• Proceedings of the Materials Research Society of Korea Conference
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• 1998.11a
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• pp.46-46
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• 1998

• Journal of the Korean Ceramic Society
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• v.42 no.6 s.277
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• pp.411-416
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• 2005

Y-TZP(Yttria-stabilized Tetragonal Zirconia Polycrystal) ceramics are of great interest as engineering and structural materials due to their excellent mechanical properties arising from transformation toughening, it is also reported that the 3Y-TZP($3 mol\%$ Yttria-stabilized Tetragonal Zirconia Polycrystal) has the best mechanical properties in Y-TZP ceramics. But to use widely for engineering and structural materials, it remains an important challenge to be able to improve its fracture toughness. In order to produce the 3Y- TZP ceramics showing much better mechanical properties, milling method adding monoclinic zirconia to 3Y-TZP was adopted and the resultant mechanical properties containing apparent density and fracture toughness were measured by using proper techniques. Experimental results showed that the 3Y-TZP specimen containing $33 wt\%$ of monoclinic zirconia, which was sintered at $1450^{\circ}C$, has the highest fracture toughness value of $11.38 MPa{\cdot}m^{1/2}$ which is three times higher than that of normal 3Y-TZP ceramics.

• Journal of the Korean Ceramic Society
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• v.43 no.2 s.285
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• pp.69-73
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• 2006

A full retention of the tetragonal phase with coarse grains $(50\~60\;{\mu}m)$ was possible with the specimen $ZrO_2-1.9\;mol\%\;Y_2O_3$. In these coarse grains, $\{101\}_t$ annealing twins were frequently observed, although they do not exist in the usual fine grained specimens. The morphology and growth rate of the isothermally formed individual products are studied at an optical microscopic level. The habit planes of both products are also identified by performing two-surface trace analysis on the grains whose orientations are determined by the Electron Back Scattering Pattern (EBSP) method. The morphologies of isothermal martensite were well-defined thin plates and lenticular types. The growth rate in their longitudinal directions was quite slow and temperature-dependent. A two-surface trace analysis, incorporated with the EBSP method, identified the habit planes near $\{013\}_c$, in agreement with previous reports obtained from TEM works.

• Transactions on Electrical and Electronic Materials
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• v.15 no.4
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• pp.189-192
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• 2014

Yttria-stablized zirconia (YSZ) is the most commonly used electrolyte material, but the reduction in working temperature leads to insufficient ionic conductivity. Ceria based electrolytes (GDC) are more attractive in terms of conductivity at low temperature, but these materials are well known to be reducible at very low oxygen partial pressure. The reduction of electrolyte resistivity is necessary to overcome cell performance losses. So, thin YSZ/GDC bilayer technology seems suitable for decreasing the electrolyte resistance at lower operating temperatures. Bilayer electrolytes composed of a galdolinium-doped $CeO_2$ ($Ce_{0.9}Gd_{0.1}O_{1.95}$, GDC) layer and yttria-stabilized $ZrO_2$ (YSZ) layer with various thicknesses were deposited by RF sputtering and E-beam evaporation. The bilayer electrolytes were deposited between porous Ni-GDC anode and LSM cathode for anode-supported single cells. Thin film structure and surface morphology were investigated by X-ray diffraction (XRD), using $CuK{\alpha}$-radiation in the range of 2ce morphol$^{\circ}C$. The XRD patterns exhibit a well-formed cubic fluorite structure, and sharp lines of XRD peaks can be observed, which indicate a single solid solution. The morphology and size of the prepared particles were investigated by field-emission scanning electron microscopy (FE-SEM). The performance of the cells was evaluated over $500{\sim}800^{\circ}C$, using humidified hydrogen as fuel, and air as oxidant.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.30 no.5
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• pp.331-337
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• 2017

Thermal batteries, reserve power source, is activated by melting of molten salt at the temperature range of $350{\sim}550^{\circ}C$. To immobile the molten state electrolyte when the thermal battery is activated, the binder must be added in electrolyte. Usually, molten salts include 30~40 wt% of MgO binder to ensure electrical insulation as well as safety. However, the conventional MgO binder tends to increase ionic conductive resistance and thus the inclusion of the binder increases the total impedance of the battery. This paper mainly focused on the study of yttria stabilized zirconia (YSZ) as an alternative binder for molten salt. The chemical stability between the molten salt and YSZ is measured by XRD and DSC. And the sufficient path for ionic conduction on molten salt could be confirmed by the enhanced wetting behavior and the enlarged pore size of YSZ. The electrochemical properties were analyzed using single cell tests so that it showed the outstanding performance than that using MgO binder.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.26 no.2
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• pp.74-79
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• 2016

The lanthanum oxide nano-rods were grown on the surface of 3 mol% Yttria Partially Stabilized Zirconia ceramic composite which containing Lanthanum-Strontium Manganate, $La_xSr_yMn_zO_3$ for the purpose of endorsing the antistatic property. The diameter and the aspect ratio of the nano-rods were greatly changed according to the growing condition. With the optical microscope observation, the nano-rods shining brightly. It was confirmed that the major components of nano-rods is La, and Sr, Mn, Si are minor components by SEM and TEM analyses.

• Journal of the Korean Ceramic Society
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• v.40 no.8
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• pp.798-803
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• 2003

In synthesis of nano powders, the hard agglomeration for the synthesized powders occurred during the drying processing. In order to avoid hard agglomeration in particles the freeze drying process was used in this experiment. e fabricated the Yttira-Doped Ceria(YDC) nano powder by co-precipitation. Starting materials used in experiments were the cerium(III) nitrate and yttrium(III) nitrate solution with 야-water, which two solutions were mixed and then the precipitated hydroxides were prepared for adding sodium hydroxide. The co-precipitated powders were dried by the thermal drying at 8$0^{\circ}C$ for 24 h and by freeze drying at -4$0^{\circ}C$, 30 mtorr for 72 h. The lattice parameter and crystallite size as a function of calcination temperature was characterized by XRD analysis. The lattice parameter of YDC was decreased with addition amount of yttrium and was estimated as 5.401683 $\AA$ at $700^{\circ}C$. Crystallite size were calculated by XRD-LB method, and morphologies were confirmed with the observation of TEM and SEM. The freeze dried YDC powders had medium diameter of 17 nm with more uniform size distribution than the thermal dried YDC posers, which were mainly ascribed to the difference of agglomerates formation during drying stage.

• Journal of the Korean Ceramic Society
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• v.41 no.2
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• pp.111-117
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• 2004

3Y-TZP containing 0.3∼1.2 wt% of $Al_2$O$_3$ was prepared by slip-casting after attrition milling. The specimen was sintered at 1390∼151$0^{\circ}C$ and mechanical characterization and microstructure analysis were conducted. Monoclinic content of the specimen was calculated by XRD. The apparent density of specimen increased with increasing sintering temperature. While above 1470%, the formation of m-ZrO$_2$ degraded the density. The microhardness of specimen decreased with temperature because monoclinic phase increased wit the grain growth. The specimen containing $Al_2$O$_3$ below 0.9 wt% sintered at 143$0^{\circ}C$ showed the highest microhardness of 1360 Hv.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.309-309
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• 2011

There have been large research activities on the high quality oxide films for the realization oxide based electronics. However, the interface interdiffusion prohibits achieving high quality oxide films, when the oxide films are grown on non-oxide substrates. In the case of Si substrates, there exist lattice mismatch and interface interdiffusion when oxide films deposited on direct Si surface. In this presentation, we report the interface characteristics of yttria-stabilized zirconia films grown on silicon substrates. From x-ray reflectivity analysis we found that the film thickness and interface roughness decreased as the growth temperature increased, indicating that the growth mechanism varies and the chemical reaction is limited to the interface as the growth condition varies. Furthermore, the packing density of the film increased as the growth temperature increased and the film thickness decreased. X-ray photoelectron spectroscopy analysis of very thin films revealed that the amount of chemical shift increased as the growth temperature increased. Intriguingly, the direction of the chemical shift of Zr was opposite to that of Si due to the second nearest neighbor interaction.

• Journal of the Korean Ceramic Society
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• v.38 no.3
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• pp.218-224
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• 2001

Yttria-stabilized zirconia (YSZ) films were deposited with varying temperatures of ZrCl$_4$between 250~55$0^{\circ}C$ with YCl$_3$and the substrate at 100$0^{\circ}C$. Nanoamperes per square centimeter of the electric current were measured in the reactor during deposition and the current increased with increasing evaporation temperature of ZrCl$_4$. The zirconia nanometer size clusters were captured on the grid membrane near the substrate during the CVD process and observed by transmission electron microscopy (TEM). The deposition rate decreased with increasing evaporation temperature of ZrCl$_4$. A cauliflower-shaped structure was developed at 25$0^{\circ}C$ then gradually changed to a faceted-grain structure above 35$0^{\circ}C$. Dependence of the growth rate and the morphological evolution on the evaporation temperature of ZrCl$_4$was approached by the charged cluster model.