• Title/Summary/Keyword: X-ray Line Detector

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Novel Structure of 21.6 inch a-Si:H TFT Array for the Direct X-ray Detector

  • Kim, Jong-Sung;Joo, In-Su;Choo, Kyo-Seop;Park, June-Ho;Chung, In-Jae
    • 한국정보디스플레이학회:학술대회논문집
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    • 2000.01a
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    • pp.13-14
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    • 2000
  • 21.6" a-Si:H TFT array for direct conversion X-ray detector with 2480 by 3072 pixel is successfully developed. To obtain good X-ray image quality, novel structure, storage on BCB structure, is proposed. The structure reduces the parasitic capacitance of data line, one of the main sources of signal noise. Also, the structure shows higher failure resistance against defects than that of the old design.

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Development of X-ray Detector using Liquid Crystal with Front Light (전면광원(Front Light)을 적용한 액정 X선 검출기 개발)

  • Rho, Bong Gyu;Baek, Sam Hak;Kang, Seok Jun;Lee, Jong Mo;Bae, Byung Seong
    • Journal of the Korean Society of Radiology
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    • v.13 no.6
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    • pp.831-840
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    • 2019
  • The X-ray detector by liquid crystal with front light was proposed and verified by a X-ray image. The proposed detector utilizes the visible light instead of the electric signal by transistor. Therefore, it shows low noise and can be fabricated at low cost. The liquid crystal detector uses the orientation change of the liquid crystal molecule by conductivity change of the photoconductive layer. We can get the X-ray image from the transmitted light through the liquid crystal. The X-ray dose was calibrated from the measured transmittance of the visible light after comparison to the reference transmittance curve of the liquid crystal. The amorphous Se was used for photo con ducting layer and parylene was used for the liquid crystal alignment instead of the conventional alignment layer which needs high-temperature process over 200℃. The proposed X-ray detector can decrease the X-ray dose by high sensitivity which was verified by simulation. After the fabrication of the X-ray detector, the X-ray image was obtained as a function of the bias voltage to the liquid crystal. 10 lines/mm resolution was obtained from the line pattern and we will apply it to the 17inch diagonal liquid crystal X-ray detector with 3π retardation.

Novel Structure of 21.6 inch a-Si:H TFT Array for the Direct X-ray Detector

  • Kim, Jong-Sung;Choo, Kyo-Seop;Park, June-Ho;Chung, In-Jae;Joo, In-Su
    • Journal of Information Display
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    • v.1 no.1
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    • pp.29-31
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    • 2000
  • A 21.6" a-Si:H TFT array for direct conversion X-ray detector with 2480 by 3072 pixels is successfully developed. To obtain X-ray image of satisfactory quality, a novel structure with a storage electrode on BCB is proposed. The structure reduces the parasitic capacitance of data line, which is one of the main sources of signal noise. Also, the structure shows greater resistance to failure than that of the conventional design.

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Development of Real Time On-Line Thickness Measuring System for Insulated Pipeline (단열배관의 온라인 두께측정시스템 개발)

  • Jang, Ji-Hun;Kim, Byeong-Ju;Jo, Gyeong-Sik;Kim, Gi-Dong
    • 연구논문집
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    • s.32
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    • pp.65-76
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    • 2002
  • The intensity of x-ray or gamma-ray is attenuated according to density and thickness of the transmitted medium. In this study, by using this principle, on-line real-time radiometric system was developed using a 128 channels linear array of solid state detectors to measure wall thickness of insulated piping system. This system uses a Ir-192 as a gamma ray source and detector is composed of BGO scintillator and photodiode. Ir-192 gamma ray source and linear detector array mounted on a computer controlled robotic crawler. The Ir-192 gamma ray source is located on one side of the piping components and the detector array on the other side. The individual detectors of the detector array measure the intensity of the gamma rays after passing through the walls and the insulation of the piping component under measurement. The output of the detector array is amplified by amplifier and transmitted to the computer. This system collects and analyses the data from the detector array in real-time. The maximum measurable length of pipe is 120cm/mm. in the case of 1mm scanning interval.

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Effects of the Geometrical Misalignment on the MTF Measurement (변조전달함수 측정에 있어 기하학적 조정 불량이 해상도에 미치는 영향)

  • Kim, Jun-Woo
    • Journal of the Korean Society of Radiology
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    • v.15 no.5
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    • pp.705-713
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    • 2021
  • The modulation transfer function (MTF) is calculated to analyze the resolution of the spatial frequency of the image acquired from the x-ray imaging system. In general, the response function of the detector acquires a line spread function (LSF) using a slit-camera, and derives a modulation transfer function through a Fourier transform. Because of the fact that the x-ray must always be incident on the center of the slit-camera, the tilt of the detector and slit-camera caused by the experimenter will affect the detector performance. In addition, if the tilt increases, the performance evaluation of the x-ray image system will be problematic. In this study, we analyzed the experimental and analytical models in the modulation transfer function, ie, the Fourier domain, based on the experimental error and analyzed the effect on the spatial frequency. Furthermore, performance evaluation is being carried out for various x-ray imaging systems, and experimental errors are indispensable, and the extent to which they can be tolerated should be reviewed.

MATERIAL INVESTIGATION AND ANALYSIS USING CHARACTERISTIC X-RAY

  • Oh, Gyu-Bum;Lee, Won-Ho
    • Nuclear Engineering and Technology
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    • v.42 no.4
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    • pp.426-433
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    • 2010
  • The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a $^{57}Co$ radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the $K_{\alpha1}$-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.

An Optimal Structure of a Novel Flat Panel Detector to Reduce Scatter Radiation for Clinical Usage: Performance Evaluation with Various Angle of Incident X-ray (산란선 제거를 위한 신개념 간접 평판형 검출기의 임상적용을 위한 최적 구조 : 입사 X선 각도에 따른 성능평가)

  • Yoon, Yongsu
    • Journal of radiological science and technology
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    • v.40 no.4
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    • pp.533-542
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    • 2017
  • In diagnostic radiology, the imaging system has been changed from film/screen to digital system. However, the method for removing scatter radiation such as anti-scatter grid has not kept pace with this change. Therefore, authors have devised the indirect flat panel detector (FPD) system with net-like lead in substrate layer which can remove the scattered radiation. In clinical context, there are many radiographic examinations with angulated incident X-ray. However, our proposed FPD has net-like lead foil so the vertical lead foil to the angulate incident X-ray would have bad effect on its performance. In this study, we identified the effect of vertical/horizontal lead foil component on the novel system's performance and improved the structure of novel system for clinical usage with angulated incident X-ray. Grid exposure factor and image contrast were calculated to investigate various structure of novel system using Monte Carlo simulation software when the incident X-ray was tilted ($0^{\circ}$, $15^{\circ}$, and $30^{\circ}$ from the detector plane). More photons were needed to obtain same image quality in the novel system with vertical lead foil only then the system with horizontal lead foil only. An optimal structure of novel system having different heights of its vertical and horizontal lead foil component showed improved performance compared with the novel system in a previous study. Therefore, the novel system will be useful in a clinical context with the angulated incident X-ray if the height and direction of lead foil in the substrate layer are optimized as the condition of conventional radiography.

Analysis of Wide-gap Semiconductors with Superconducting XAFS Apparatus

  • Shiki, S.;Zen, N.;Matsubayashi, N.;Koike, M.;Ukibe, M.;Kitajima, Y.;Nagamachi, S.;Ohkubo, M.
    • Progress in Superconductivity
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    • v.14 no.2
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    • pp.99-101
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    • 2012
  • Fluorescent yield X-ray absorption fine structure (XAFS) spectroscopy is useful for analyzing local structure of specific elements in matrices. We developed an XAFS apparatus with a 100-pixel superconducting tunnel junction (STJ) detector array with a high sensitivity and a high resolution for light-element dopants in wide-gap semiconductors. An STJ detector has a pixel size of $100{\mu}m$ square, and an asymmetric layer structure of Nb(300 nm)-Al(70 nm)/AlOx/Al(70 nm)-Nb(50 nm). The 100-pixel STJ array has an effective area of $1mm^2$. The XAFS apparatus with the STJ array detector was installed in BL-11A of High Energy Accelerator Research Organization, Photon Factory (KEK PF). Fluorescent X-ray spectrum for boron nitride showed that the average energy resolution of the 100-pixels is 12 eV in full width half maximum for the N-K line, and The C-K and N-K lines are separated without peak tail overlap. We analyzed the N dopant atoms implanted into 4H-SiC substrates at a dose of 300 ppm in a 200 nm-thick surface layer. From a comparison between measured X-ray Absorption Near Edge Structure (XANES) spectra and ab initio FEFF calculations, it has been revealed that the N atoms substitute for the C site of the SiC lattice.

X-ray Absorption Near-edge Studies of Au1-xPtx alloys

  • Y.D. Chung;Lim, K.Y.;Lee, Y.S.;C.N.Whang;Park, B.S.;Y.Jeon
    • Proceedings of the Korean Vacuum Society Conference
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    • 2000.02a
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    • pp.164-164
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    • 2000
  • Since Au-Pt alloys have various atomic structures depending upon composition and annealing temperature, it is very interesting to investigate the electronic structures of alloys. We studied the changes of the electronic structure I the Au-Pt alloys by x-ray absorption near edge spectroscopy (XANES). Two kinds of Au-Pt alloy samples were prepared by arc melting methods and ion-beam-mixing technique. The Pt L2, 3-edge and Au L2, 3-edge X-ray absorption spectra (XPS) were measured with the electron yield mode detector at the 3C1 beam line of the Pohang Light Source (PLS). It was found that there was a substantial decrease in the area of the Pt L2, 3 white lines compared with that of pure Pt. The observed decrease in white line area was attributed to an increase in the number of pure Pt. The observed decrease in white line area was attributed to an increase in the number of 5d-electrons at the Pt site upon alloy formation. However, the Au L2, 3 edge spectra for Au-Pt alloys are all similar to that of pure Au. This implies that the 5d hole count of Au is not changed by alloy formation with Pt.

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Analysis of a flat-field soft x-ray spectrometer using a 2400-grooves/mm varied line-spacing concave grating (2400 grooves/mm 비등간격 오목에돌이발을 이용하는 평면결상형 연엑스선 분광기의 특성 해석)

  • 최일우;남창희
    • Korean Journal of Optics and Photonics
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    • v.13 no.3
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    • pp.189-196
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    • 2002
  • The components and alignment parameters of a flat-field soft x-ray spectrometer used in the wavelength range below 50 $\AA$ are determined, and the characteristics of the spectrometer are analyzed. It consists of a toroidal mirror, a slit, a varied line-spacing concave grating, and a soft x-ray detector. The space-resolved spectral image of a source is formed on a single plane using the tordidal mirror and the 2400-grooves/mm varied line-spacing concave grating. The former is used to compensate for the astigmatism caused by the grazing incidence of soft x-ray light on the concave grating. The spectral and spatial resolutions of the spectrometer are calculated by applying the wave front aberration theory, and the diffraction efficiency is calculated by applying the scalar diffraction theory.