• 한국표면공학회지
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• 제28권1호
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• pp.23-33
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• 1995

AISI 304 stainless steel has high resistance to corrosion due to the presence of a self-healing chromium oxide film on the surface, which also accounts for the difficulty in plating. Surface cleaning of this alloy is of fundamental importance in gold plating since its effectiveness puts an upper limit on the quality of the final coating. The cleaning of AISI 304 stainless steel was investigated with elimination of artificial passive oxide film and degreasing of remaining buffing wax as stearic acid. The familiar cleaning methods i.e. ultrasonic cleaning, electro-cleaning and activation treatment were fabricated in this study. Activation treatment showed best cleaning efficiency for elimination of passive oxide film among these methods, which was also confirmed by AES (Auger electron spectrometer) analysis. However, the best condition of cleaning was obtained by combining these methods. Electrocleaning time, for degreasing the stearic acid layer, was decreased with increasing amount of added KCN.

• 태양에너지
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• 제9권2호
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• pp.69-77
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• 1989

The thermal degradation of electroplated black chrome coating on Ni substrates has been investigated by using Auger electron spectroscopy technique. The sample was prepared by electroplating at $20^{\circ}C$ for 20 seconds with the current density at $0.4A/cm^2$. Its surface oxidation process was investigated with 1 hour annealed sample for a temperature range of $300-550^{\circ}C$. While its optical solar absorption was dominated by fine metallic Cr particles, thermal degradation was occurred primarily by oxidation of metallic Cr particles as increasing the annealing temperature.

• 한국세라믹학회지
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• 제30권1호
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• pp.17-24
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• 1993

Sol-gel spin-coating technique was used to produce Nb2O5 thin films on silicon substrates from Nb(OC2H5)5 precursor. The films were heat-treated at temperatures between $600^{\circ}C$ and 100$0^{\circ}C$ in oxygen atmosphere and their crystalline phases, chemical states, and dielectric characteristics were investigated by X-ray diffractometry (XRD), Auger electron spectroscopy (AES), and C-V measurements, respectively. After 1 hour heat-treatment at 80$0^{\circ}C$, T-type Nb2O5 was formed, and its chemical composition was homogeneous with no appreciable SiO2 oxide at interfaces between the films and substrates. The films heat-treated at temperatures between $600^{\circ}C$ and 80$0^{\circ}C$ exhibit dielectric constant of less than 20 while the films heat treated at 100$0^{\circ}C$ show dielectric constant of 28.

• 한국전기전자재료학회논문지
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• 제20권3호
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• pp.268-272
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• 2007

A fully integrable InP/InGaAs HPT with an ITO emitter contact was first fabricated by employing a $SiO_2$ passivation layer. The electrical and the optical characteristics of the HPT with a passivation layer were measured and compared with those of the HPT without a passivation layer. The only noticeable difference was the increased emitter series resistance of the HPT with a passivation layer. AES analysis was performed to explain the reason of the increased emitter series resistance. Results show that PECVD $SiO_2$ deposition and annealing processes cause the diffusion of oxygen to the interface and the depletion of tin at the interface, which may be responsible for the increase of the series resistance.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2006년도 하계종합학술대회
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• pp.565-566
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• 2006

In this work, We study electrical characterization of $HfO_2$/Hf/Si films grown by Atomic Layer Deposition(ALD). Through AES(Auger Electron Spectroscopy), capacitance-voltage(C-V) and current-voltage(I-V) analysis, the role of Hf layer for the better $HfO_2$/Si interface property was investigated. We found that Hf metal layer in our structure effectively suppressed the generation of interfacial $SiO_2$ layer between $HfO_2$ film and silicon substrate.

• 한국전기전자재료학회논문지
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• 제15권5호
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• pp.455-459
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• 2002

I have investigated the effects of annealing on a polymeric $\alpha-C_3N_{4.2}$ at high pressure and temperature in the presence of seeds of crystalline carbon nitride films prepared by a high voltage discharge plasma. The samples were evaluated by x-ray photoelectron spectroscopy (XPS), infrared spectroscopy, Auger electron spectroscopy and x-ray diffraction(XRD). Notably, XPS studies of the film composition before and after annealing demonstrate that the nitrogen composition in $\alpha-C_3N_{4.2}$ material initially containing more than 58% nitrogen decreases during the annealing process and reaches a common, stable composition of ~43%. XPS analysis also shows that the nitrogen composition in the annealed films without polymeric $\alpha-C_3N_{4.2}$ was reduced from 35% to 17%. Furthermore the concentration of the sp$^3$bonded phase increased with the increment of the annealing temperature.

• 한국진공학회지
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• 제7권1호
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• pp.51-58
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• 1998

Traveling wave reactor atomic layer epitaxy(ALE) 방법으로 ZnS와 ZnS:Tb박막을 성장하고 성장 조건에 따른 박막 특성을 연구하였다. ZnS박막의 precursor로는 ZnCl2와 H2S를 이용하였으며, 기판 온도 400-$500^{\circ}C$범위에서 성장하였다. 본 연구 논문에서는 성장온 도에 따른 ZnS박막의 결정성의 변화와 precursor에 의한 Cl유입량의 변화를 살펴보고 투과 전자현미경과 주사형 전자현미경으로 ZnS박막의 표면 형상과 미세구조를 관찰하였다. 연구 결과에 의하면 ALE에 의하여 매우 균일하고 hexagonal 2H구조의 결정성이 향상되었다. 성 장온도 $400^{\circ}C$에서 약 9at.%, $500^{\circ}C$에서 약 1at.%의 Cl이 유입되었으며, 박막 내에 유입된 Cl 은 표면으로의 segregation현상을 나타내었다. 또한 electroluminescent 소자의 녹색 형광재 료인 ZnS:Tb을 Tb precursor로 tris(2,2,6,6-tetramethyl 3,5-heptandionato)terbium을 이용하 여 성장하고 박막 결정성과 박막 내 불순물이 유입되는 경향 등을 연구하였다. Auger electron spectroscopy분석 결과에 의하면 0.5at.%의 Tb이 표함된 AnS:Tb박막은 C은 거의 포함하고 있지 않았으나 O은 약 1at.%정도 포함되어 있었다. ZnS:Tb박막은 Tb과 소량의 O 을 함유하고 있음에도 불구하고 결정성은 우수한 hexagonal구조를 유지하고 있었다.

• 한국전기전자재료학회논문지
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• 제23권10호
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• pp.747-751
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• 2010

In the study, the characteristics of the etched Zinc oxide (ZnO) thin films surface, the etch rate of ZnO thin film in $Cl_2/BCl_3/Ar$ plasma was investigated. The maximum ZnO etch rate of 53 nm/min was obtained for $Cl_2/BCl_3/Ar$=3:16:4 sccm gas mixture. According to the x-ray diffraction (XRD) and atomic force microscopy (AFM), the etched ZnO thin film was investigated to the chemical reaction of the ZnO surface in $Cl_2/BCl_3/Ar$ plasma. The field emission auger electron spectroscopy (FE-AES) analysis showed an elemental analysis from the etched surfaces. According to the etching time, the ZnO thin film of etched was obtained to The AES depth-profile analysis. We used to atomic force microscopy to determine the roughness of the surface. So, the root mean square of ZnO thin film was 17.02 in $Cl_2/BCl_3/Ar$ plasma. Based on these data, the ion-assisted chemical reaction was proposed as the main etch mechanism for the plasmas.

• 한국진공학회:학술대회논문집
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• 한국진공학회 1999년도 제17회 학술발표회 논문개요집
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• pp.220-220
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• 1999

In plasma source ion implantation, the target is immersed in the plasma and repetitively biased by negative high voltage pulses to implant the extracted ions from plasma into the surface of the target material. In this way, the problems of line-of-sight implantation in ion-beam ion implantation technique can be effectively solved. In addition, the high dose rate and simplicity of the equipment enable the ion implantation a commercially affordable process. In this work, plasma source ion implantation technique was used to improve the wear resistance of Co-cemented WC. which has been extensively used for high speed tools. Nitrogen and carbon ions were implanted using the pulse bias of -602kV, 25 sec and at various implantation conditions. The implanted samples were examined using scanning Auger electron spectroscopy and XPS to investigate the depth distributions of implanted ions and to reveal the chemical state change due to the ion implantation. The implanted ions were found to have penetrated to the depth of 3000$\AA$. The wear resistance of the implanted samples was measured using pin-on-disc wear tester and the wear tracks were examined with alpha-step profilometer.

• 한국산업정보학회:학술대회논문집
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• 한국산업정보학회 2001년도 춘계학술대회논문집:21세기 신지식정보의 창출
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• pp.224-231
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• 2001

2.45 GHz 마이크로웨이브를 사용하는 전자회전공명 플라즈마를 이용하여 화학적 기상증착(electron cyclotron resonance plasma enhanced chemical vapor deposition; ECR-PECVD) 방법으로 ECR 마이크로웨이브 power, CH$_4$/H$_2$가스 혼합비와 유량, 증착시간, 그리고 기판 bias 전압 등을 변화시켜 가면서 수소가 함유된 비정질 탄소(a-C:H) 박막을 증착하였고, 증착시킨 박막의 특성을 AES(Auger electron spectroscopy), ERDA(elastic recoil detection analysis), FTIR(Fourier transform infrared) 및 Raman 측정 등으로 조사하였다. 증착시킨 a-C:H 박막은 탄소 및 수소원소들로만 구성되어 있음을 AES 측정으로 확인하였다. 그리고 FTIR 측정으로부터 a-C:H 박막은 대부분 sp$^3$결합을 하고 있고 일부는 sp$^2$결합을 하고 있음을 확인하였으며, CH$_4$/H$_2$가스 혼합비와 유량의 변화가 a-C:H 박막의 탄소와 수소의 결합구조에 큰 영향을 미치지 않았으며, 다만 증착시간이 증가할수록 탄소와 수소 원자들의 결합구조가 $CH_3$구조에서 CH$_2$나 CH 구조로 변하고 있음을 알았다. 또한 Raman 스펙트럼의 Gaussian curve fitting을 통하여 sp$^3$/sp$^2$의 결합수에 비례하는 D 및 G peak의 면적 강도비(I$_{D}$/l$_{G}$)는 기판 bias 전압을 증가시킬수록 증가하였으며, 경도도 역시 증가하였다.하였다.