• 제목/요약/키워드: X-ray Diffractometer

검색결과 601건 처리시간 0.031초

$CdCl_2$ 활성화 공정과 후면 산화막 제거 공정을 거친 CdTe 박막의 표면 물성 변화 연구

  • 천승주;이승훈;정영훈;배종성;김지현;김동환
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2012년도 춘계학술발표대회
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    • pp.98.1-98.1
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    • 2012
  • CdS/CdTe 박막 태양전지의 경우 높은 광흡수 계수를 가지고 있는 CdTe 다결정 박막을 흡수층으로이용 한다. CdTe 다결정 박막의 경우 CdS/CdTe 계면과 박막 내부에 많은 결함들이 존재 하며, CdTe 박막 내부에 존재하는 캐리어의 수를 증가 시키기 위하여 $CdCl_2$ 활성화 공정을 거치게 된다. 이때 박막의 물성 변화를 분석 하기 위하여, X-Ray Diffractometer (XRD), X-ray Photoelectron Spectroscopy (XPS)를 이용하여 박막 표면 분석을 진행 하였다. 이를 통해 박막 표면에서 산소가 Cd와 Te과 결합하면서 산화막이 생성되는 것을 확인하였다. 박막 표면에 생성된 산화막은 후면 금속 전극 형성을 위해, 용액 공정을 통하여 제거 되는데, 이때 CdTe 박막 표면에서 Cd이 용액에 의해 제거 되는 것을 확인 하였다.

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암모니아수/수산화나트륨에서 처리된 면의 미세구조와 물리적 성질(I) (Physical Properties and Fine Structure of Cotton Mercerized in Ammonia Water/Sodium Hydroxide(1))

  • 최철호;김미순;이찬민
    • 한국의류학회지
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    • 제12권2호
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    • pp.181-188
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    • 1988
  • Cotton fabrics were slack-mercerized in sodium hydroxide, ammonia water(min. $28{\%}\;NH_3$), and mixture of ammonia water/sodium hydroxide. The surface of treated cotton fabrics were observed through SEM, and the changes of fine structure were analyzed by X-ray diffractometer. In addition to that shrinkage was compared mutally, and tenacity-elongation compared, too. SEM photographs showed fibrls rearranged strightly toward fibre axis. X-ray diffraction represented increased amorphous fraction, and partial recrystallization into cellulose 2 lattic after treatment with sodium hydroxide and mixture of ammonia water/sodium hydroxide. The mercerization produced increased fibre tenacity-elongation with slark state. Lastly, the best condition of mercerization was $4\%/14\%$, $10^{\circ}C,\;5\~30$ min. in mixture of ammonia/sodium hydroxide.

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콜레스테롤을 갖는 분자 다층 구조의 합성 (Synthesis of Cholesterol-Containing Molecular Multilayer Structure)

  • 신재섭
    • 멤브레인
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    • 제6권4호
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    • pp.213-218
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    • 1996
  • 중합반응을 할 수 있는 vinyl 기와 콜레스테롤 기를 갖는 계면활성제들을 합성하고, 이 계면활성제들을 물 속에서 sonication하여 vesicle 용액을 형성한 다음, 이 용액을 건조하여 분자들이 규칙적으로 배열된 분자 다층 구조를 갖는 막을 합성하였다. 이 막들을 UV를 이용하여 중합한 다음 분자량을 측정하여 중합성을 살펴보았으며, X-ray diffractometer로 분석하여 다층 구조를 어느 정도 잘하고 있는지극 살펴 보았다.

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Eu Doping Effect on $CaAl_2O_4:Eu^{2+}$ Phosphor Material

  • Bartwal, Kunwar Singh;Ryu, Ho-Jin
    • 반도체디스플레이기술학회지
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    • 제6권2호
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    • pp.65-68
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    • 2007
  • High brightness and long persistent luminescence phosphor $CaAl_2O_4:Eu^{2+}$ was prepared with varying $Eu^{2+}$ concentration by solid state reaction technique. Synthesized materials were investigated by powder X-ray diffractometer (XRD), SEM, TEM, photoluminescence excitation and emission spectra. Broad band UV excited luminescence of the $CaAl_2O_4:Eu^{2+}$ was observed in the blue region (${\lambda}_{max}\;=\;440\;nm$) due to transitions from the $4f^65d^1$ to the $4f^7$ configuration of the $Eu^{2+}$ ion. The decay time of the persistence indicated that the persistent luminescence phosphor has bright phosphorescence and maintains a long duration. These materials have great potential for outdoor night time displays.

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Effect of Powder Size of Mg-Zn-Y Alloy on the Consolidation

  • Kim, Taek-Soo;Chae, H.J.;Lee, J.K.;Jung, H.G.;Kim, Y.D.;Bae, J.C.
    • 한국분말야금학회:학술대회논문집
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    • 한국분말야금학회 2006년도 Extended Abstracts of 2006 POWDER METALLURGY World Congress Part2
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    • pp.1266-1267
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    • 2006
  • [ $MgZn_{4.3}Y_{0.7}$ ] alloy powders were prepared using an industrial scale gas atomizer, followed by warm extrusion. The powders were almost spherical in shape. The microstructure of powders as atomized and bars as extruded was examined as a function of initial powder size distribution using Scanning Electron Microscope (SEM), Energy Dispersive X-ray Spectroscope (EDS) and X-ray Diffractometer (XRD). The grain sizes were decreased with extruding as well as decreasing the initial powder sizes. Both the ultimate strength and elongation were enhanced as the initial powder sizes were decreased.

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The crystal and molecular structure of $\gamma$-hydroxy-.$\beta$-amino butyric acid

  • Kim, Yang-Bae
    • Archives of Pharmacal Research
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    • 제8권1호
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    • pp.1-6
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    • 1985
  • The crystal structure or $\gamma$-hydroxy-$\betha$-aminobutyric acid was determined by MULTAN system with X-ray intensity data on a diffractometer and refined by the least-squares method to an R-value 0.034 for 711 reflections. The crystals were orthorhombic, space group $P2_{1}2_{1}2_{1}$, Z = 4, with a = 10.220, b = 8.257 and c = 6.556$\AA$. The molecule takes the zwitterionic form and skeletal conformation is trans-transform. The molecules are held together by intra-and intermolecular NH-O and OH--O hydrogen bonds.

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플라즈마사용법에 의한 $ZrO_2-Y_2O_3$ 코팅의 고온에서의 마모 (High Temperature Wear of Plasma-Sprayed $ZrO_2-Y_2O_3$ Coatings)

  • 김장엽;임대순;안효석
    • 한국세라믹학회지
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    • 제30권12호
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    • pp.1059-1065
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    • 1993
  • The sliding wear behavior of the plasma sprayed zirconia containing 8wt% yttria was investigated over a range of room temperature to 800℃. Both of the friction coefficient and the wear loss increased reaching its maximum at about to 499℃. and then decreased again with increasing temperature up to 800℃. The worn surface at elevated temperature were observed and analyzed by scanning electron microscopy and X-ray diffractometer to study the mechanisms of high temperature wear behavior. Surface morphology of the worn samples changes with temperature. Monoclinic (m)/tetragonal (t) x-ray peak intensity ratio of wear debris and worn surface decreased with increasing temperature. Non-transformable tetragonal (t') to metastable tetragonal (t) phase transformation of worn surface increased with increasing temperature. The results indicate that dehumidification and above phase changes are contributing to the high temperature wear behavior of the plasma sprayed ZrO2-Y2O3 coatings.

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유도결합형 플라즈마를 사용한 반응성 마그네트론 스퍼터링에 의한 ZnO 박막 증착 및 특성분석 (Characterization and deposition of ZnO thin films by Reactive Magnetron Sputtering using Inductively-Coupled Plasma (ICP))

  • 김동선
    • 반도체디스플레이기술학회지
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    • 제10권2호
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    • pp.83-89
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    • 2011
  • In this study, we investigated the effects of shutter control by Reactive Magnetron Sputtering using Inductively-Coupled Plasma(ICP) for obtaining ZnO thin films with high purity. The surface morphologies and structure of deposited ZnO thin films were characterized using Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and X-ray Diffractometer (XRD). Also, optical and chemical properties of ZnO thin films were analyzed by Spectroscopic Ellipsometer (SE) and X-ray Photoelectron spectroscopy (XPS). As a result, it observed that ZnO thin films grown at reactive sputtering using shutter control and ICP were higher density, lower surface roughness, better crystallinity than other conventional sputtering deposition methods. For obtaining better quality deposition ZnO thin films, we will investigate the effects of substrate temperature and RF power on shutter control by a reactive magnetron sputtering using inductively-coupled plasma.

Alumina Ceramics상의 무전해 Ni-W-B 도금에 관한 연구 (A Study of the Electroless Ni-W-B Depsition on Alumina Ceramics)

  • 유능희;강성군
    • 한국표면공학회지
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    • 제22권4호
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    • pp.161-167
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    • 1989
  • Effects of bath composition on electroless deposition of Ni-W-B from sulphate solution were invesrigated in terms of deposition kinetics, electro resistivity and composition of deposit film. The microstruigated and crystataine structure of the films were also studied using a scanning electron microscope and X-ray diffractometer. The deposition rate increased linearly with increasing the concentration of nickel sulphate in bath solution, wheras the rate decreasing with sodium citrate. The rate was also affected by sodium tungstate, which was maaximum at the concentration of 0.06 M/1 in sodium tungstate, The content of W in the deposit increased with increased with increasing the sodium citrate had on opposite effect on the composition of W and B in the deposit. The crystal change film from armorphous to cryatallicne nature by heat treatments was proved by the reduction of specific resistance and X-ray diffration.

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근접장 마이크로파 현미경을 이용한 ITO 박막 면저항의 비파괴 관측 특성 연구 (Nondestructive measurement of sheet resistance of indium tin oxide(ITO) thin films by using a near-field scanning microwave microscope)

  • 윤순일;나승욱;유현준;이영주;김현정;이기진
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
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    • pp.1042-1045
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    • 2004
  • ITO thin films ($\sim150nm$) are deposited on glass substrates by different deposition condition. The sheet resistance of ITO thin films measured by using a four probe station. The microstructure of these films is determined using a X-ray diffractometer (XRD) and a scanning electron microscope (SEM) and a atomic force microscope (AEM). The sheet resistance of ITO thin films compared $s_11$ values by using a near field scanning microwave microscope.

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