• Journal of the Korean Association of Oral and Maxillofacial Surgeons
• /
• v.29 no.3
• /
• pp.173-181
• /
• 2003

Purpose : This study was intended to evaluate the positional relationship between the hyoid bone and the mandible in patients with mandibular protrusion after mandibular set-back surgery by means of 3D-CT. Materials and methods : Preoperative(3 weeks before) and postoperative (6 weeks after) 3D-CT & cephalogram were taken on 32 patients(12 male, 20 female, mean age of 23.2) treated by bilateral sagittal split osteotomy with rigid fixation. The angular measurement on 3D-CT basilar view were deviation of Me & H, long axis angle of left & right cornu majus. The lineal measurement on 3D-CT basilar view were composed of intercondylar line and coordinates(x,y) of Me & H. The angular & lineal measurement of lateral cephalogram were composed of mandibular plane angle, SNA, SNB, ANB, FH-NA & FH-NB, and coordinates(x,y) of B, Pog, Me & H, PAS, Lpw, MPH and IAS. On the frontal cephalogram, deviation of Me were evaluated. Results : The mean mandibular set-back was 8.0mm horizontally and mandibular plane angle was slightly increased. The hyoid bone was displaced postero-inferiorly, the distance between MP(mandibular plane) and H(hyoid bone) was increased and the posterior airway space values (PAS, Lpw, IAS) were decreased. The coordinates Me(x,y), H(x,y) and deviation angle Me'& H' were revealed the strong positive correlation. Conclusion : The results revealed that the horizontal, vertical and transverse relationship of the mandibular and the hyoid bone movements were significantly correlated in patients performed mandibular set-back surgery.

• Journal of the Korean Society of Visualization
• /
• v.4 no.1
• /
• pp.56-61
• /
• 2006

A change of three-dimensional vortical structures on the wake behind a road vehicle has been investigated according to the existence of an air spoiler. To reconstruct the three-dimensional velocity fields, two-dimensional PIV(particle image velocimetry) measurements were performed for lots of the x-y, y-z and z-x planes. Since the isovorticity surface does not represent exactly the vortical structures within the recirculation region due to strong shear flows, the velocity component normal to the x-y plane is obtained by interpolating those velocities in the z-x plane. Then, the ${\lambda}_2-definition$ is applied to visualize the vortices in the recirculation region. As a result, it is found that the air spoiler weakens C-pillar vortices and produces strong wing-tip vortices. Inside the recirculation region, the height and volume of coherent vortices are increased relatively when an air spoiler is equipped. On the other hand, two small coherent vortices are observed in case that an air spoiler is absent.

• Journal of the Korean Crystal Growth and Crystal Technology
• /
• v.21 no.5
• /
• pp.187-192
• /
• 2011

Tilt angle of r-plane wafer is a one of the important factors related with the quality of the GaN epi, so the fine control of the tilt angle is important for the growing of high quality non-polar a-GaN epi. We prepared the R-plane sapphire wafers with slight tilt angles for nonpolar a-plane GaN. The target tilt angles of ${\alpha}$ and ${\beta}$ were 0, -0.1, -0.15, -0.2, -0.4, $-0.6^{\circ}$ and -0.1, 0, $0.1^{\circ}$, respectively. The tilt angles of sliced R-plane sapphire wafers were measured by x-ray and the statistical evaluation of reliability of tilt angles of wafers were performed. The tolerance of the tilt angle was ${\pm}0.03^{\circ}$. R-plane sapphire wafers have relatively large distributions of BOW and TTV data than c-plane sapphire wafers due to the large anisotropy of R-plane. As the tilt angle ${\alpha}$ was increased from -0.1 to $-0.6^{\circ}$, the step widths and heights were decreased from 156 nm to 26 nm and 0.4 nm to 0.2 nm, respectively. The growth and qualities of GaN epi seems to be largely affected by the change of step structure of R-plane sapphire wafers with tilt angle.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.11 no.3
• /
• pp.181-187
• /
• 1998

The ionization energy and degree of ionization for p-type $Si_{1-x}Ge_x$ with boron doping are calculated taking into account the screening and broadening effects. The drift and Hall mobilities are then calculated using the relaxation time approximation and compared with the previously reported measurement data for relaxed and strained $Si_{1-x}Ge_x$ alloys to estimate the alloy scattering potential. From a fit, the alloy scattering potential is found to be 0.5 eV. The in-plane drift mobility for p-type strained $Si_{1-x}Ge_x$ grown on (001) Si substrate is approximately 1+$10x^2$ times higher than that for bulk Si in the high doping range.

• The Pure and Applied Mathematics
• /
• v.17 no.4
• /
• pp.389-396
• /
• 2010

We investigate the existence of homoclinic orbits of the following systems of $Li{\'{e}}nard$ type: $a(x)x^'=h(y)-F(x)$, $y^'$=-a(x)g(x), where $h(y)=m{\mid}y{\mid}^{p-2}y$ with m > 0 and p > 1 and a, F, 9 are continuous functions such that a(x) > 0 for all $x{\in}{\mathbb{R}}$ and F(0)=g(0)=0 and xg(x) > 0 for $x{\neq}0$. By a series of time and coordinates transformations of the above system, we obtain sufficient conditions for the positive orbits of the above system starting at the points on the curve h(y) = F(x) with x > 0 to approach the origin through only the first quadrant. The method of this paper is new and the results of this paper cover some early results on this topic.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.23 no.5
• /
• pp.706-711
• /
• 1986

The AgGa1-xInxSe2 films are deposited by a flash evaporation method onto pyrex glass substrates at temperatures between 5\ulcorner and 360\ulcorner. The single crystalline films which have X-ray diffraction peak of only (112) plane are preared at substrate temperature above 360\ulcorner. The prepared AgGa 1-xInxSe2 films are high photosensitive. The temperature coefficients of energy gap are found to be (-1.2~-4.0)x10**4 eV/K and (-3.1~-5.2)x10**-4 eV/K, and that of peak energy of spectral photoresponse curve are found to be (-1.1 ~ -3.0)x10**-4 eV/K(50K~100K) and (-2.4~-5.1)x10**-4 eV/K(100K~300K).

• Journal of the Korean Association of Oral and Maxillofacial Surgeons
• /
• v.43 no.3
• /
• pp.152-159
• /
• 2017

Objectives: The aim of this study was to investigate the effects of advancement magnitude and changes in mandibular plane angle on the stability of mandibular advancement. Materials and Methods: This retrospective cohort study evaluated the postoperative stability of mandibular advancement in class II skeletal subjects who underwent bilateral sagittal split osteotomy. Radiographs taken preoperatively, immediately postoperatively and 1 year postoperatively were traced and analyzed using linear and angular measurements. To determine horizontal and vertical relapse, an X-Y coordinate system was established in which the X-axis was constructed by rotating S-N downward by $7^{\circ}$ (approximation of the Frankfort horizontal plane) and the Y-axis was defined as a line perpendicular to the X-axis and passing through the point Sella. For certain reference points including point A, point B, pogonion and menton, the perpendicular distance between each point and both axes was determined and cephalometric variables were recorded as X and Y coordinates. Results: Twenty-five subjects were studied. A significant correlation between the amount of mandibular advancement and relapse in the B point (vertical and horizontal) and the pogonion point was observed (vertical and horizontal, P<0.001). Evaluation of data demonstrated a positive correlation between the mandibular plane angle (SN/ML) change and vertical relapse in the B point (P<0.05). A simple regression model demonstrated that 74% of horizontal relapse and 42.3% of vertical relapse in the B point was related to the amount of mandibular advancement. The receiver operating characteristic test showed that 8.5 mm mandibular advancement is related to a relapse rate of 1 mm or more in the pogonion, vertically or horizontally. Conclusion: The magnitude of mandibular advancement is a stronger surgical predictor for horizontal rather than vertical relapse at the B point. Changes in mandibular plane angle (SN/ML) during surgery affect vertical, but not horizontal relapse at the B point.

• 제어로봇시스템학회:학술대회논문집
• /
• 2001.10a
• /
• pp.63.4-63
• /
• 2001

An x-ray vision can be a unique method to monitor and analyze the motion of mechanical parts in real time which are invisible from outside. Our problem is to identify the pose, i.e. the position and orientation of an object from x-ray projection images. It is assumed here that the x-ray imaging conditions that include the relative coordinates of the x-ray source and the image plane are predetermined and the object geometry is known. In this situation, an x-ray image of an object at a given pose can be estimated computationally by using a priori known x-ray projection image model. It is based on the assumption that a pose of an object can be determined uniquely to a given x-ray projection image. Thus, once we have the numerical model of x-ray imaging process, x-ray image of the known object at any pose could be estimated ...

• Journal of Korean Academy of Oral and Maxillofacial Radiology
• /
• v.22 no.1
• /
• pp.109-116
• /
• 1992

To determine the horizontal inclination of the condylar long axis without taking the submentovertex radiograph, the author studied the interrelation between the angle formed by the midsagittal plane and the mandibular angle and the horizontal inclination of the condylar long axis. In 56 subjects, the author measured the angle formed by the midsagittal plane and both mandibular angle using the modified Twirl Bow and the horizontal inclination of the both condylar long axis from submentovertex radiographs. The result were as follows: The mean value of the angle formed by the midsagittal plane and the mandibular angle was l8.50±1.48° in right side and 19.30±1.55° in left side. The mean value of the horizontal inclination of the condylar long axis was 19.25±7.56° in right side and 20.27±7.050 in left side. The interrelation of the two angles was represented as follows: y = 20.31-0.0094× (r = -0.482, p<0.01) in right side and y = 20.64-0.066×(r =-0.301, p<0.05) in left side (y; the horizontal inclination of the condylar long axis, x; the angle formed by the midsagittal plane and the mandibular angle).

• The Transactions of the Korean Institute of Electrical Engineers C
• /
• v.54 no.1
• /
• pp.41-44
• /
• 2005

A new method to reduce the computation time in power/ground-plane analysis is proposed. The existing method using the two dimensional infinite series summation take a lot of computation time. The proposed method is based on the approximation of impedance in the frequency domain through the Mobius transform. This method shows the good accuracy and the high speed in computing. In the case of impedance calculation for 9'x4' board, the proposed method takes 0.16 second of computing time whereas the existing method takes 2.2 second. This method can be applied to the analysis and design of power/ground-plane that need a lot of computation steps.