• Journal of the Korean Magnetics Society
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• v.3 no.2
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• pp.101-107
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• 1993

The crystallographic properties of the polycrystalline materials $Fe_{1+X}Eu_{1-X}O_{3}$(X = -0.06, 0.0, 0.1, 0.2, 0.3, 0.4) have been studied by the methods of X-ray diffraction and $M\"{o}ssbauer$ spectroscopy. The results showed that the samples with the composition range of $0.2{\leq}x{\leq}0.3$ had the garnet crystal phase, while those with $-0.06{\leq}x{\leq}0.0$ had the orthoferrite phase. However, with the tendency for the orthoferrite phase to convert into the trigonal phase via garnet phase as increasing the composition x, the orthoferrite-garnet and garnet-trigonal phase coexisted dominantly in the range of 0.0 < x < 0.2 and $0.4{\geq}x$, respectively. The analyzed results of $M\"{o}ssbauer$ spectrum indicated existence of some vacancies in the d-site of garnet phase, which can be related to the change of intensity in X-ray diffraction patterns.

• Korean Journal of Mineralogy and Petrology
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• v.34 no.4
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• pp.227-239
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• 2021

A practical and effective method of X-ray powder diffraction analysis was investigated for quantitative analysis of the mineral content of natural samples. Sample mounting experiments were conducted to select the best randomly oriented powder sample mount. A comparative experiment was also made between a reference intensity ratio (RIR) method, which compares a single peak intensity with standard material, and the Rietveld method, which calculates a full X-ray diffraction pattern, to search for the effective method of mineral quantification. In addition, samples containing amorphous minerals were quantitatively analyzed by the Rietveld method and the efficiency was reviewed. As a result of the study, the optimal random orientation could be reached by the side mounting method. The Rietveld method using the full pattern of X-ray diffraction was more suitable for mineral quantitative analysis, rather than the RIR method using a specific peak. However, either method could depend on the analyst's experience in addition to analytical technique. Moreover, amorphous minerals can be quantitatively analyzed by the Rietveld method, and the analysis results make the geological analysis possible.

• The Journal of the Petrological Society of Korea
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• v.9 no.4
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• pp.205-210
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• 2000

Measurements of phase identification and degree of orientation for fine-grained (about 0.3 mm in diameter) minerals in rock samples performed by micro-area X-ray diffractometer.$Al_{2}SiO_{5}$ polymorphs (andalusite, kyanite and sillimanite) were chosen for the measurements and target minerals were existed on thin sections. Micro-area X-ray diffractometer is composed of 3(${\omega}\;{\chi}\;{\phi}$)-circle oscillating goniometer and position sensitive proportional counter (PSPC). $CuK_{\alpha}$ radiation was used as X-ray source and a pin hole ($50\;\mu\textrm{m}$$ in diameter) collimator was selected to focus radiation X-ray onto the target minerals. Phase identification and diffracted X-ray peak indexing were carried out by 3(${\omega}\;{\chi}\;{\phi}$)-circle oscillation measurement. Then, 2(${\omega}\;{\phi}$)-circle oscillation measurement was made for the purpose of searching the prevailing lattice plane of the minerals on thin section surface. Finally, for a selected peak by 2-circle oscillation measurement, X-ray pole figure measurement was executed for the purpose of check the degree of orientation of the single lattice direction and examine its pole distribution. As a result of 3-circle oscillation measurement, it was possible that phase identification among $Al_{2}SiO_{5}$ polymorphs. And from the results of 2-circle oscillation measurement and X-ray pole figure measurement, we recognized that poles of andalusite (122), kyanite (200) and sillimanite (310) lattice plances were well developed with direction normal to each mineral surface plane respectively. Therfore, the measurements used with micro-area X-ray diffractometer in this study will be a useful tool of phase identification and degree of orientation measurement for fine-grained rock forming minerals.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.7 no.2
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• pp.197-206
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• 1997

A SiC epilayer on the 6H-SiC crystal substrate was grown by chemical vapor deposition (CVD). The crystal structure of the SiC epilayer was investigated by using the X-ray diffraction patterns and the Roman scattering spectroscopy. The SiC epilayer on the 6H-SiC substrate was grown to be homoepilayer by CVD. In order to distinguish a certain SiC polytype mixed in the SiC crystal grown by the modified Lely method, we have calculated the X-ray diffraction intensities and Brags angles of the typical SiC crystal powders. By comparing the measured X-ray diffraction pattern with the calculated ones, it was identified that the SiC crystal grown by the modified Lely method was the 6H-SiC crystal mixed some 15R-SiC.

• Electrical & Electronic Materials
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• v.6 no.6
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• pp.565-572
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• 1993

LPE(liquid phase epiraxy)법으로 성장시킨 $Al_{x}$ Ga$_{1-x}$As (0.15.leq.x.leq.0.67) 에피층의 구조적 특성을 이중결정 X-선 회절장치를 사용하여 조사하였다. GaAs기판과 $Al_{x}$ Ga$_{1-x}$As 에피층의 격자상수 차이로 인해 피이크가 분리되었고 이는 조성비가 증가함에 따라 선형적으로 증가하였다. 그리고 조성비는 Vegard의 법칙으로 구한 값과 기판 및 에피층 피이크 사이 각도분리(.DELTA..theta.)를 측정함으로써 구한 값이 일치하였으며 이때 관계식은 .DELTA..theta.=354.x을 얻었다. 또한 성장된 에피층은 compressive stress를 받고 있으며 조성비(x)가 0.15에서 0.67로 증가함에 따라 응력은 증가하였으며 그리고 피이크의 반치폭으로 부터 계산된 전위밀도가 역시 증가하였다.

• Journal of the Korean Vacuum Society
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• v.10 no.1
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• pp.93-97
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• 2001

We introduce the structure and the capability of a UHV x-ray scattering system constructed for surface structural studies. The system consists of vacuum parts required for surface preparation and a vertical-horizontal diffractometer using the S2D2 geometry. To illustrate the capability of the system, we measured the 7$\times$7 reconstruction peak of a Si (111) surface. The peak count rate was 216 counts/sec and the domain size of the 7$\times$7 reconstruction was larger than 1600 $\AA$. This demonstrates that the system is capable of providing surface structural information.

• Electrical & Electronic Materials
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• v.5 no.3
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• pp.271-277
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• 1992

X-선 회절 분석 및 적외선 투과율 측정은 실온에서 수행되었다. 또한 $Y_{1-x}$Nd$_{x}$Ba$_{2}$Cu$_{3}$O$_{7-y}$고온초전도체의 자기 임계전류밀도와 저항은 각각 30K와 80-140K 범위의 온도에서 조사되었다. 시료들은 고상 반응법에 의해서 제조되었다. 시료들의 결정구조는 X-선 회절무늬로 부터 모두 직방정계임이 판명되었다. 한편 x의 양이 증가함에 따라서 전이온도 T$_{c}$는 88K 근처의 값을 가지며 x의 양이 증가함에 따라 약간 감소하였다. 적외선 투과율 측정에서 날카로운 peak들은 472.23-618.87$cm^{-1}$ / 범위에 있었다. 이것은 특이할 정도로의 low-lying plasmalike edge와 낮은 에너지의 전자적인 여기가 존재함을 나타내는 것이다. 자기임계 전류밀도는 $10^{2}$~$10^{3}$A/$cm^{2}$ 범위에 있었다.있었다.

• Proceedings of the Korean Society of Propulsion Engineers Conference
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• 1996.11a
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• pp.179-189
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• 1996

X-선 회절법에 의하여 Graphite 화이버-알루미늄 매트릭스 복합 재료 계면에서의 잔류 응력을 정량적으로 측정하였다. X-선 회절법으로 측정한 잔류 응력 값과 수치 해석 모델 계산 결과와 비교하였다. 모델 계산 결과보다 낮은 측정 결과를 얻었으며 이는 매트릭스의 응력 이완 또는 화이버의 basal palne sliding 현상에 기인한 것으로 추정된다.

• Proceedings of the Korean Institute of Building Construction Conference
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• 2017.11a
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• pp.113-114
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• 2017

In this study, the change of composition of cement hardened at high temperature through XRD was observed. The specimen was made of cement paste and the heating rate condition was applied at rapid thermal annealing (10.0℃ / min). The decrease of calcium hydroxide was not confirmed, but the calcium carbonate tended to be impossible or decreased after 800℃. Calcium silicate and larnite were observed to increase with increasing temperature. It is considered that silicic acid, which is a stable structure due to the decomposition of calcium silicate, is changed into a phase such as lime.

• Proceedings of the Optical Society of Korea Conference
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• 2009.02a
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• pp.413-414
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• 2009