• Title/Summary/Keyword: XPS.

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A Study on ElectricalㆍOptical Properties of Organic Light Emitting Diode by Oxygen Plasma Surface Treatment of Indium-Tin-Oxide Substrates (ITO 기판의 산소 플라즈마 표면 처리에 의한 OLED의 전기적ㆍ광학적 특성에 관한 연구)

  • Yang Ki-Sung;Kim Byoung-Sang;Kim Doo-Seok;Shin Hoon-Kyu;Kwon Young-Soo
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.54 no.1
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    • pp.8-12
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    • 2005
  • Indium tin oxide(ITO) surface treated by Oxygen plasma has been in situ analyzed using XPS(X-ray Photoelectron Spectroscopy) and EDS(Energy Dispersive Spectroscopy), to investigate the relations between the properties of the ITO surface and the properties of OLED(Organic Light Emitting Diode). We measured electrical resistivity using Four-Point-Probe and calculated sheet resistance, and ITO surface roughness was measured by AFM(Atomic Force Microscope). We fabricated OLED using substrate that was treated optimum ITO surface. The plasma treatment of the ITO surface lowered the operating voltage of the OLED. We have obtained an improvement of luminance and decrease of turn-on voltage.

Tribological performance of a sputtered $MoS_2$ film having an oxidized surface layer

  • Suzuki, M.;Shimizu, S.
    • Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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    • 2002.10b
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    • pp.151-152
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    • 2002
  • An oxidized surface layer was intentionally formed on a sputtered $MoS_2$ film by introducing oxygen gas in the final stage of sputtering process. The film showed longer life than the normal Ar-sputtered film when the surface layer was slightly oxidized. A XPS analysis revealed co-existence of $MoS_2$ and $MoO_3$ in the surface layer. suggesting that the existence of some amount of oxides in the surface layer had beneficial effect. A confusing result was obtained: the life was much shorter than normal Ar-sputtered film when the film was exposed to $O_2$ environment for 1 minute after normal Ar-sputtering, although almost no oxide was detected in XPS analysis.

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Defective Surface Analysis of Aluminum Bonding Pads for Au Wire Bonding

  • Son, Dong-Ju;Ji, Yong-Joo;Jeon, Yoon-Su;Soh, Dae-Wha;Hong, Sang-Jeen
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.11a
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    • pp.4-4
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    • 2009
  • Surface analysis on defective wire-bonding pads are performed in flash memory assembly. Week wire bonding may cause a significant effect on the final product reliability, and the surface condition of the aluminum bond pads is critical in terms of product reliability. To find out possible week bonding on semiconductor interconnects, ball sheer test (BST) has been performed. On some defective or week bonded pads, we have investigated the surface contents, assuming that the week bonding is induced from the surface conditions. AES and XPS are employed for the quantitative surface analysis on defective dies.

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Effect of Pretreatment on the Dissolution of Aluminum Alloy during Hydration Process (수화과정에서 전처리가 알루미늄 합금의 용출에 미치는 효과)

  • Lee, Byoung-Gu;Lee, Hoyeon;Tak, Yongsug
    • Corrosion Science and Technology
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    • v.12 no.5
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    • pp.215-219
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    • 2013
  • Aluminum alloy(3003) can be dissolved during hydration process with hot tap water. In order to increase the stability of aluminum alloy, it was pretreated with anodization and phosphoric acid before hydration process. The effect of pretreatment on the surface property changes was analyzed with X-ray Photoelectron Spectroscopy (XPS) and Inductively Coupled Plasma-Optical Emission Spectrometer (ICP-OES) and their results supported that the increase of hydroxyl group (-OH) on the surface formed during anodization and phosphorous acid treatment prevented the dissolution of aluminum alloy during hydration process at high temperature.

O2 플라즈마 처리에 따른 용액 공정 기반 ITZO 박막 트랜지스터의 문턱전압 연구

  • Kim, Sang-Seop;Choe, Byeong-Deok
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.151.1-151.1
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    • 2015
  • 본 연구에서는 $O_2$ 플라즈마 처리에 따른 용액 공정 기반 ITZO 박막 트랜지스터를 제작하여, 산소에 따른 문턱전압 변화를 비교, 분석하였다. 처리시간은 0초에서 50초까지 가변하였다. 전달 곡선으로 트랜지스터의 특성을 평가하고, XPS(X-ray Photoelectron Spectroscopy)를 통해 Zn, In, Sn-O 결합과 산소 결합 결함을 확인하였다. 처리 시간이 증가 할수록 문턱전압이 -6.8V에서 -2.1V로 이동하였다. 처리시간이 길어질수록 OM/OL 비율이 0.4533에서 0.4381로 감소하였고, 또한 산소 결합 결함이 감소하였다. 실험결과를 통해 산소 결합 결함을 조절함으로써 문턱전압이 양의 방향으로 이동함을 확인하였다.

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Verification of Core/Shell Structure of Poly(glycidyl methacrylate-co-divinyl benzene) Microspheres

  • Jin, Jeong-Min;Choi, Jin-Young;Lee, Kang-Seok;Choe, Soon-Ja
    • Macromolecular Research
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    • v.17 no.5
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    • pp.339-345
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    • 2009
  • The core/shell type structure of the highly crosslinked poly(glycidylmetharylate-co-divinylbenzene) microspheres prepared in the precipitation polymerization in acetonitrile was thoroughly verified by means of swelling, $^1H$ NMR, XPS, TEM and TGA measurements. In the XPS measurement, the higher the GMA content, the higher the oxygen content was observed, implying that the higher content of GMA is observed in the particle surface. The further verification of the core/shell structure of the poly(GMA-co-DVB) particles was carried out using $^1H$ NMR and TEM techniques, resulting in the poly(GMA-co-DVB) particles with the GMA rich-phase and DVB rich-phase. In overall, the poly(GMA-co-DVB) microspheres consist of a highly crosslinked DVB rich-phase in the core and slightly or non-crosslinked GMA rich-phase in the shell part due to the different reaction ratios between two monomers and self-crosslinking density of DVB.

A Study on the Surface Analysis of Plasma-Treated PET Film (플라즈마 처리된 PET 필름의 표면분석에 관한 연구)

  • Lim Kyung-Bum;Choi Hoon-Young;Lee Seok-Hyun;Lee Duck-Chool
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.53 no.12
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    • pp.596-600
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    • 2004
  • In this study, the surface properties of PET film were analyzed after plasma surface treatment. After plasma treatment of surface roughness and XPS were evaluated to analyze the chemical property, while the surface potential decay and surface resistance rate was measured to analyze the electric관 characteristic. When plasma discharge treatment was conducted for less than 10 minutes, the electrical insulating property was improved by evaporation of low molecular weight materials and cleaning of surface. However, when the treatment was conducted for more than 10 minutes, the insulating property was decreased due to excessive discharge energy. Analyses of chemical characteristics showed that 10-minute treatment resulted in increase of C-O and O=C-O bonds. However, when treated for more than 10 minutes. they were relatively decreased.

Surface Characterization of Silicone Rubber for Outdoor Insulation by Measurement of Surface Voltage Decay

  • Youn, Bok-Hee;Huh, Chang-Su;Cho, Han-Gu
    • KIEE International Transactions on Electrophysics and Applications
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    • v.12C no.4
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    • pp.214-219
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    • 2002
  • The influence of ultraviolet (UV) irradiation and corona on the surface degradation of high temperature vulcanized (HTV) silicone rubber used for outdoor insulation through measuring surface voltage decay after corona charging, surface resistivity, contact angle and X-ray photoelectron spectroscopy (XPS) analysis was studied. The surface resistivity calculated by the surface voltage decay was compared with a value directly obtained from the three electrode method having the guard ring electrode. A good agreement between the two methods for surface resistivity was obtained. UV treated specimens showed the slower decrease of surface voltage decay, while the corona exposed specimens showed a dramatically faster decrease. Although both artificial treatments cause the same oxidative products, which was confirmed with XPS, we could distinguish the difference between the reactions of the two treatments by monitoring the surface voltage decay on corona-charged specimen. In addition, we could derive the specific surface states of the silicone rubber treated by accelerated artificial aging factors and the degradation process.