• Title/Summary/Keyword: automatic optical inspection

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A New System Development for the Spectrum Inspection of Optical Filters (광필터의 스펙트럼 검사시스템 개발)

  • Kim, Seung-Chul;Kim, Gyung-Bum
    • Journal of the Korean Society for Precision Engineering
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    • v.23 no.2 s.179
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    • pp.57-64
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    • 2006
  • Optical filters in WDM are passive communication components used in case of transmitting and reflecting lights with specific wavelengths. In this paper, a novel mechanism for the automatic and optical alignment has been presented. It includes minimum axes not to be coupled each other. The automatic spectrum inspection system has been developed to improve the alignment time of reference optical ray, spectrum inspection time and inspection quality, simultaneously. It has been confirmed that the proposed spectrum inspection system is faster, more precise and more reliable than those based on the conventional handwork.

Development of AOI(Automatic Optical Inspection) System for Defect Inspection of Patterned TFT-LCD Panels Using Adjacent Pattern Comparison and Border Expansion Algorithms (패턴이 있는 TFT-LCD 패널의 결함검사를 위하여 근접패턴비교와 경계확장 알고리즘을 이용한 자동광학검사기(AOI) 개발)

  • Kang, Sung-Bum;Lee, Myung-Sun;Pahk, Heui-Jae
    • Journal of Institute of Control, Robotics and Systems
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    • v.14 no.5
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    • pp.444-452
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    • 2008
  • This paper presents an overall image processing approach of defect inspection of patterned TFT-LCD panels for the real manufacturing process. A prototype of AOI(Automatic Optical Inspection) system which is composed of air floating stage and multi line scan cameras is developed. Adjacent pattern comparison algorithm is enhanced and used for pattern elimination to extract defects in the patterned image of TFT-LCD panels. New region merging algorithm which is based on border expansion is proposed to identify defects from the pattern eliminated defect image. Experimental results show that a developed AOI system has acceptable performance and the proposed algorithm reduces environmental effects and processing time effectively for applying to the real manufacturing process.

2-D/3-D Combined Algorithm for Automatic Solder Paste Inspection (솔더 페이스트 자동검사를 위한 2-D/3-D 복합 알고리즘)

  • 조상현;이상윤;임쌍근;최흥문
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.05a
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    • pp.173-176
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    • 2002
  • In this paper, we present the combined 2-D and 3-D algorithms for automatic solder paste inspection. For automatic inspection, optical system for the combined inspection and driving unit is made. One-pass run length algorithm that has fast and efficient memory space is applied to the input image fur extracting solder paste patterns. The path of probe movement is then calculated for an automatic inspection. For a fast 3-D inspection, the phase shift algorithm based on Moire interferometry is also used. In addition, algorithms used in this paper are coded by $MMX^{TM}$. A probe system is manufactured to simultaneously inspect 2-D and 3-D for 10mm$\times$10mm field of view, with resolutions of 10 $\mu\textrm{m}$for both x, y axis and 17 $\mu\textrm{m}$for z axis, and then, experiments on several PCBs are conducted. The processing times of 2-D and 3-D, excluding an image capturing, is 0.039 sec and 0.047 sec, respectively. The credible result with $\pm$ 1$\mu\textrm{m}$uncertainty can be also achieved.

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Development of Vision Inspector for Simulating Image Acquisition in Automated Optical Inspection System (Automated Optical Inspection 시스템의 이미지 획득과정을 전산모사하는 Vision Inspector 개발)

  • Jeong, Sang-Cheol;Go, Nak-Hun;Kim, Dae-Chan;Seo, Seung-Won;Choe, Tae-Il;Lee, Seung-Geol
    • Proceedings of the Optical Society of Korea Conference
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    • 2008.07a
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    • pp.403-404
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    • 2008
  • This report described the development of Vision Inspector program which can simulate numerically the image acquisition process of Machine Vision System for automatic optical inspection of any products. The program consists of an illuminator, a product to be inspected, and a camera with image sensor, and the final image obtained by ray tracing.

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A Clustering Algorithm for Path Planning of SMT Inspection Machines (SMT 검사기의 경로계획을 위한 클러스터링 알고리즘)

  • Kim, Hwa-Jung;Park, Tae-Hyoung
    • Journal of the Korean Institute of Intelligent Systems
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    • v.13 no.4
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    • pp.480-485
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    • 2003
  • We Propose a Path planning method to reduce the Inspection time of AOI (automatic optical inspection) machines in SMT (surface mount technology) in-line system. Inspection windows of board should be clustered to consider the FOV (field-of-view) of camera. The number of clusters is desirable to be minimized in order to reduce the overall inspection time. We newly propose a genetic algorithm to minimize the number of clusters for a given board. Comparative simulation results are presented to verify the usefulness of proposed algorithm.

Automatic Inspection of Geometric Accuracy of Optical Fiber Single Ferrules (광섬유 단심 연결소자의 치수정밀도 자동검사)

  • Kim, Gee-Hong;Kim, Seung-Woo;Lim, Ssang-Gun
    • Journal of the Korean Society for Precision Engineering
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    • v.17 no.10
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    • pp.63-68
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    • 2000
  • We present an automatic inspection system which been developed to evaluate the geometric tolerances of the optical fiber connectors with an dimensional accuracy of$\pm0.1\mnm$. The main part of the inspection system comprises a series of machine vision and laser scanning probes to measure the internal and external circle diameters along with concentricity by making the most of advanced edge detection algorithms. Actual experimental results obtained through various repeatability tests demonstrate that the system well satisfies the required industrial demands for in-situ inspection of optical fiber connections in real manufacturing environment.

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Linear System Depth Detection using Retro Reflector for Automatic Vision Inspection System (자동 표면 결함검사 시스템에서 Retro 광학계를 이용한 3D 깊이정보 측정방법)

  • Joo, Young Bok
    • Journal of the Semiconductor & Display Technology
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    • v.21 no.4
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    • pp.77-80
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    • 2022
  • Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. It has been populated because of the accuracy and consistency in terms of QC (Quality Control) of inspection processes. Also, it is important to predict the performance of an AVI to meet customer's specification in advance. AVI are usually suffered from false negative and positives. It can be overcome by providing extra information such as 3D depth information. Stereo vision processing has been popular for depth extraction of the 3D images from 2D images. However, stereo vision methods usually take long time to process. In this paper, retro optical system using reflectors is proposed and experimented to overcome the problem. The optical system extracts the depth without special SW processes. The vision sensor and optical components such as illumination and depth detecting module are integrated as a unit. The depth information can be extracted on real-time basis and utilized and can improve the performance of an AVI system.

An Automatic Focusing Method Using Establishment of Step Size from Optical Axis Interval (광학축 간격의 스텝크기 설정을 통한 오토포커싱 방법)

  • Kim, Gyung Bum;Moon, Soon Hwan
    • Journal of the Semiconductor & Display Technology
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    • v.14 no.1
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    • pp.7-11
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    • 2015
  • In this paper, an automatic focusing method has been proposed for speedy and reliable measurement and inspection in industry. It is very difficult to determine focusing step size and moving direction in one camera autofocusing. The proposed method can improve speed and accuracy of focusing by using the optical axis interval of two cameras, which is automatically set up as focusing step size. Also, it can determine moving direction from focus value comparisons of two cameras, and then solve ambiguity of one camera focusing. Its performance is verified by experiments. It is expected that it can apply to optical system for measurement and inspection in industry fields.

Automatic Optical Inspection System for Holograms with Multiple Patterns (다중패턴 홀로그램을 위한 자동광학검사 시스템)

  • Kwon, Hyuk-Joong;Park, Tae-Hyoung
    • Journal of Institute of Control, Robotics and Systems
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    • v.15 no.5
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    • pp.548-554
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    • 2009
  • We propose an automatic inspection system for hologram with multiple patterns. The system hardware consists of illuminations, camera, and vision processor. Multiple illuminations using LEDs are arranged in different directions to acquire each image of patterns. The system software consists of pre-processing, pattern generation, and pattern matching. The acquired images of input hologram are compared with their reference patterns by developed matching algorithm. To compensate for the positioning error of input hologram, reference patterns of hologram for different position should be generated in on-line. We apply a frequency transformation based CGH(computer-generated hologram) method to generate reference images. For the fast pattern matching, we also apply the matching method in the frequency domain. Experimental results for hologram of Korean currency are then presented to verify the usefulness of proposed system.