• 제목/요약/키워드: automatic optical inspection

검색결과 56건 처리시간 0.026초

광필터의 스펙트럼 검사시스템 개발 (A New System Development for the Spectrum Inspection of Optical Filters)

  • 김승철;김경범
    • 한국정밀공학회지
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    • 제23권2호
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    • pp.57-64
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    • 2006
  • Optical filters in WDM are passive communication components used in case of transmitting and reflecting lights with specific wavelengths. In this paper, a novel mechanism for the automatic and optical alignment has been presented. It includes minimum axes not to be coupled each other. The automatic spectrum inspection system has been developed to improve the alignment time of reference optical ray, spectrum inspection time and inspection quality, simultaneously. It has been confirmed that the proposed spectrum inspection system is faster, more precise and more reliable than those based on the conventional handwork.

패턴이 있는 TFT-LCD 패널의 결함검사를 위하여 근접패턴비교와 경계확장 알고리즘을 이용한 자동광학검사기(AOI) 개발 (Development of AOI(Automatic Optical Inspection) System for Defect Inspection of Patterned TFT-LCD Panels Using Adjacent Pattern Comparison and Border Expansion Algorithms)

  • 강성범;이명선;박희재
    • 제어로봇시스템학회논문지
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    • 제14권5호
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    • pp.444-452
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    • 2008
  • This paper presents an overall image processing approach of defect inspection of patterned TFT-LCD panels for the real manufacturing process. A prototype of AOI(Automatic Optical Inspection) system which is composed of air floating stage and multi line scan cameras is developed. Adjacent pattern comparison algorithm is enhanced and used for pattern elimination to extract defects in the patterned image of TFT-LCD panels. New region merging algorithm which is based on border expansion is proposed to identify defects from the pattern eliminated defect image. Experimental results show that a developed AOI system has acceptable performance and the proposed algorithm reduces environmental effects and processing time effectively for applying to the real manufacturing process.

솔더 페이스트 자동검사를 위한 2-D/3-D 복합 알고리즘 (2-D/3-D Combined Algorithm for Automatic Solder Paste Inspection)

  • 조상현;이상윤;임쌍근;최흥문
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2002년도 춘계학술대회 논문집
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    • pp.173-176
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    • 2002
  • In this paper, we present the combined 2-D and 3-D algorithms for automatic solder paste inspection. For automatic inspection, optical system for the combined inspection and driving unit is made. One-pass run length algorithm that has fast and efficient memory space is applied to the input image fur extracting solder paste patterns. The path of probe movement is then calculated for an automatic inspection. For a fast 3-D inspection, the phase shift algorithm based on Moire interferometry is also used. In addition, algorithms used in this paper are coded by $MMX^{TM}$. A probe system is manufactured to simultaneously inspect 2-D and 3-D for 10mm$\times$10mm field of view, with resolutions of 10 $\mu\textrm{m}$for both x, y axis and 17 $\mu\textrm{m}$for z axis, and then, experiments on several PCBs are conducted. The processing times of 2-D and 3-D, excluding an image capturing, is 0.039 sec and 0.047 sec, respectively. The credible result with $\pm$ 1$\mu\textrm{m}$uncertainty can be also achieved.

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Automated Optical Inspection 시스템의 이미지 획득과정을 전산모사하는 Vision Inspector 개발 (Development of Vision Inspector for Simulating Image Acquisition in Automated Optical Inspection System)

  • 정상철;고낙훈;김대찬;서승원;최태일;이승걸
    • 한국광학회:학술대회논문집
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    • 한국광학회 2008년도 하계학술발표회 논문집
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    • pp.403-404
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    • 2008
  • This report described the development of Vision Inspector program which can simulate numerically the image acquisition process of Machine Vision System for automatic optical inspection of any products. The program consists of an illuminator, a product to be inspected, and a camera with image sensor, and the final image obtained by ray tracing.

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SMT 검사기의 경로계획을 위한 클러스터링 알고리즘 (A Clustering Algorithm for Path Planning of SMT Inspection Machines)

  • 김화중;박태형
    • 한국지능시스템학회논문지
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    • 제13권4호
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    • pp.480-485
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    • 2003
  • 인쇄회로기판을 조립하는 SMT (surface mount technology) 라인의 AOI (automatic optical inspection) 형 검사기를 대상으로, 검사시간 단축을 위한 경로계획 방법을 제안한다. 기판에 존재하는 검사 윈도우들은 카메라의 FOV (field-of-view) 크기를 고려하여 클러스터링 되어야 하며, 전체 검사시간의 단축을 위하여 클러스터의 수를 최소화하는 것이 바람직하다. 주어진 기판에 대한 클러스터의 수를 최소화하기 위한 유전자 알고리즘을 새로이 제안하며, 이를 사용한 효과적 경로계획 방법을 제시한다. 상용 검사기를 대강으로 시뮬레이션을 수행하며, 비교 평가를 통하여 제안된 방법의 유용성을 검증한다.

광섬유 단심 연결소자의 치수정밀도 자동검사 (Automatic Inspection of Geometric Accuracy of Optical Fiber Single Ferrules)

  • 김기홍;김승우;임쌍근
    • 한국정밀공학회지
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    • 제17권10호
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    • pp.63-68
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    • 2000
  • We present an automatic inspection system which been developed to evaluate the geometric tolerances of the optical fiber connectors with an dimensional accuracy of$\pm0.1\mnm$. The main part of the inspection system comprises a series of machine vision and laser scanning probes to measure the internal and external circle diameters along with concentricity by making the most of advanced edge detection algorithms. Actual experimental results obtained through various repeatability tests demonstrate that the system well satisfies the required industrial demands for in-situ inspection of optical fiber connections in real manufacturing environment.

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자동 표면 결함검사 시스템에서 Retro 광학계를 이용한 3D 깊이정보 측정방법 (Linear System Depth Detection using Retro Reflector for Automatic Vision Inspection System)

  • 주영복
    • 반도체디스플레이기술학회지
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    • 제21권4호
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    • pp.77-80
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    • 2022
  • Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. It has been populated because of the accuracy and consistency in terms of QC (Quality Control) of inspection processes. Also, it is important to predict the performance of an AVI to meet customer's specification in advance. AVI are usually suffered from false negative and positives. It can be overcome by providing extra information such as 3D depth information. Stereo vision processing has been popular for depth extraction of the 3D images from 2D images. However, stereo vision methods usually take long time to process. In this paper, retro optical system using reflectors is proposed and experimented to overcome the problem. The optical system extracts the depth without special SW processes. The vision sensor and optical components such as illumination and depth detecting module are integrated as a unit. The depth information can be extracted on real-time basis and utilized and can improve the performance of an AVI system.

광학축 간격의 스텝크기 설정을 통한 오토포커싱 방법 (An Automatic Focusing Method Using Establishment of Step Size from Optical Axis Interval)

  • 김경범;문순환
    • 반도체디스플레이기술학회지
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    • 제14권1호
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    • pp.7-11
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    • 2015
  • In this paper, an automatic focusing method has been proposed for speedy and reliable measurement and inspection in industry. It is very difficult to determine focusing step size and moving direction in one camera autofocusing. The proposed method can improve speed and accuracy of focusing by using the optical axis interval of two cameras, which is automatically set up as focusing step size. Also, it can determine moving direction from focus value comparisons of two cameras, and then solve ambiguity of one camera focusing. Its performance is verified by experiments. It is expected that it can apply to optical system for measurement and inspection in industry fields.

다중패턴 홀로그램을 위한 자동광학검사 시스템 (Automatic Optical Inspection System for Holograms with Multiple Patterns)

  • 권혁중;박태형
    • 제어로봇시스템학회논문지
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    • 제15권5호
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    • pp.548-554
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    • 2009
  • We propose an automatic inspection system for hologram with multiple patterns. The system hardware consists of illuminations, camera, and vision processor. Multiple illuminations using LEDs are arranged in different directions to acquire each image of patterns. The system software consists of pre-processing, pattern generation, and pattern matching. The acquired images of input hologram are compared with their reference patterns by developed matching algorithm. To compensate for the positioning error of input hologram, reference patterns of hologram for different position should be generated in on-line. We apply a frequency transformation based CGH(computer-generated hologram) method to generate reference images. For the fast pattern matching, we also apply the matching method in the frequency domain. Experimental results for hologram of Korean currency are then presented to verify the usefulness of proposed system.