• 제목/요약/키워드: X-ray measurement

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(Ba1-xCax)(Ti0.85Zr0.12Sn0.03)O3계 세라믹스의 미세구조 및 유전 특성 (Microstructure and Dielectric Properties of (Ba1-xCax)(Ti0.85Zr0.12Sn0.03)O3 Ceramics)

  • 신상훈;류주현;신동찬
    • 한국전기전자재료학회논문지
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    • 제27권12호
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    • pp.797-802
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    • 2014
  • In this study, in order to develop the capacitor composition ceramics with the good dielectric properties, $(Ba_{1-x}Ca_x)(Ti_{0.85}Zr_{0.12}Sn_{0.03})O_3$ (abbreviated as BCTZ) ceramics were prepared by the conventional solid-state reaction method. The effects of Ca substitution on the microstructure and dielectric properties was investigated. The X-ray diffraction patterns demonstrated that all the specimens showed perovskite phase, and secondary phases are indicated in the measurement range of X-ray diffraction. Also, all the specimens indicated an rhombohedron phase structure. It was identified from the X-ray diffraction patterns that the secondary phase formed in grain boundaries and then decreased the dielectric properties. For all the specimens, observed one peak was tetragonal cubic phase transition temperature($T_c$), which is located in the vicinity of room temperature.

엑스선 간섭계를 이용한 초정밀측정 (Nanometrological Application of X-ray Interferometry)

  • 엄천일
    • 한국정밀공학회지
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    • 제17권6호
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    • pp.40-45
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    • 2000
  • 교정은 모든 측정분야에서 어렵고 까다로운 주제인데, 특히 정전센서, 레이저간섭계, AFM, STM 등을 포함하는 나노메트롤로지(nanometrology : 나노측정) 분야에서는 그러하다. 나노측정에서는 전체 측정범위가 센서들의 한계분해능 값과 비슷한데, 이러한 측정에서 높은 소급성을 유지하기는 매우 어렵기 때문이다.(중략)

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Synthesis, crystal structure, and analytical characterizations of amphiphilic palladium(II) compound containing bis(benzylthio)methylenepropanedioate

  • Tae Hwan Noh
    • 분석과학
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    • 제36권4호
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    • pp.198-203
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    • 2023
  • The reaction of cis-protected (Me4en)Pd(II) species with potentially multidentate bis(benzylthio)methylenepropanedioate (L) was carried out to obtain a monometallic compound, [(Me4en)Pd(L)], in O,O'-coordination mode. The bis(benzylthio)methylene group was bent strikingly from the palladium square plane at the dihedral angle of 70.40°. The physicochemical properties of the present palladium(II) compound were fully characterized by means of infrared and nuclear magnetic resonance spectroscopy, thermogravimetric analysis, and single-crystal X-ray diffraction measurement.

Surface analysis of CuSn thin films obtained by rf co-sputtering method

  • 강유진;박주연;정은강;강용철
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2015년도 제49회 하계 정기학술대회 초록집
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    • pp.175.1-175.1
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    • 2015
  • CuSn thin films were deposited by rf magnetron co-sputtering method with pure Cu and Sn metal targets with a variety of rf powers. CuSn thin films were studied with a surface profiler (alpha step), X-ray photoelectron spectroscopy (XPS), X-ray induced Auger electron spectroscopy (XAES), X-ray diffraction (XRD), and contact angle measurement. The thickness of CuSn thin films was fixed at $200{\pm}10nm$ and deposition rate was calculated by the measured with a surface profiler. From the survey XPS spectra, the characteristic peaks of Cu and Sn were observed. Therefore, CuSn thin films were successfully synthesized on the Si (100) substrate. The oxidation state and chemical environment of Cu and Sn were investigated with the binding energy regions of Cu 2p XPS spectra, Sn 3d XPS spectra, and Cu LMM Auger spectra. Change of the crystallinity of the films was observed with XRD spectra. Using contact angle measurement, surface free energy (SFE) and wettability of the CuSn thin films were studied with distilled water (DW) and ethylene glycol (EG).

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X선 응력측정에 의한 복합재료의 3축 응력해석 (Tri-axial Stress Analysis of Composite Materials for X-ray Stress Measurement)

  • 부명환;박영철;광뢰행웅
    • 대한기계학회논문집A
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    • 제23권7호
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    • pp.1173-1181
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    • 1999
  • In X-ray stress measurements for uni-directionally deformed surfaces such as grinding, a strongly curved $sin^2{\Psi} diagram, so called $\Psi-splitter, has been observed recently. It has been known that this is caused by the residual shear stress induced in the deformed layer by external forces. In this case it is necessary to consider this enough for ceramics and composite materials with tri-axial stress analysis. However, sufficient studies have not been done about the tri-axial stress analysis of the macro stress and micro. stress on each phase of the composite materials. The result of obtaining is as follows. 1. $\Psi-splitter does not appear in the vertical direction though $\Psi-splitter appears in grinding direction in WC-Co cemented carbides. The reversal of $\Psi-splitter to each phase does not appear. 2. $\Psi-splitter caused in WC-Co cemented carbides has a close relation in dislocation which accumulates in WC phase and phase transformation caused in Co phase. 3. The residual stress on the surface of grinding of each phase is in the state of the compression stress.

양방사선 골밀도 측정 장치의 공간산란선량분포측정 (Bone Density Spatial Distribution of Radiation Dose Measurement)

  • 김선칠;원도연;박창희;동경래
    • 대한디지털의료영상학회논문지
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    • 제13권2호
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    • pp.59-62
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    • 2011
  • In this experiment, how DEXA(Dual-energy X-ray Absorptiometry) bone mineral density was measured using the equipment. In order to maintain the same measurement conditions, bone mineral density measurements of 10 cm thick phantom, with an actual patient at a point when examining the same conditions(100 kVp, 1 mA) and then out to the five doses of radiation and its average was calculated by dividing measured. X-ray dose rate measured at the Research Institute, Sword of the gamma survey meters calibrated MEDCOM Ltd. (Inspector GM counter tube) was used, calibration factor is 1.15. On a horizontal plane around the patient, depending on the distance was significantly reduced dose rate. In addition, orientation $0^{\circ}$ head end was higher in the direction of the highest dose rate, $0^{\circ}$ $180^{\circ}$ direction from the direction towards the higher dose rate reduced to some extent in the direction of all the $120^{\circ}$ were able to identify.

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고체 전해질을 이용한 새로운 전지에 관한 연구 (A Study on Solid Electrolyte for New Type Cell)

  • 박성호;조승구;김규홍;김용배;최재시
    • 대한화학회지
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    • 제30권6호
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    • pp.500-509
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    • 1986
  • 새로운 전지의 개발을 위하여$ AgI-Ag_8S_3SO_4$system들을 만들어 이에 대한 전기전도도 측정, 상 연구 및 그 구조를 조사하였다. X-ray powder diffraction method로 20mole% $ Ag_8S_3SO_4$-AgI system의 구조가 단사정계임을 규명하였고 DTA method로 단일상을 이룸을 확인하였다. 4-probe method를 적용시켜 전기전도도를 측정한 결과 20mole% $ Ag_8S_3SO_4$-AgI system이 순수한 $ Ag^+ $이온성 couduct임을 밝힐 수가 있었다.

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Optoelectrical Properties of HgCdTe Epilayers Grown by Hot Wall Epitaxy

  • Yun, Suk-Jin;Hong, Kwang-Joon
    • 센서학회지
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    • 제13권4호
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    • pp.277-281
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    • 2004
  • $Hg_{1-x}Cd_{x}Te$ (MCT) was grown by hot wall epitaxy. Prior to the MCT growth, the CdTe (111) buffer layer was grown on the GaAs substrate at the temperature of $590^{\circ}C$ for 15 min. When the thickness of the CdTe buffer layer was $5{\mu}m$ or thicker, the full width at half maximum values obtained from the x-ray rocking curves were found to significantly decrease. After a good quality CdTe buffer layer was grown, the MCT epilayers were grown on the CdTe (111)/GaAs substrate at various temperatures in situ. The crystal quality for those epilayers was investigated by means of the x-ray rocking curves and the photocurrent experiment. The photoconductor characterization for the epilayers was also measured. The energy band gap of MCT was determined from the photocurrent measurement and the x composition rates from the temperature dependence of the energy band gap were turned out.