• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.299-299
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• 2012

투명전도산화물 박막은 디스플레이, 태양전지, 압전소자 등 다양한 응용분야에 많이 이용되고 있는 소재이다. 그 중에서 현재 산업에서 활용 빈도가 높은 투명전도막의 재료는 ITO를 기반으로 하는 물질이다. 하지만 인듐의 높은 생산단가와 플라즈마 노출시 열화로 인한 문제점 때문에 기존의 ITO를 대체하기 위한 새로운 재료에 관심이 증대되고 있다. 본 연구에서는 대표적인 ITO 대체 물질 중의 하나인 ZnO 박막에 대해서 증착환경변화에 따른 물성변화를 조사하였다. 먼저 대기중에서 안정화된 ZnO 박막을 얻기 위해서 인(P) 2% 첨가된 ZnO 세라믹을 고상반응법으로 제작하고, 펄스레이저 증착법을 이용하여 Al2O3(0001)기판에 산소분압을 30~150 mTorr로 변화를 주어 P-ZnO 박막을 제작하였다. 이 때 증착온도는 $400^{\circ}C$로 고정하였다. X선 회절 결과로부터 산소분압에 상관없이 ZnO (002)방향으로 증착되었다. 하지만 결정립의 크기는 산소분압이 증가하면서 줄어들고, ZnO (002)피크로부터 얻어진 격자상수(c-축)는 벌크 값에 가까워짐을 알 수 있었다. 하지만 P첨가로 인해서 박막의 격자상수는 순수한 ZnO 벌크 값 보다 큰 것으로 알 수 있다. 산소분압 변화에 따른 P-ZnO 박막의 산화 상태는 X-선 광전자 분광기를 이용하여 측정하였다. 그 결과 산소 core-level의 스펙트럼은 자연산화, 산소 vacancy, Zn-O 결합으로 구성되어짐을 알 수 있었다. 산소분압이 증가하면 Zn-O 결합은 증가하지만 산소 vacancy는 감소함을 알 수 있었다. 전기적 특성 결과 P-ZnO 박막은 30 mTorr에서는 n형 반도체 특성, 100 mtorr에서 p형 반도체의 특성이 나타내었고, 산소분압이 증가하면 다시 n형 반도체 특성을 나타냄을 알 수 있었다. 광학적 특성 결과 P-ZnO 박막은 산소분압에 상관없이 가시광선 영역에서 80%이상의 투과율을 나타내었으며, 산소분압이 증가할수록 에너지 갭이 증가하였다.

• Korean Journal of Materials Research
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• v.8 no.7
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• pp.591-595
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• 1998

In this work, the freestanding GaN single crystalline substrates without cracks were grown by hydride vapor phase epitaxy (HVPE) and its some properties were investigated. The GaN substrate, having a current maximum size of 350 $\mu\textrm{m}$-thickness and 100$\textrm{mm}^2$ area, were obtained by HVPE growth of thick film GaN on sapphire substrate and subsequent mechanical removal of the sapphire substrate. A lattice constant of $C_o$= 5.18486 $\AA$ and a FWHM of DCXRD was 650 arcsec for the single crystalline GaN substrate. The low temperature PL spectrum consist of three excitonic emission and a deep D- A pair recombination at 1.8eV. The Raman E, (high) mode frequency was 567$cm^{-1}$ which was the same as that of strain free bulk single crystals. The Hall mobility and carrier concentration was 283$cm^3$<\ulcornerTEX>/ V.sand 1.1$\times$$10^{18}cm^{-3}$, respectively.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.10 no.6
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• pp.425-433
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• 2000

The stochiometric mix of evaporating materials for the $CuGaTe_2$single crystal thin films was prepared from horizontal furnance. Using extrapolation method of X-ray diffraction patterns for the $CuGaTe_2$polycrystal, it was found tetragonal structure whose lattice constant $a_0 and c_0$ were 6.025 $\AA$ and 11.931 $\AA$, respectively. To obtain the single crystal thin films, $CuGaTe_2$mixed crystal was deposited on throughly etched semi-insulator GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were $670^{\circ}C$ and $410^{\circ}C$ respectively, and the thickness of the single crystal thin films is 2.1$\mu\textrm{m}$. The crystalline structure of single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). Hall effect on this sample was measured by the method of van der Pauw and studied on carrier density and mobility dependence on temperature. The carrier density and mobility of $CuGaTe_2$single crystal thin films deduced from Hall data are $8.72{\times}10{23}$개 $\textrm m^3$, $3.42{\times}10^{-2}$ $\textrm m^2$/V.s at 293K, respectively. From the photocurrent spectrum by illumination of perpendicular light on the c-axis of the $CuGaTe_2$single crystal thin film, we have found that the values of spin orbit coupling $\Delta$s.o and the crystal field splitting $\Delta$cr were 0.0791 eV and 0.2463 eV at 10 K, respectively. From the PL spectra at 10 K, the peaks corresponding to free bound excitons and D-A pair and a broad emission band due to SA is identified. The binding energy of the free excitons are determined to be 0.0470 eV and the dissipation energy of the donor-bound exciton and acceptor-bound exciton to be 0.0490 eV, 0.0558 eV, respectively.

• Journal of the Korean Society of Radiology
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• v.7 no.6
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• pp.403-408
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• 2013

This study made a tentative estimation of the shielding rate of barium compound by thickness through monte carlo simulation to apply medical radiation shielding products that can replace existing lead. Barium sulfate($BaSO_4$) was used for the shielding material, and thickness of the shielding material specimen was simulated from 0.1 mm to 5 mm by applying $15{\times}15cm^2$ of specimen area, $4.5g/cm^3$ of density of barium sulfate, and $11.34g/cm^3$ density of lead. Entered source was simulated with 10kVp Step in consecutive X-ray energy spectrum(40 kVp ~ 120 kVp). Absorption probability in 40 kVp ~ 60 kVp showed same shielding rate with lead in 3 mm ~ 5 mm of thickness, but it was identified that under 2 mm, the shielding rate was a bit lower than the existing lead shielding material. Also, the shielding rate in 70 kVp ~ 120 kVp energy band showed similar performance as the existing lead shielding material, but it was tentatively estimated as fairly low shielding rate below 0.5 mm. This study estimated the shielding rate of barium compound as the thickness function of x-ray energy band for medical radiation through monte carlo simulation, and made comparative analysis with existing lead. Also, this study intended to verify application validity of the x-ray shielding material for medical radiation of pure barium sulfate. As a result, it was estimated that the shielding effect was 95% higher than the existing lead 1.5 mm in at least 2 mm thickness of barium compound in medical radiation energy band 70 kVp ~ 120 kVp, and this result is considered valid to be provided as a base data in weight lightening production of radiation shielding product for medical radiation.

• Journal of the Korean Magnetics Society
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• v.12 no.1
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• pp.14-19
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• 2002

The iron-doped perovskite La$_{0.67}$Sr$_{0.33}$Mn$_{0.99}$$^{57}$Fe$_{0.01}$O$_3$compound has been studied by x-ray diffraction, Mossbauer spectroscopy, and vibrating sample magnetometry. The single phase of the polycrystalline La$_{0.67}$Sr$_{0.33}$Mn$_{0.99}$$^{57}$Fe$_{0.01}$O$_3$powder has been prepared by a waterbased solgel method. Crystalline La$_{0.67}$Sr$_{0.33}$Mn$_{0.99}$$^{57}$Fe$_{0.01}$O$_3$was a rombohedral structure with lattice parameters a$_{0}$=5.480 $AA$, $alpha$=60.259$^{circ}$. Mossbauer spectra of La$_{0.67}$Sr$_{0.3}$/Mn$_{0.99}$$^{57}$Fe$_{0.01}$O$_3$have been taken at various temperatures ranging from 20 to 400 K. As the temperature increases toward the Curie temperature, T$_{c}$=375 K, the Mossbauer spectra show line broadening and the difference between the 1,6 and 3,4 linewidths is caused by the anisotropic hyperfine field fluctuation. The anisotropic field fluctuation of +H (P$_{+}$=0.80) is greater than -H (P$_{-}$=0.20). We calculated that the anisotropy energy was 124.01 erg/cm$^3$for T=150 K which is associated with the large line broadening.

• Journal of Nuclear Fuel Cycle and Waste Technology(JNFCWT)
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• v.14 no.4
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• pp.331-341
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• 2016

To evaluate the physicochemical and radiological properties of raw materials and by-products in domestic distribution, about 220 samples with 16 species were prepared. We measured the energy spectrum and the chemical content, such as U, Th, and K, using a $LaBr_3$ scintillation detector and ED-XRF. In addition, HPGe detector was used to analyze the radioac-tivity of $^{234}Th$, $^{234}mPa$, and $^{214}Bi$ in uranium decay series and $^{228}Ac$, $^{212}Pb$, and $^{208}Tl$ in thorium decay series, and $^{40}K$. The correlation between characteristic variables, such as the count rate in several ROIs, chemical content, and radioactivity, was assessed to infer the radioactivity of natural radionuclides through a rapid screening method. Based on the results, a characteristic database for raw material and by-product in domestic distribution was established and it will provide useful information in the analysis procedure and improve the accuracy and reproducibility in the analysis of natural radionuclides.

• Korean Journal of Materials Research
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• v.11 no.5
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• pp.419-426
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• 2001

The stochiometric $AgGaSe_2$ polycrystalline mixture of evaporating materials for the $AgGaSe_2$ single crystal thin film was prepared from horizontal furnace. To obtain the single crystal thin films, $AgGaSe_2$ mixed crystal and semi-insulating GaAs(100) wafer were used as source material and substrate for the Hot Wall Epitaxy (HWE) system, respectively. The source and substrate temperature were fixed at$ 630^{\circ}C$ and $420^{\circ}C$, respectively. The thickness of grown single crystal thin films is 2.1$\mu\textrm{m}$. The single crystal thin films were investigated by photoluminescence and double crystal X-ray diffraction(DCXD) measurement. The carrier density and mobility of AgGaSe$_2$ single crystal thin films measured from Hall effect by van der Pauw method are $4.89\Times10^{17}$ cm$^{-3}$ , 129cm2/V.s at 293K, respectively. From the Photocurrent spectrum by illumination of perpendicular light on the c-axis of the AgGaSe$_2$ single crystal thin film, we have found that the values of spin orbit splitting $$\Delta$S_{o}$ and the crystal field splitting $\Delta$C$_{r}$, were 0.1762eV and 0.2474eV at 10K, respectively. From the photoluminescence measurement of AgGaSe$_2$ single crystal thin film, we observed free excision (EX) observable only in high quality crystal and neutral bound exciton ($D^{o}$ , X) having very strong peak intensity. And, the full width at half maximum and binding energy of neutral donor bound excition were 8mev and 14.1meV, respectively. By Haynes rule, an activation energy of impurity was 141 meV.ion energy of impurity was 141 meV.