• 제목/요약/키워드: X - ray

검색결과 16,743건 처리시간 0.047초

THE X-RAY EMISSION FROM EARLY TYPE GALAXIES

  • Kim, Dong-Woo
    • 천문학논총
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    • 제7권1호
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    • pp.63-69
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    • 1992
  • We have systematically investigated the X-ray spectra of normal galaxies, by using the Imaging Proportional Counter (IPC) data in the Einstein data base. We employed the X-ray color-color plot as well as the standard model fitting method which requires higher signal to noise ratio. We discuss X-ray emission mechanisms in terms of their spectral properties and the signature of cooling flows which are most likely present in X-ray bright early type galaxies. On the average, fits to absorbed thermal spectra show that the X-ray emission temperature of spirals is higher than that of ellipticals. This is consistent with our understanding that accreting binaries are a major X-ray source in spirals, while extended gaseous halos are present in ellipticals. The emission temperature becomes lower with increasing X-ray to optical luminosity ratio in E and S0 galaxies. This result is what we would expect if the emission of X-ray faint early type galaxies consists of a large evolved stellar component, while the gaseous emission becomes dominant in X-ray brighter galaxies. We also find a cool, self-absorbed core in some early type galaxies, which directly indicates the presence of cooling flows in such galaxies.

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Study on the Improvement of Indirect Intra-Oral Dental Digital X-ray Image Sensor with Optical Coupling

  • Whang, Joo-Ho;Chung, Jin-Bum;Kim, Tae-Woo
    • Nuclear Engineering and Technology
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    • 제33권5호
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    • pp.514-525
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    • 2001
  • Optimum characteristics of digital X-ray sensor components were analyzed to develop intra- oral dental digital X-ray image sensor using indirect method. Parametric analysis was carried out to optimize the phosphor thickness and the fiber optic plate (FOP) coupling to charge coupled device (CCD). X-ray absorption and light diffusion in the phosphor layer were analyzed by the Monte Carlo method. Real time X-ray image was obtained with prototype X- ray image sensor using general CCD camera with 1∼10 Ip/mm resolution. It has been previously shown that large resolution degradation in X-ray images was caused by miss alignment of FOP to CCD and optical adhesive selection. In this study, we reported that X-ray image quality was greatly improved by using optimized characteristics of alignment device and phosphor thickness.

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Halide Perovskites for X-ray Detection: The Future of Diagnostic Imaging

  • Nam Joong Jeon;Jung Min Cho;Jung-Keun Lee
    • 한국의학물리학회지:의학물리
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    • 제33권2호
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    • pp.11-24
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    • 2022
  • X-ray detection has widely been applied in medical diagnostics, security screening, nondestructive testing in the industry, etc. Medical X-ray imaging procedures require digital flat detectors operating with low doses to reduce radiation health risks. Recently, metal halide perovskites (MHPs) have shown great potential in high-performance X-ray detection because of their attractive properties, such as strong X-ray absorption, high mobility-lifetime product, tunable bandgap, low-temperature fabrication, near-unity photoluminescence quantum yields, and fast photoresponse. In this paper, we review and introduce the development status of new perovskite X-ray detectors and imaging, which have emerged as a new promising high-sensitivity X-ray detection technology. We discuss the latest progress and future perspective of MHP-based X-ray detection in medical imaging. Finally, we compare the conventional detection methods with quantum-enhanced detection, pointing out the challenges and perspectives for future research directions toward perovskite-based X-ray applications.

Authentication Technologies of X-ray Inspection Image for Container Terminal Automation

  • Kim, Jong-Nam;Hwang, Jin-Ho;Ryu, Tae-Kyung;Moon, Kwang-Seok;Jung, Gwang-S.
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2005년도 ICCAS
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    • pp.1684-1688
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    • 2005
  • In this paper, authentication technologies for X-ray inspection images in container merchandises are introduced and a method of authentication for X-ray inspection images is proposed. Until now, X-ray images of container merchandises have been managed without any authentication of inspection results and environments, it means that there was no any action for protection of illegal copy and counterfeiting of X-ray images from inspection results. Here, authentication identifies that who did inspect container X-ray images and, whether the container X-ray images were counterfeited or not. Our proposed algorithm indicates to put important information about X-ray inspection results on an X-ray image without affecting quality of the original image. Therefore, this paper will be useful in determining an appropriate technology and system specification for authentication of X-ray inspection images. As a result of experiment, we find that the information can be embedded to X-ray image without large degradation of image quality. Our proposed algorithm has high detection ratio by Quality 20 of JPEG attack.

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Chandra Archival Survey of Galaxy Clusters: Surface Photometry of Diffuse X-ray Emission

  • 김은혁;김민선
    • 천문학회보
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    • 제37권2호
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    • pp.77.2-77.2
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    • 2012
  • We have studied the physical properties of X-ray point sources in galaxy clusters for years based on the archival observations using the most sophisticated space X-ray observatory, Chandra X-ray Observatory. Because the ultimate goal of the study is comparing the physical properties of X-ray point sources found in galaxy clusters to those in X-ray blank fields; blank fields are the regions in the sky where any noticeable cosmic diffuse X-ray emission is not observed, an important key issue regarding this study is picking out the point sources related with galaxy clusters. However we do not have red-shift information of all the X-ray point sources. Therefore as a first order approximation we will consider the point sources with smaller projected cluster-centric distance than the adopted size of galaxy clusters. As a first step of this study we perform X-ray surface photometry of ~600 galaxy clusters based on ~800 Chandra ACIS observations. We carefully investigate the radial structures of diffuse X-ray emission in 3 different energy bands. Based on the highly accurate surface photometry we determine the characteristic size of diffuse X-ray emission (i.e., the boundary of X-ray emission). We also investigate the cosmological evolution of this characteristic size of galaxy clusters. General discussion regarding the two dimensional morphology of galaxy clusters will be presented.

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디지털 엑스선 기술과 응용 (Digital X-Ray Technology and Applications)

  • 정진우;강준태;김재우;박소라;이명래;송윤호
    • 전자통신동향분석
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    • 제34권5호
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    • pp.1-13
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    • 2019
  • In modern times, X-ray imaging has become a necessary tool for early diagnosis, quality control, nondestructive testing, and security screening. X-ray imaging equipment generally comprises an X-ray generator and an image sensor. Most commercially available X-ray generators employ filament-thermionic electron-based X-ray tubes, thus demonstrating typical analog behavior, such as slow response and large stray X-rays. Furthermore, digital X-ray sources, which have been studied extensively using field electron emitters manufactured from nanometer-scale materials, provide fast and accurately controlled ultra-shot X-rays. This could usher in a new era of X-ray imaging in medical diagnosis and nondestructive inspections. Specifically, digital X-ray sources, with reduced X-ray dose, can significantly improve the temporal and spatial resolution of fluoroscopy and computed tomography. Recently, digital X-ray tube technologies based on carbon nanotubes, developed by Electronics and Telecommunications Research Institute, have been transferred to several companies and commercialized for dental imaging for the first time.

X선촬영시(線撮影時) 연부조직(軟部組織) 두께에 따른 선량분포(線量分布)에 관(關)한 연구(硏究) (A Study on the Distribution of X-ray according to the Thickness of Soft Tissue in Radiography)

  • 박성옥
    • 대한방사선기술학회지:방사선기술과학
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    • 제11권2호
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    • pp.3-15
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    • 1988
  • When X-rays were projected into a patient, there occured the phenomena such as penetration, absorption and scattering etc. The penetrating rays were recorded on films as X-ray image used for diagnosis but scattered rays caused the radiation hazard both to the patient, specialist and technicians. The soft tissue includes many organs which are sensitive to the radiation and in may occupy $40{\sim}50%$ of body weight. Therefore X-rays should be carefully projected to the patient and it is strongly recommended to analyse the distribution of X-rays, when ever the patient is exposed to X-rays. In this study, the distribution of X-ray according to the thickness, the radiation field and the tube voltages (kVp) in soft tissue, the following results were obtained: 1. Total transmitted rays which kept the step with X-ray tube voltage (kVp) increased in proportion to the increasing of X-ray tube voltage. 2. The scattered ray rate in the total transmitted ray was not significantly found with X-ray tube voltage. 3. The affecting factors of the scattered ray rate in total transmitted ray were shown through the radiation field and the thickness. 4. The dose of scattered ray by the angle was observed more in direction of primary ray ($0^{\circ}$) and back scattering ($160^{\circ}$) than in direction of $90^{\circ}$. 5. The more the distance from phantom to the patient should be less distribution of scattered ray.

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다층박막 거울을 이용한 단색 엑스선 획득 (Acquisition of Monochromatic X-ray Using Multilayer Mirror)

  • 천권수
    • 대한방사선기술학회지:방사선기술과학
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    • 제33권3호
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    • pp.179-184
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    • 2010
  • 나노 공간분해능을 갖는 영상을 얻기 위한 경엑스선 현미경 시스템에서는 단색 엑스선이 요구된다. 엑스선관에서 발생되는 화이트 빔으로부터 8.4 keV의 텅스텐 $L_{\alpha}$ 특성방사선을 84% 이상 반사시킬 수 있는 5.65 nm의 단위막 두께를 가지는 C/W 다층박막 거울을 설계하였고, 이온빔 스파터링 장치를 이용하여 $50{\times}50\;mm$ 크기로 제작하였다. 제작된 C/W 다층박막 거울은 99.5% 이상의 균일도(Uniformity)를 가지며, TEM 사진을 이용해 그 구조를 확인하였다. 8.05 keV의 구리 특성방사선을 광원으로 하는 엑스선 반사율 측정 장치를 이용한 다층박막 거울의 반사율을 측정함으로써 C/W 다층박막 거울의 8.4 keV에서의 반사율을 예상할 수 있었다. 제작된 C/W 다층박막 거울과 엑스선관을 이용하여 8.4 keV의 특성방사선을 획득함으로써 단색 엑스선을 획득하였다. 이때의 반사율은 77.1%였고, 단색 엑스선의 반치폭은 0.21 keV이었다. 엑스선관에서 높은 효율로 단색 엑스선을 획득할 수 있어 실험실 규모의 경엑스선 현미경 장치의 광원으로써 사용될 수 있는 가능성을 확인하였고, 다층박막 거울의 단위막 두께를 수 나노미터로 제작한다면 17.5 keV의 몰리브덴 특성방사선에 해당하는 단색 엑스선을 얻어 유방촬영에도 적용할 수 있을 것이다.

구름접촉을 하는 분말고속도공구강의 X선을 이용한 표면성상해석 (Analysis of Rolling Contact Surface on PM-High Speed Steel by X-ray Diffraction)

  • 이한영;김용진;배종수
    • Tribology and Lubricants
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    • 제19권1호
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    • pp.1-8
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    • 2003
  • Recently, PM-high speed steel(PM-HSS) has reportedly been a good alternative material for rolling mill because of its superior performance to conventional HSS. This paper has been aimed to investigate the possibility for application to rolling contact element for PM-HSS by X-ray diffraction technique. The X-ray elastic constant for PH-HSS has been found by X-ray diffraction during the four-point bending test. Residual stress and half-value breadth on the contact surface during rolling contact fatigue process by X-ray diffraction have also been measured. The result of this study shows that the application of X-ray diffraction technique to PM-HSS could be as possible alternative material as conventional HSS. Half-value breadth on rolling contact surface by X-ray diffraction is not changed during rolling contact fatigue process. On the other hand, the residual stress is changed. This suggests that dislocation reaction has been hardly occurred in rolling contact, depending on super-saturated carbon in PM-HSS.

펄스파워용 X선제어 무도체스위치의 기본연구 (A Basic Study on X-ray Controlled Semiconductor Switch for Pulse Power)

  • Ko, Kwang-Cheol
    • 대한전기학회논문지
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    • 제41권9호
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    • pp.1013-1020
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    • 1992
  • The conductivity variation of a high resistivity bulk silicon semiconductor, whose electrodes were deposited with aluminum vapor, was studied experimentally by measuring the X-ray intensity and current flow, which was developed by X-ray radiation while applying a pulse voltage to the silicon, in a load resistor connected to the semiconductor. The current flow observed immediately as the X-ray radiated, and when the X-ray decreased. It was found from the observation of switching current for the X-ray intensity and the voltage applied in the semiconductor that the switching current of the semiconductor increased as the intensity of the X-ray and the applied voltage increased. In case of lower applied voltage, the switching current for higher applied voltage depended on the intensity of the X-ray radiated due to the saturation of electron and hole.

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