• 산업경영시스템학회지
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• 제34권1호
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• pp.42-51
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• 2011

Poisson model and Gamma-Poisson model are popularly used to analyze statistical behavior from defective data. The methods are based on binary criteria, that is, good or failure. However, manufacturing industries prefer polytomous criteria for classifying manufactured products due to flexibility of marketing. In this paper, I introduce two multivariate Gamma-Poisson(MGP) models and estimation methods of the parameters in the models, which are able to handle polytomous data. The models and estimators are verified on defective pixels of LCD manufacturing. Experimental results show that both the independent MGP model and the multinomial MGP model have excellent performance in terms of mean absolute deviation and the choice of method depends on the purpose of use.

• 한국멀티미디어학회논문지
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• 제18권12호
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• pp.1519-1527
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• 2015

TFT-LCD automatic defect inspection system for detecting defects in place of the visual tester does pre-processing, candidate defect pixel detection, and recognition and classification through a blob analysis. An over-detection result of defects acts as an undue burden of blob analysis for recognition and classification. In this paper, we propose defect detection method based on the histogram distribution modeling of TFT-LCD image to minimize over-detection of candidate defective pixels. Primary defect candidate pixels are detected estimating the skewness of the luminance distribution histogram of the background pixels. Based on the detected defect pixels, the defective pixels other than noise pixels are detected using the distribution histogram model of the local area. Experimental results confirm that the proposed method shows an excellent defect detection result on the image containing the various types of defects and the reduction of the degree of over-detection as well.

• 대한의용생체공학회:의공학회지
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• 제30권6호
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• pp.476-481
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• 2009

The most troublesome artifacts in micro computed tomography (micro-CT) are ring artifacts. The ring artifacts are caused by non-uniform sensitivity and defective pixels of the x-ray detector. These ring artifacts seriously degrade the quality of CT images. In flat-panel detector based micro-CT systems, the ring artifacts are hardly removed by conventional correction methods of digital radiography, because very small difference of detector pixel signals may make severe ring artifacts. This paper presents a novel method to remove ring artifacts in flat-panel detector based micro-CT systems. First, the bad lines of a sinogram which are caused by defective pixels of the detector are identified, and then, they are corrected using a cubic spline interpolation technique. Finally, a ring artifacts free image is reconstructed from the corrected projections. We applied the method to various kinds of objects and found that the image qualities were much improved.

• 대한전자공학회논문지SD
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• 제44권4호
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• pp.55-62
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• 2007

본 논문에서는 이미지 센서에서 불량 화소를 자동으로 검출하기 위한 알고리듬을 제안하고, 그에 따른 하드웨어 구조를 제시하였다. 기존에 제안된 방법은 영상의 특징을 고려하지 않고 단순히 주위 화소들 값과의 차이가 일정 이상이면 불량 화소로 간주하였다. 그러나 이러한 방식은 영상에 따라서 불량 화소가 아닌 화소를 불량 화소로 간주하거나, 불량 화소를 정상 화소로 판단하는 일이 발생한다. 이러한 단점을 보완하기 위해 여러 프레임에 걸쳐 확인하는 방법도 제안되었으나, 불량 화소 검출시간이 오래 걸리는 단점이 있다. 이러한 기존 방식의 단점을 해결하기 위해, 제안된 불량 화소 검출 기법은 단일화면 내에서는 경계 영역을 고려하여 불량 화소를 검출하고, 여러 프레임에 걸친 확인 과정을 거치되, 화면 전환 여부를 확인하여 화면 전환이 일어날 때마다 검출된 화소의 불량 화소 여부를 판단하고 확인한다. 실험 결과, 단일 화면 내에서의 검출률은 기존 대비 6% 향상되었고, 100%의 불량화소 검출까지 걸리는 시간은 평균적으로 3배 이상 단축되었다. 본 논문에서 제안된 알고리듬은 하드웨어로 구현되었고, 하드웨어 구현 시 색 보간 블록에서 사용되는 경계 영역 표시자를 그대로 활용함으로써 0.25um 표준 셀 라이브러리를 이용하여 합성했을 때, 5.4K gate의 낮은 복잡도로 구현할 수 있었다.

• 정보저장시스템학회논문집
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• 제5권2호
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• pp.89-95
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• 2009

We setup the system to measure the noise characteristics of the 5M complementary metal-oxide semiconductor (CMOS) image sensor by generic measurement indicator of Standard mobile imaging architecture (SMIA) which is one of internal standard of mobile imaging architecture. To evaluate the effect of environment and setting parameters, such as temperature and integration time, we measure the variation of the dark signal, dynamic range and fixed pattern noise of image sensor. We also detect the number of defective pixels and cluster defects defined as adjacent single defect pixels at 5M CMOS image sensor. Then, we find the existence of some cluster defects in experiment, which are not expected in calculation.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2002년도 International Meeting on Information Display
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• pp.856-859
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• 2002

A system for high-resolution analysis of defective elementary cell (R, G or B) on Flat Panel Display (FPD) is described. Based on multiple acquisitions of low-resolution shifted images of the display, our system doesn't require a high-resolution sensor neither tedious alignment of the display, and will remain up to date even facing an important increase of the display dimensions. Our process, highly automated and thus flexible and robust, is expected to perform a full analysis in less than 60s. It is mainly intended for production tests and display classification by manufacturers.

• 대한디지털의료영상학회논문지
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• 제10권1호
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• pp.41-44
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• 2008

This paper will improve the quality of medical imaging to restore defective pixels on how to present the information you want to increase the efficiency, Using the filter is damaged pixel approximation of the same value to get value, but it is difficult to obtaion. How to get value for the restoration of the original imaged as a way to fill a sweater pattern of missing and how to restore the delta using the filter, compared to the extsting method of excellence.

• 전기전자학회논문지
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• 제27권3호
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• pp.345-349
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• 2023

본 논문은 영상장치를 이용한 차세대 스마트 LED 전광판의 불량픽셀 검출을 위한 딥러닝 구조 개발에 관한 연구를 제안한다. 이 연구에서는 영상장치를 활용하여 딥러닝을 통해 실외 LED 전광판의 결함을 자동으로 검출하는 기법을 제안한다. 이를 통해 LED 전광판의 효율적인 관리와 발생할 수 있는 다양한 오류와 문제를 해결하고자 한다. 연구 과정은 3단계를 거쳐 이루어진다. 첫 번째로, 평면화된 전광판 이미지 데이터를 calibration을 통해 배경을 완전히 제거하고 필요한 전처리 과정을 거쳐 학습 데이터셋을 생성한다. 두 번째로, 생성된 데이터셋은 객체 인식 네트워크를 학습을 시키는 데 활용된다. 네트워크는 Backbone과 Head로 구성된다. Backbone에서는 CSP-Darknet을 활용하여 특징 맵을 추출하고, Head에서는 추출된 Feature Map을 기반으로 물체를 검출한다. 이 과정에서 네트워크는 Confidence score와 IoU가 일치하도록 오차를 수정하며 지속적으로 학습된다. 세 번째에서는 생성된 모델을 활용하여 실제 실외 LED 전광판에서 불량픽셀을 자동으로 검출한다. 본 논문에서 제안하는 방법을 적용하여 LED 전광판의 불량픽셀 검출에 대한 공인 측정 실험 결과로는 실제 LED 전광판에서 불량픽셀을 100% 검출한 결과를 얻을 수 있었다. 이를 통해 LED 전광판의 불량 관리와 유지보수의 효율성이 향상되었음을 확인할 수 있다. 이러한 연구 결과는 LED 전광판 관리의 획기적인 개선을 이룰 것으로 기대된다.

• 대한원격탐사학회지
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• 제19권5호
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• pp.403-409
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• 2003

Since SPOT4 satellite contained VEGETATION 1 sensor launched, the noise in VEGETATION data was occasionally arisen a difficulty for the data traitement. Blind line noise types were studied in VEGETATION-l short wave infrared channel(SWIR). In order to provide a precis product, the procedure for removing this noise is strongly recommended. In the case that the blind values are clearly distinguished from contamination-free values a simple threshold method was applied, while a changeable threshold method was used for the blind value mixed with contamination-free values. New algorithm presented in this study is consists of two method for each type of SWIR blind. After removing blind line, there were again some residual pixels of blind, because the threshold is not determinated sufficiently low. Lower threshold could remove the blind line as well as the contamination-free pixels. Nevertheless, the results showed a good qualitative improvement as compared with other algorithm.

• 제어로봇시스템학회논문지
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• 제21권8호
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• pp.794-800
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• 2015

This paper describes the design for a defective product inspection device for the curved glass used in smart-phone. Cameras are used as inspection devices to find cracks in LCDs (Liquid Crystal Displays), PDPs (Plasma Display Panels), etc. The devices used to inspect the curved glass used in smart-phone consist of a camera, two back-light apparatus, an inspection apparatus main body, and an image processing program. Camera image calibration was performed to smooth an image taken with the camera, and as a result, the average error was less than 0.12 pixels. And the image of a smart-phone's curved glass taken with the camera was processed using the produced program. As a result, the program could correctly extract the cracks on the curved glass. Thus, it is thought that the designed inspection device can successful detect cracks in curved tempered glass.