• Title/Summary/Keyword: beam scanning

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AN EXPERIMENTAL STUDY OF THE EFFECTS OF ION BEAM HIKING ON CERAMO-METAL BONDING (이온선 혼합법이 도재와 금속의 결합에 미치는 영향에 관한 실험적 연구)

  • Hong, Joon-Pow;Woo, Yi-Hyung;Choi, Boo-Byung
    • The Journal of Korean Academy of Prosthodontics
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    • v.29 no.2
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    • pp.245-265
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    • 1991
  • The purpose of this study was to observe the changes of the elemental transmission and bond strength between the metal and porcelain according to various kinds of ion beam mixing method. ion beam mixing of $meta1/SiO_2$ (silica), $meta1/Al_2O_3$(alumina) interfaces causes reactions when the $Ar^+$ was implanted into bilayer thin films using a 100KeV accelerator which was designed and constructed for this study. A vacuum evaporator used in the $10^{-5}-10^{-6}$ Torr vacuum states for the evaporation. For this study, three kinds of porcelain metal selected, -precious, semiprecious, and non-precious. Silica and alumina were deposited to the metal by the vacuum evaporator, separately. One group was treated by two kinds of dose of the ion beam mixing $(1\times10^{16}ions/cm^2,\;5\times10^{15}ions/cm^2)$, and the other group was not mixed, and analyzed the effects of ion beam mixing. The analyses of bond strength, elemental transmissions were performed by the electron spectroscopy of chemical analysis (ESCA), light and scanning electron microscope, scratch test, and micro Vickers hardness tests. The finding led to the following conclusions. 1. In the scanning electron and light microscopic views, ion beam mixed specimens showed the ion beam mixed indentation. 2. In the micro Vickers hardness and scratch tests, ion beam mixed specimens showed higher strength than that of non mixed specimens, however, nonprecious metal showed a little change in the bond strength between mixed and non mixed specimens. 3. In the scratch test, ion beam mixed specimens showed higher shear strength than that of non treated specimens at the precious and semiprecious groups. 4. In the ESCA analysis, Au-O and Au-Si compounds were formed and transmission of the Au peak was found ion beam mixed $SiO_2/Au$ specimen, simultaneously, in the higher and lower bonded areas, and ion beam mixed $SiO_2/Ni-Cr$ specimen, oxygen, that was transmitted from $SiO_2\;to\;SiO_2/Ni-Cr$ interface combined with 12% of Ni at the interface.

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Scanning Confocal Microscope by direct drive of optical fiber (광섬유의 직접구동에 의한 공초점 현미경)

  • 박두성;류광현;노정은;김종배;권남익
    • Proceedings of the Optical Society of Korea Conference
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    • 2002.07a
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    • pp.80-81
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    • 2002
  • 편광 방향이 단일 모드의 유지되는 광섬유와 파장이 780nm인 반도체 레이저를 사용하여 간결한 구조의 beam scanning 타입의 공초점 현미경을 구성하였다. 공초점 현미경은 세포내의 생명 현상을 보다 잘 이해 할 수 있는 장비이기 때문에 기존의 현미경으로는 연구할 수 없던 생명현상을 연구할 수 있도록 여러 가지 강력한 연구수단을 제공하고 있다 살아 움직이는 생명체를 관찰할 수 있는 공초점 현미경에서 중요한 것은 속도와 투과 깊이이고, 장기의 표면을 관찰하기 위해서는 크기가 작아야 한다. (중략)

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A Study of World Map Building for Mobile Robot with Tri-Acral Ultrasonic Sensor System (세 개의 초음파 센서를 사용한 이동 로보트용 월드 맵 구성에 관한 연구)

  • 전형조;김병국
    • Journal of the Korean Institute of Telematics and Electronics B
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    • v.32B no.6
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    • pp.840-848
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    • 1995
  • A new tri-aural ultrasonic sensor system is suggested to build more accurate world maps for mobile robots with less scanning. In ordinary single sensor systems, the inherent beam-width of sonar transmitter causes ambiguity in sensing direction. Dual sensors may be used to discriminate plane and corner with several scans. However, the proposed method uses triple sensors, and achieves more accuracy with less scanning.

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The Depolarization Scanning Confocal Microscope (비편광 공초점 현미경)

  • 배한성;김종배;류광현;안미화;권남익
    • Proceedings of the Optical Society of Korea Conference
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    • 2003.07a
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    • pp.132-133
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    • 2003
  • 편광 방향이 단일 모드로 유지되는 광섬유와 파장이 780nm인 반도체 레이저를 사용하여 간결한 구조의 beam scanning 타입의 비편광 공초점 현미경을 구성하였다. 일반적인 공초점 현미경은 세포내의 생명 현상을 보다 잘 이해 할 수 있는 장비이기 때문에 기존의 현미경으로는 연구할 수 없던 생명현상을 연구할 수 있도록 여러 가지 강력한 연구수단을 제공하고 있다. 살아 움직이는 생명체를 관찰할 수 있는 공초점 현미경에서 중요한 것은 속도와 투과 깊이이고, 장기의 표면을 관찰하기 위해서는 크기가 작아야 한다. (중략)

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집속이온빔(Focused Ion Beam)을 이용한 3차원 나노가공

  • 박철우;이종항
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2004.05a
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    • pp.11-11
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    • 2004
  • 나노기술은 크게 2가지 접근방법을 가진다. 하나는 위에서 아래로(Top-Down)라는 관점으로 벌크물질로부터 이온빔 등을 이용해 이를 작게 잘라가는 방식이며, 다른 하나는 아래에서 위로(Bottom-Up) 방식으로 재질을 구성하는 분자를 재구성해 원하는 물성 및 특성을 가지도록 만드는 방법이다. 이 두 가지 접근 방법은 원하는 결과를 얻기 위해 상호 보완적으로 사용되기도 한다. Top-Down방식의 대표적인 기기로는 접속이온빔 장치(FIB, Focused Ion Beam)를 등 수 있으며, Bottom-Up방식의 대표적인 기기로는 SPM(Scanning Probe Microscope)을 들 수 있다.(중략)

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Four-beam Interference Optical System for Laser Micro- structuring Using Picosecond Laser

  • Noh, Ji-Whan;Lee, Jae-Hoon;Shin, Dong-Sig;Sohn, Hyon-Kee;Suh, Jeong;Oh, Jeong-Seok
    • Journal of the Optical Society of Korea
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    • v.13 no.1
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    • pp.75-79
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    • 2009
  • A four beam interference optical system for laser micro structuring using a pulse laser was demonstrated. The four beam interference optical system using a pulse laser(picosecond laser) can fabricate micro structure on mold material(NAK80) directly. Micro structure on the polymer can be reproduced economically by injection molding of the micro structure on the mold material. The four beam interference optical system was composed by the DOE(Diffractive Optical Element) and two lenses. The laser intensity distribution of four beam interference was explained by an interference optics point of view and by the image optics point of view. We revealed that both views showed the same result. The laser power distribution of a $1{\mu}m$ peak pattern was made by the four beam interference optical system and measured by the objective lens and CCD. A $1{\mu}m$ pitch dot pattern on the mold material was fabricated and measured by SEM(Scanning Electron Microscopy).

Effect of $Ga^+$ Ion Beam Irradiation On the Wet Etching Characteristic of Self-Assembled Monolayer ($Ga^+$ 이온 빔 조사량에 따른 자기 조립 단분자막의 습식에칭 특성)

  • Noh Dong-Sun;Kim Dea-Eun
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.10a
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    • pp.326-329
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    • 2005
  • As a flexible method to fabricate sub-micrometer patterns, Focused Ion Beam (FIB) instrument and Self-Assembled Monolayer (SAM) resist are introduced in this work. FIB instrument is known to be a very precise processing machine that is able to fabricate micro-scale structures or patterns, and SAM is known as a good etch resistance resist material. If SAM is applied as a resist in FIB processing fur fabricating nano-scale patterns, there will be much benefit. For instance, low energy ion beam is only needed for machining SAM material selectively, since ultra thin SAM is very sensitive to $Ga^+$ ion beam irradiation. Also, minimized beam spot radius (sub-tens nanometer) can be applied to FIB processing. With the ultimate goal of optimizing nano-scale pattern fabrication process, interaction between SAM coated specimen and $Ga^+$ ion dose during FIB processing was observed. From the experimental results, adequate ion dose for machining SAM material was identified.

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Measurement of residual stress of steel filaments by using focused ion beam and digital image correlation (집속 이온빔과 디지털 화상 관련법를 이용한 고 탄소 미세 강선의 잔류 응력 측정)

  • Yang, Y.S.;Bae, J.G.;Kang, K.J.;Park, C.G.
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 2007.05a
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    • pp.241-245
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    • 2007
  • The residual stress in axial stress in the axial direction of the steel filaments has been measured by using a method based on the combination of the focused ion beam (FIB) and high resolution strain mapping program (VIC-2D). That is, the residual stress was calculated from the measured displacement field before and after the introduction of a slot along the steel filaments. The displacement was obtained by the digital correlation analysis of high-resolution scanning electron micrographs, while the slot was introduced by FIB milling with low energy beam. The present measurement revealed that the residual stress within 8% of the magnitude was persistent in the steel filaments fabricated.

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A Study on the Interlaminar Fracture Toughness of Glass Fiber Reinforced Plastic Comosites (GFRP 복합재료의 층간파괴인성치에 관한 연구)

  • 박기호
    • Journal of the Korean Society of Fisheries and Ocean Technology
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    • v.35 no.4
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    • pp.410-420
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    • 1999
  • The value of the mode I interlamina fracture toughness, GIC, is calculated by experimental compliance method, modified compliance method and beam theory. The value of the mode II interlamina fracture toughness, GIC, is evaluated by beam method, theory beam theory and compliance method. This paper describes the effect of load pint displacement rate and speicimen geometries for mode I and II interlaminar fracture toughness of glass fiber reinforced plastic composites by using double cantilever beam (DCB) and end notched flexure (ENF) specimen. For the load point displacement rate of increases whereas the value of 2,6 and 10 mm/min the value of GIC decrease as load point displacement rate increases whereas the value of GIC is found to be no significant effect. The value of GIC decreases as initial crack length increases. The fractured surface of the DCB and ENF samples are examined by scanning electron microscopy (SEM).

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Manufacture of an Ultra-Sharp Tungsten Electrode for Field-Emission Electron Beam and Its Beam Characteristics (멀티채널 방식에 의한 초미세 바늘 전극의 제작 및 빔 특성)

  • 임연찬;현정우;김성수;박철우;이종항;강승언
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
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    • 2004.04a
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    • pp.508-512
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    • 2004
  • An ultra-sharp tungsten electrode for field emission was manufactured by using an electrochemical etching method, and its beam characteristics were investigated. KOH and NaOH were the electrolytes used in this research, and the taper length of the tip varied form 150 $\mu\textrm{m}$ to 250 $\mu\textrm{m}$ according to the applied voltage and the concentration of the electrolyte. The electron-beam stability was measured to be within 5% for a total emission current of 5 ${\mu}\textrm{A}$ during 4 hours of operation, and the Ignition voltages were found to be ∼300 V. The tip radius was experimentally found to be 250${\AA}$ from a linear fitting of Fowler-Nordheim plots, which was in remarkably good agreement with that of the image size from scanning ion-microscopy.

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