analysis of multilayer films. However, the interface locations are distorted from real ones by the several effects due to sputtering with energetic ions. In this study, the determination of interface locations in SIMS depth profiling of multilayer films was investigated by Si/Ge and Ti/Si multilayer systems. The original SIMS depth profiles were converted into compositional depth profiles by the relative sensitivity factors (RSF) derived from the atomic compositions of Si-Ge and Si-Ti alloy reference films determined by Rutherford backscattering spectroscopy. The thicknesses of the Si/Ge and Ti/Si multilayer films measured by SIMS depth profiling with various impact energy ion beam were compared with those measured by TEM. There are two methods to determine the interface locations. The one is the feasibility of 50 atomic % definition in SIMS composition depth profiling. And another one is using a distribution of SiGe and SiTi dimer ions. This study showed that the layer thicknesses measured with low energy oxygen and Cs ion beam and, by extension, with method of 50 atomic % definition were well correlated with the real thicknesses determined by TEM.

• 대한기계학회논문집A
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• 제28권5호
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• pp.578-585
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• 2004

Hardness test is performed for determination of the other properties, such as strength, wear resistance and deformation resistance, as well as hardness itself. And it is performed for prediction of residual lifetime by analysis of hardness reduction or hardness ratio. However, hardness test has limitation that observation of residual indent is needed for determination of hardness value, and that is the reason for not to be widely used in industrial field. Therefore, in this study, we performed researches to obtain Brinell hardness value from quantitative numerical formula by analysing relationship between indentation depths from indentation load-depth curve and mechanical properties such as work hardening exponent, yield strength and elastic modulus.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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• pp.1092-1094
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• 2009

The purpose of the research was to figure out the optimal binocular parallax inducing the least 3D visual fatigue. Subjective 3D visual fatigue was measured while the revolution depth and the average depth of an object were manipulated. The optimal binocular parallax was figured out by using data fitting method.

• International Journal of Concrete Structures and Materials
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• 제18권3E호
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• pp.145-150
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• 2006

An experiment with the objective of providing guidelines for joint depth determination and timing of contraction joint sawcutting to avert uncontrolled cement concrete pavement cracking has been conducted. Theoretical analysis and laboratory tests were performed to help in understanding and analyzing the field observation. Using two-dimensional elastic fracture mechanics, the influence of several parameters on crack propagation was delineated by a parametric study, involving initial notch ratio, joint spacing, Young's modulus and thermal expansion coefficient of concrete, temperature gradient, and modulus of subgrade reaction. Bimaterials made of rock plus cement mortar and rock plus polymer mortar were applied to the concrete in a field test section, and they were subjected to fracture tests. These tests have shown that fracture mechanics is a powerful tool not only in judging the quality of the jointed cement concrete pavement but also in providing a criterion for crack propagation and delamination. Based on fracture mechanics, a method is proposed to determine the joint depth, sawcut timing, and spacing of the jointed cement concrete pavement. This method has successfully been applied to a test section in Seohaean expressway. This study also summarizes the research results obtained from a field test for jointed plain concrete pavement, which was also carried out on the Seohaean expressway.