• Title/Summary/Keyword: X -ray diffraction

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Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

  • Chae, Sejung R.;Moon, Juhyuk;Yoon, Seyoon;Bae, Sungchul;Levitz, Pierre;Winarski, Robert;Monteiro, Paulo J.M.
    • International Journal of Concrete Structures and Materials
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    • v.7 no.2
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    • pp.95-110
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    • 2013
  • We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed-a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction.

Grazing Incidence X-ray Diffraction (GIXRD) Studies of the Structure of Si$_{1-x}Ge_x$/Si Surface Alloy

  • Shi, Y.;Zhao, R.;Jiang, C.Z.;Fan, X.J.
    • Journal of Korean Vacuum Science & Technology
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    • v.6 no.2
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    • pp.84-87
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    • 2002
  • The Si$_{1-x}$ Gex/Si surface alloy (x = 0.3, 0.4 and 0.5), which are prepared by solid source MBE and have the SiGe epilayer thickness of 50$\AA$, are annealed with different parameters. The surface structure analyses of the heterostructure samples are made on a triple-axis X-ray diffractometer in grazing incidence X-ray diffraction (GIXRD) geometry. It has been found that with different annealing time (1.5h, 18h, 64h) and annealing temperature (550 $^{\circ}C$, 750 $^{\circ}C$), the SiGe epilayer experienced different strain relaxation process, which was deduced from the GIXRD measurements of the in-plane (220) diffraction peak of Si(001) substrate and the relevant (220) surface diffraction of SiGe epilayer. The results show that the stress relieving and the lateral strain relaxation in the SiGe/Si heterostructure can be promoted by correct annealing, which is very helpful for the preparation of SiGe/Si strained superlattice with fine strain crystallization..

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Analysis on the Fatigue Fracture Surface of Gas Piping Material using the X-Ray Fractography (X-선 프랙토그라피에 의한 가스배관재의 피로파면해석)

  • Lim, Man-Bae
    • Journal of the Korean Society of Safety
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    • v.17 no.1
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    • pp.18-24
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    • 2002
  • This study verified the relationship between fracture mechanics parameters(${\Delta}K,\;K_{max}$) and X-ray parameters ($(\sigma}_r,;B$) for G365 steel at elevated temperature up to $300{\circ}C$. The fatigue crack propagation test were carried out and X-ray diffraction technique according to crack length direction was applied to fatigue fractured surface. The residual stress on the fracture surface was found to increase in low ${\Delta}K$ region, reach to a maximum value at a certain value of $K_{max}$ or ${\Delta}K$ and then decrease. Residual stress was independent on stress ratio by arrangement of ${\Delta}K$ and half value breadth was independent by the arrangement of $K_{max}$. The equation of ${\sigma}_r-{\Delta}K$ was established by the experimental data. Therefore, fracture mechanics parameters could be estimated by the measurement of X-ray parameters.

Coherent X-ray Diffraction Imaging with Single-pulse Table-top Soft X-ray Laser

  • Kang, Hyon-Chol;Kim, H.T.;Lee, S.K.;Kim, C.M.;Choi, I.W.;Yu, T.J.;Sung, J.H.;Hafz, N.;Jeong, T.M.;Kang, S.W.;Jin, Y.Y.;Noh, Y.C.;Ko, D.K.;Kim, S.S.;Marathe, S.;Kim, S.N.;Kim, C.;Noh, D.Y.;Lee, J.
    • Proceedings of the Optical Society of Korea Conference
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    • 2008.02a
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    • pp.429-430
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    • 2008
  • We demonstrate coherent x-ray diffraction imaging using table-top x-ray laser at a wavelength of 13.9nm driven by 10-Hz ti:Sapphire laser system at the Advanced Photonics Research Institute in Korea. Since the flux of x-ray photons reaches as high as $10^9$ photons/pulse in a $20{\times}20{\mu}m^2$ field of view, we measured a ingle-pulse diffraction pattern of a micrometer-scale object with high dynamic range of diffraction intensities and successfully reconstructed to the image using phase retrieval algorithm with an oversampling ratio of 1:6. the imaging resolution is $^{\sim}150$ nm, while that is much improved by stacking the many diffraction patterns. This demonstration can be extended to the biological sample with the diffraction limited resolution.

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Effects of Cereal Powders with Dietary Fibers on Retrogradation Properties of Jeungpyun, a Korean Traditional Fermented Rice Cake

  • Park, Mie-Ja;Kim, Hye Young L.
    • Journal of Environmental Health Sciences
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    • v.29 no.4
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    • pp.48-54
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    • 2003
  • This study investigated retrogradation properties of Jeungpyun substituted for cereals with dietary fibers of 60% of brown rice, and barley. Quality changes during storage periods of the functional Jeungpyun, were studied using $\alpha$-amylase iodine enzyme digestion methods, X-ray diffraction patterns, and differential scanning calorimetry (DSC). The barley substituted samples showed significantly lower retrogrdation rates than those of control when examined by $\alpha$-amylase method. The Relative crystallity by X-ray diffraction patterns had typical A type in all samples with appealing big crystallity around its diffraction angle 23$^{\circ}$degrees as storage periods were increased. The brown rice and barley Jeunpyun made smaller crystallity than that of control, representing slower retrogradation rates. The batter controls had significantly lower ΔH than the other compared samples when measured by DSC, but had significantly higher ΔH after 30 days of storage, implying that the control required more energy for regelatinization after the 30 days of storage.

Clay Minerals and Their Distribution in the Soft Ground Deposited along the Coastline (한국 해안에 퇴적된 연약지반의 점토광물의 종류와 분포)

  • 김상규;임희대;문성권
    • Geotechnical Engineering
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    • v.14 no.6
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    • pp.73-80
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    • 1998
  • In order to identify clay minerals in the soft ground, which has been deposited along the coastline of the Korean peninsula, 14 samples have been taken at different locations and then X-ray diffraction analysis is carried out for them. It is known from the analysis that the various kinds of clay minerals mixed with different portions exist in the soft ground, but halloysite is not traced in any samples. It is featured regionally that kaolinite and illite are found in the western coast and the southern coast. Montmorillonites exists only in the western coast. This feature of regional occurrences can be explained with the help of geology of the region. Activities determined from physical properties of the soils do not coincide with those of clay minerals identified from X-ray diffraction analysis.

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Microstructural ananalysis of AlN thin films on Si substrate grown by plasma assisted molecular beam epitaxy (RAMBE를 사용하여 Si 기판 위에 성장된 AIN 박막의 결정성 분석)

  • 홍성의;한기평;백문철;조경익;윤순길
    • Journal of the Korean Vacuum Society
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    • v.10 no.1
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    • pp.22-26
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    • 2001
  • Microstructures of AlN thin films on Si substrates grown by plasma assisted molecular beam epitaxy were analyzed with various growth temperatures and substrate orientations. Reflection high energy electron diffraction (RHEED) patterns were checked for the in-situ monitoring of the growth condition. X-ray diffraction(XRD), double crystal X-ray diffraction (DCXD), and transmission electron microscopy/diffraction (TEM/TED) techniques were employed to characterize the microstructure of the films after growth. On Si(100) sub-strates, AlN thin films were grown mostly along the hexagonal c-axis orientation at temperature higher than $850^{\circ}C$. On the other hand the AlN films on Si(111) were epitaxially grown with directional coherencies in AlN(0001)/Si(111), AlN(1100)/Si(110), and AlN(1120)/Si(112). The microstructure of AlN thin films on Si(111) substrates, with a full width at half maximum of almost 3000 arcsec at 2$\theta$=$36.2^{\circ}$, showed that the single crystal films were grown, even if they includ a lot of crystal defects such as dislocations and stacking faults.

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Analysis of Rolling Contact Fatigue of Ball Bearing with Various Hardness by X-ray Diffraction (BEARING소재 경도에 따른 구름접촉피로의 X선적 해석)

  • 이한영
    • Tribology and Lubricants
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    • v.17 no.3
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    • pp.209-215
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    • 2001
  • In view of the effects of the hardness of material on fatigue, rolling contact fatigue process in hard metals seems to differ from it in soft metals. This paper has been aimed to compare the rolling contact fatigue process according to the hardness of materials. Rolling contact fatigue tests using the ball bearings assembled with the inner race of four different hardness have been carried out. In addition, residual stress and half-value breadth on/below the inner raceway during individual rolling contact fatigue have been measured by X-ray diffraction. The results of this study showed that the change of residual stress and half-value breadth during the rolling contact fatigue on race way in hard metals is the same as in soft metals. However, plastic deformation by rolling contact in hard metals is in microscopic scale but only for soft metals in macroscopic scale.

Fraction Analysis of ε and γ'-iron Nitride in Compound Layer Using X-ray Diffraction (X-선 회절법에 의한 철-질소 화합물층의 ε과 γ'상 분율 해석)

  • Kim, Yoon-Kee
    • Korean Journal of Materials Research
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    • v.16 no.2
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    • pp.85-91
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    • 2006
  • The fraction of $\varepsilon\;and\;\gamma$'-iron nitride in compound layer is predicted by x-ray diffraction using direct comparison method. The validity of formulation models was checked by comparing calculated results with metallographic analysis of iron nitride compound layer grown on steel S45C by gas nitriding. The fraction of $\varepsilon$ calculated by the three phase model, porous-$Fe_3N$/ dense-$Fe_3N$/ mixed layer with $Fe_3N\;and\;Fe_4N$, is 80 percent of that analyzed by etching technique. The $\varepsilon$ fraction predicted by mixed layer model is 122 percent of that measured by microscope.