• KSII Transactions on Internet and Information Systems (TIIS)
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• 제17권9호
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• pp.2590-2608
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• 2023

The high-altitude and mobility characteristics of unmanned aerial vehicles (UAVs) have made them a key element of new radio systems, particularly because they can exceed the limits of terrestrial networks. However, at high altitudes, UAVs can be significantly affected by intercell interference at a high line-of-sight probability. To mitigate this drawback, we propose an algorithm that selects the optimal beam to reduce interference and maximize transmission efficiency. The proposed algorithm comprises two steps: constructing a user-location-based fingerprint database according to the user types presented herein and cooperative beam selection. Simulations were conducted using cellular cooperative downlink systems for analyzing the performance of the proposed method, and the signal-to-interference-plus-noise cumulative distribution function and spectral efficiency cumulative distribution function were used as performance analysis indicators. Simulation results showed that the proposed algorithm could reduce the effect of interference and increase the performance of the desired signal. Moreover, the algorithm could efficiently reduce overheads and system cost by reducing the amount of resources required for information exchange.

• Applied Microscopy
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• 제48권4호
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• pp.122-125
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• 2018

The focused ion beam (FIB) method is widely used to prepare specimens for observation by transmission electron microscopy (TEM), which offers a wide variety of imaging and analytical techniques. TEM has played a significant role in material investigation. However, the FIB method induces amorphization due to bombardment with the high-energy gallium ($Ga^+$) ion beam. To solve this problem, electron beam induced deposition (EBID) is used to form a protective layer to prevent damage to the specimen surface. In this study, we introduce an optimized TEM specimen preparation procedure by comparing the EBID of carbon and tungsten as protective layers in FIB. The selection of appropriate EBID conditions for preparing specimens for TEM analysis is described in detail.