• Bulletin of the Korean Chemical Society
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• 제28권9호
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• pp.1588-1590
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• 2007

• Journal of Microbiology and Biotechnology
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• 제9권5호
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• pp.568-571
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• 1999

Aspergillus oryzae U1521, which was a genetically engineered strain, produced 1,000,600 U per g . glucose of extracellular alkaline protease within 72 h in a submerged fermentation. However, the alkaline protease was not detected during the first 24 h. Northern blot analysis indicated that the enzyme synthesis was repressed at the transcriptional level during the lag period. Both catabolite repression and pH of the growth medium significantly affected the enzyme production. Use of this enzyme as a silver recovery agent from used X-ray film was confirmed by experiments in the shake-flask scale.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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• pp.310-311
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• 2009

New X-shaped crystalline molecules have been synthesized through various coupling reactions and their electronic properties were investigated. They exhibit good solubility in common organic solvents and good self-film forming properties. They are intrinsically crystalline as they exhibit well-defined X-ray diffraction patterns from uniform and preferred orientations of molecules. They also exhibited high field effect mobilities in thin film transistor (TFT) and good device performances.

• 한국방사선학회논문지
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• 제17권4호
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• pp.625-631
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• 2023

24시간/7일 동안 높은 관전압 하에서 높은 프레임 속도로 검사 대상체의 불량을 검사하는 산업용 동영상 엑스레이 디텍터의 중요한 요구사양은 높은 방사선 내구성을 확보하는 것이다. 본 연구는 비정질 실리콘 (a-Si), 다결정 실리콘 (Poly-Si), In-Ga-Zn-O 산화물 (IGZO) 등의 반도체 층을 갖는 다양한 박막트랜지스터를 제작하여 각각의 방사선 내구성을 확인하였다. a-Si TFT 대비 수십 배 높은 전계효과 이동도로 고속 동영상 구현이 가능한 IGZO TFT의 경우, IGZO 반도체 층과 층간절연막 사이에 수소화 처리를 진행할 경우 산업용 요구사양인 10,000 Gy 누선선량까지 엑스레이 영상센서로 적용 가능한 수준 이상으로 전기적 특성의 변화가 없음을 확인하였다. 따라서 수소화한 IGZO TFT는 방사선 내구성을 확보함과 동시에 높은 전계효과 이동도로 동영상 디텍터의 영상센서에 적용 가능한 유일한 소자임을 확인하였다.

• 대한방사선기술학회지:방사선기술과학
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• 제16권1호
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• pp.67-80
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• 1993

Recently, a large number of new screen-film systems have become available for use in diagnostic radiology. These new screens are made of materials generally known as rare-earth phosphors which have high x-ray absorption and high x-ray to light conversion efficiency compared to calcium tungstate phosphors. The major advantage of these new systesms is reduction of patient exposure due to their high speed or high sensitivity. However, a system with excessively high speed can result in a significant degradation of radiographic image quality. Therefore, th speed is important parameters for users of these system. Our aim of in this was to determine accurately and precisely the absolute speed and relative speeds of both new and conventional screen-film system. We determined the absolute speed in condition of BRH phantom beam qulity and the relative speed were measured by a split-screen technique in condition of BRH and ANSI phantom beam qulity. The absolute and the relative speed were determined for 8 kinds of screen-4 kinds of film in regular system and 7 kinds of screen-7 kinds of film in ortho system. In this study we could know the New Rx, T-MAT G has the highest film speed, also know Green system's stndard deviation of relative speed larger than blue system. It was realized that there were no relationship between the absolute speed and the blue system. It was realized that there were no relationship between the absolute speed and the relative speed in ortho or regular system.

• 한국전기전자재료학회논문지
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• 제14권4호
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• pp.269-273
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• 2001

W fabricated thin film using Na$_{0.5}$K$_{0.5}$NbO$_3$ volatile material by pulsed laser deposition (PLD) and studied characterization from EM, XRD, P-E. The density and scale of droplet, which is the defect of PLD, was investigated by SEM but large droplet was not found. The degree of assemble oriented C-axis measured with X-ray diffraction suggests that this film oriented C-axis achieved by $\theta$-2$\theta$ scan and rocking curves shows good self-assemble phenomenon, finally $\phi$-scan does that all of the four directions of the lattice in film equals to those of substrate. P-E hysteresis loop shows residual remnant polarization or saturation polarization value, but it is applicable to memories.ies.

• 한국재료학회지
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• 제21권12호
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• pp.703-707
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• 2011

The electrochromic properties of tungsten oxide films grown by RF sputtering were investigated. Among the sputter parameters, first the $Ar:O_2$ ratios were controlled with division into only an $O_2$ environment, 1:1 and 4:1. The structure of each film prepared by these conditions was studied by X-ray diffraction, X-ray photoelectron spectroscopy and Rutherford backscattering spectroscopy. The sputter-deposited tungsten oxide films had an amorphous structure regardless of the $Ar:O_2$ ratios. The chemical compositions, however, were different from each other. The stoichiometric structure and low-density film was obtained at higher $O_2$ contents. Electrochemical tests were performed by cyclic voltammetry and chronoamperometry at 0.05 M $H_2SO_4$ solutions. The current density and charge ratio was estimated during the continuous potential and pulse potential cycling at -0.5 V and 1.8 V, respectively. The film grown in a higher oxygen environment had a higher current density and a reversible charge reaction during intercalation and deintercalation. The in-situ transmittance tests were performed by He-Ne laser (633 nm). At higher oxygen contents, a big transmittance difference was observed but the response speed was too slow. This was likely caused by higher film resistivity. Furthermore, the effect of sputtering pressure was also investigated. The structure and surface morphology of each film was observed by X-ray diffraction and scanning electron microscopy. A rough surface was observed at higher sputtering pressure, and this affected the higher transmittance difference and coloration efficiency.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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• pp.388-391
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• 2003

The properties of these detectors can be controlled by electronics and exposure conditions. Flat-panel detectors for digital diagnostic imaging convert incident x-ray images to charge images. Flat panel detectors gain more interest real time medical x-ray imaging. Active area of flat panel detector is $14{\times}17$ inch. Detector is based on a $2560{\times}3072$ away of photoconductor and TFT pixels. X-ray conversion layer is deposited upper TFT array flat panel with a 500m by thermal deposition technology. Thickness uniformity of this layer is made of thickness control technology(5%) of thermal deposition system. Each $139m{\times}139m$ pixel is made of thin film transistor technology, a storage capacitor and charge collection electrode having geometrical fill factor of 86%. Using the separate driving system of two dimensional mosaic modules for large area, that is able to 4.2 second per frame. Imaging performance is suited for digital radiography imaging substitute by conventional radiography film system..

• 대한방사선기술학회지:방사선기술과학
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• 제10권1호
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• pp.49-53
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• 1987

This thesis compared and analyzed the characteristics, centered on a characteristic curve, about X-ray computerized tomographic film generally used in Korea recently. The results were as follows: 1. Maximum gradient (gamma) was film A-2.19, film B-2.00, film C-1.92. 2. Latitude was confined within the limits of density 0.6-2.0 in all. 3. When we changed window center from 0 to 40, the difference of density, which was in 1.0, was film A-0.12, film B-0.16, fil m C-0.14. 4. When we changed window width from 0 to 500, the difference of density, which was in 1.0, was film A-0.06, film B-0.08, film C-0.05. 5. In the case of window width 50 and window center 20, latitude was 0.5-2.0, 0.5-2.2, 0.5-1.9 and gamma value was 1.74, 1.82, 1.72 respectively, 6. In the case of window width 80 and window center 30, latitude was 0.6-2.2, 0.6-2.3, 0.8-2.2 and gamma value was 2.0, 2.13, 1.95 respectively.

• 한국광학회:학술대회논문집
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• 한국광학회 2006년도 하계학술발표회 논문집
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• pp.91-92
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• 2006

Liquid crystal (LC) alignment on $a-SiO_x$ thin film was investigated by means of X-ray photoemission spectroscopy and optical transmittance as we varied the deposition temperature and the target-to-substrate distance. LC molecules can be aligned vertically on $a-SiO_x$ film when the stoichiometric parameter x of $a-SiO_x$ is smaller than 1.56, but they can be aligned homogeneously when x is larger than 1.56. We also found that whether liquid crystals can be aligned vertically or homogeneously on $a-SiO_x$ film can be predicted simply by measuring the change in optical transmittance by deposition of $a-SiO_x$ thin film layers.