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http://dx.doi.org/10.5012/bkcs.2007.28.9.1588

Characteristic of Organic Thin Film Depending on Carbon Content by Fourier Transform Infrared Spectra and X-ray Diffraction Pattern  

Oh, Teresa (School of Electronics and Information Engineering, Cheongju University)
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Keywords
FTIR spectra; X-ray diffraction pattern; Si-O-C bond; Si-$CH_3$ bond;
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