• 제목/요약/키워드: c-axis oriented film

검색결과 137건 처리시간 0.024초

분사열분해 CVD 법으로 증착된 YBCO 박막의 특성에 미치는 기판 온도의 영향 (The Effect of Substrate Temperature on Superconducting Properties of YBCO Films Prepared by Spray Pyrolysis Method using Metal Nitrate Precursors)

  • 김재근;홍석관;유석구;조한우;김병주;안지현;홍계원;이희균
    • Progress in Superconductivity
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    • 제9권1호
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    • pp.102-106
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    • 2007
  • YBCO films have been synthesized using a spray pyrolysis method. We used nitrates of Y, Ba, Cu as precursors. Deposition was made on $LaAlO_3$ (100) single crystal substrate by spraying the mist of aqueous precursor solution generated by a concentric nozzle. The distance between concentric nozzle and substrate was 15 cm. C-axis oriented films were obtained at deposition temperature of $740{\sim}800^{\circ}C$ and working pressure of 20 Torr. Oxygen partial pressure was 3 Torr and substrate was transported with the speed ranging from 0.23 cm/min to 0.7 cm/min by reel to reel. Scanning electron microscope (SEM) and X-ray diffraction (XRD) observation revealed that films are smooth and highly textured with (001) planes parallel to substrate. Highest critical current density (Jc) was $1.38\;MA/cm^2$ at 77K and self-field for the film with a thickness of $0.5\;{\mu}m$ prepared at a substrate temperature of $780^{\circ}C$ and $PO_2\;=3\;Torr$. The effect of temperature on the microstructure and YBCO phase formation will be discussed.

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Mechanical Behavior of Directionally Solicified (Y2O3)ZrO2/Al2O3 Eurtctic Fibers

  • Park, Deok-Yong;Yang, Jenn-Ming
    • 한국세라믹학회지
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    • 제41권1호
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    • pp.1-8
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    • 2004
  • The microstructural features and mechanical behavior of directionally solidified $(Y_2O_3)ZrO_2/Al_2O_3$ eutectic fibers after extended beat treatment in oxidizing environment were investigated. The fiber was grown continuously by an Edge-defined Film-fed Growth (EFG) technique. The microstructure was characterized using X-Ray Diffraction (XRD) and Scanning Electron Microscopy(SEM). The microstructure of the fiber in the as-fabricated state consists of highly oriented colonv and fine lamellar microstructure along the fiber axis. Tensile strength of the $(Y_2O_3)ZrO_2/Al_2O_3$ eutectic fiber remained unchanged with heat treatment at temperatures between $1200^{\circ}C$ and $1500^{\circ}C$ up to 300h. The weibulls modulus remained fairly constant after extended thermal exposure. The fracture toughness and crack propagation behavior were investigated. The fracture toughness ($K_{1C}$) of the $(Y_2O_3)ZrO_2/Al_2O_3$ eutectic fiber in the as-fabricated state were measured to be 3.6 ${\pm}$ 0.5 MPa${\cdot}m^{1/2}$ by an indentation technique and 2.2 ${\pm}$ 0.2 MPa${\cdot}m^{1/2}$ by assuming elliptical flaw of a semi-infinite solid, respectively. The $(Y_2O_3)ZrO_2/Al_2O_3$ eutectic fiber showed a radial (Palmqvist) crack type and exhibited an orthotropic crack growth behavior under 100 g load.

$CeO_2$ 완충층의 두께가 $Al_2O_3$ 기판 위에 성장된 $YBa_2Cu_3O_{7-{\delta}}$ 박막의 초전도 특성에 미치는 영향 (Effect of $CeO_2$ buffer layer thickness on superconducting properties of $YBa_2Cu_3O_{7-{\delta}}$ films grown on $Al_2O_3$ substrates)

  • 임해용;김인선;김동호;박용기;박종철
    • 센서학회지
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    • 제8권2호
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    • pp.195-201
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    • 1999
  • $Al_2O_3$ (알루미나 및 R-면 사파이어)기판 위에 c-축 $YBa_2Cu_3O_{7-{\delta}}$ (YBCO) 박막을 펄스레이저 증착법을 이용하여 성장하였다. 완충층으로 사용하기 위해 $Al_2O_3$ 기판 위에 증착한 $CeO_2$ 박막의 결정성은 기판온도에 많은 영향을 받았다. $CeO_2$ 박막은 $800^{\circ}C$의 기판온도에서 $\alpha$-축방향으로 잘 성장하였으며, $CeO_2$ 완충층의 두께에 따라 YBCO/$CeO_2/Al_2O_3$ 박막의 초전도 특성은 큰 변화를 나타내었다. 알루미나 기판 위에서 $CeO_2$ 완충층의 두께는 약 $1200\;{\AA}$이하, 사파이어 기판의 경우 $100{\sim}1000\;{\AA}$ 범위에서 YBCO 박막은 양호한 초전도 특성을 나타내었으나, 그 보다 두껍게 성장시킬 경우 초전도 특성이 급격하게 나빠졌다. 알루미나 기판 위에 성장된 YBCO 박막의 임계온도는 83 K였으며, R-면 사파이어 기판 위에 성장된 YBCO 박막의 임계온도는 ${\geq}89.5\;K$였고, 임계전류밀도는 77K에서 $3{\times}10^6\;A/cm^2$로 나타났다.

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고온 초전도 $\textrm{YBa}_{2}\textrm{Cu}_{3}\textrm{O}_{7-x}$ 계단형 모서리 접합의 이중접합 특성 (Characteristics of Double-junction of High-$\textrm{T}_{c}$ Superconducting $\textrm{YBa}_{2}\textrm{Cu}_{3}\textrm{O}_{7-x}$ Step-edge Junctions)

  • 황준식;성건용;강광용;윤순길;이광렬
    • 한국재료학회지
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    • 제9권1호
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    • pp.86-91
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    • 1999
  • (001) $\textrm{SrTiO}_3$(STO) 기판위에 고온초전도 $\textrm{YBa}_{2}\textrm{Cu}_{3}\textrm{O}_{7-x}$(YBCO)박막을 이용한 계단형 모서리 임계접합을 제조하였다. STO (100) 단결정 기판위에 계단형 모서리(step-edge)를 제작하기 위한 이온밀링 마스크로 plasma enhanced chemical vapor deposition방법으로 증착된 diamond-like carbon (DLC) 박막을 사용하였고, oxygen reactive ion etch 방법으로 건식식각하였다. 이렇게 제작된 계단형 모서리 기판위에 c-축 수직한 YBCO 박막과 STO박막을 pulsed laser deposition방법으로 에피텍셜하게 증착하였다. 계단의 상층과 하층에서 모두 임계가 형성되었으며 이 접합의 임계온도는 77 K 이상이었고 16K에서 $\textrm{I}_{c}\textrm{R}_{n}$products가 7.5mV, 77 K에서 0.3mV의 값을 나타내었다. 이들 전류-전압 특성은 two noisy resistively shunted Josephson junction 모델을 잘 만족하였다.

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RF 마그네트론 스퍼터링법으로 제작된 Ga-doped ZnO 박막의 공정압력에 따른 전기적, 광학적 특성 (Electrical and Optical Properties of Ga-doped ZnO Thin Films Deposited at Different Process Pressures by RF Magnetron Sputtering)

  • 정성진;김덕규;김홍배
    • 한국진공학회지
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    • 제21권1호
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    • pp.17-21
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    • 2012
  • 투명전도산화막인 Ga-도핑된 ZnO (GZO) 박막을 RF 마그네트론 스퍼터링 증착법을 이용하여 증착하고 전기적, 광학적 특성을 연구하였다. 증착변수로 공정압력에 변수를 주었으며 공정 압력 변화에 따라 전기적 특성과 광학적 특성이 달라짐을 확인할 수 있었다. 모든 박막은 공정압력에 상관없이 c-축(002) 방향성을 나타냈다. 증착된 GZO 박막의 전기저항성은 $8.68{\times}10^{-3}{\Omega}{\cdot}cm\sim2.18{\times}10^{-3}{\Omega}{\cdot}cm$이었고, 모든 가시광 영역에서 90% 이상의 평균 투과율을 보였다. 공정압력에 따라 상온에서 증착된 GZO 박막은 우수한 낮은 저항성과 높은 투과율을 나타내었고, 평판디스플레이와 태양전지의 투명전극으로 응용되기에 적합한 특성을 지닌 것을 확인 할 수 있었다.

Hydrogenated In-doped ZnO Thin Films for the New Anode Material of Organic Light Emitting Devices: Synthesis and Application Test

  • Park, Young-Ran;Nam, Eun-Kyoung;Boo, Jin-Hyo;Jung, Dong-Geun;Suh, Su-Jeong;Kim, Young-Sung
    • Bulletin of the Korean Chemical Society
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    • 제28권12호
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    • pp.2396-2400
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    • 2007
  • Transparent In-doped (1 at.%) zinc oxide (IZO) thin films are deposited by pulsed DC magnetron sputtering with H2 mixed Ar atmosphere on glass substrate without any heating process. Even at room temperature, highly c-axis oriented IZO thin films were grown in perpendicular to the substrate. The hydrogenated IZO (IZO:H) film isolated in H2 atmosphere for 30 min exhibited an average optical transmittance higher than 85% and low electrical resistivity of less than 2.7 × 10?3 Ω·cm. These values are comparable with those of commercially available ITO. Each of the IZO films was used as an anode contact to fabricate organic light-emitting diodes (OLEDs) and the device performances studied. At the current density of 1 × 103 A/m2, the OLEDs with IZO:H (H2) anode show excellent efficiency (11 V drive voltage) and a good brightness (8000 cd/m2) of the light emitted from the devices, which are as good as the control device built on a commercial ITO anode.

Effects of Lanthanides-Substitution on the Ferroelectric Properties of Bismuth Titanate Thin Films Prepared by MOCVD Process

  • Kim, Byong-Ho;Kang, Dong-Kyun
    • 한국세라믹학회지
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    • 제43권11호
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    • pp.688-692
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    • 2006
  • Ferroelectric lanthanides-substituted $Bi_4Ti_3O_{12}$ $(Bi_{4-x}Ln_xTi_3O_{12}, BLnT)$ thin films approximately 200 nm in thickness were deposited by metal organic chemical vapor deposition onto Pt(111)/Ti/SiO$_2$/Si(100) substrates. Many researchers reported that the lanthanides substitution for Bi in the pseudo-perovskite layer caused the distortion of TiO$_6$ octahedron in the a-b plane accompanied with a shift of the octahedron along the a-axis. In this study, the effect of lanthanides (Ln=Pr, Eu, Gd, Dy)-substitution and crystallization temperature on their ferroelectric properties of bismuth titanate $(Bi_4Ti_3O_{12}, BIT)$ thin films were investigated. As BLnT thin films were substituted to lanthanide elements (Pr, Eu, Gd, Dy) with a smaller ionic radius, the remnant polarization (2P$_r$) values had a tendency to increase and made an exception of the Eu-substituted case because $Bi_{4-x}Eu_xTi_3O_{12}$ (BET) thin films had the smaller grain sizes than the others. In this study, we confirmed that better ferroelectric properties can be expected for films composed of larger grains in bismuth layered peroskite materials. The crystallinity of the thin films was improved and the average grain size increased as the crystallization temperature,increased from 600 to 720$^{\circ}C$. Moreover, the BLnT thin film capacitor is characterized by well-saturated polarization-electric field (P-E) curves with an increase in annealing temperature. The BLnT thin films exhibited no significant degradation of switching charge for at least up to $1.0\times10^{11}$ switching cycles at a frequency of 1 MHz. From these results, we can suggest that the BLnT thin films are the suitable dielectric materials for ferroelectric random access memory applications.