• Journal of radiological science and technology
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• v.24 no.2
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• pp.5-11
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• 2001

Most of X-ray generator had used rectifier type transformer with high tension generator which is supplied in a clinical diagnosis. Because the ripple rate of tube voltage is high, X-ray generating efficiency is very low. In these days, high tension generator for inverter type X-ray generator is being supplied from a broad which uses semi-conductor switching element for the electric power that have a high speed switching ability to solve these problem. But, semi-conductor element with large capacity is used with X-ray tube's large consumption power and diffusion is difficult in the small size hospital because production cost is going up by doing digital control through DSP. Therefore, this paper designed and manufactured CR type voltage divider for feedback control of tube voltage with high frequency resonance type inverter and for high tension transformer with high frequency. It was to make economical diffusion type X-ray generator which has wide output voltage and load extent. It was preyed that the X-ray generator had the stability of X-ray tube's output characteristics.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.18 no.8
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• pp.60-66
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• 2019

This study aims to develop and manufacture a device for inspecting impurities in a sealed aluminum container using an X-ray technique. Two X-ray oscillators and detectors are used to detect the entire sample. The stage for sample movement was fabricated using two high-voltage generators and X-ray detectors arranged diagonally. In addition, the high-voltage generator is composed of a vacuum tube, a high-voltage generator, and circulating oil for cooling. It includes a control unit for controlling other equipment, a power supply unit, and a video output unit; the most important part of the X-ray is the X-ray generation part. In this study, a flat panel was used along with the aim of developing the detector part. In particular, the development of the scintillator introduced in this study is a primary focus. The developed scintillator can be combined with a lens and can then be assembled with a charge coupled device (CCD) sensor.

• Nuclear Engineering and Technology
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• v.56 no.6
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• pp.2190-2194
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• 2024

The study investigates the dose-dependent direct X-ray sensing characteristics of Brucinium benzilate (BB) and N-acetylglycine (NAG) organic crystals. BB and NAG were prepared as a slurry and deposited as a thick film on a patterned metal electrode. The X-ray induced photocurrent response was examined for various exposure doses using an intraoral pulsed 70 keV X-ray machine connected to a source meter. Subsequently, the morphological properties and thickness of the thick films were analyzed using scanning electron microscopy (SEM). At a photon energy of 70 keV, the attenuation coefficient values for NAG and BB crystals were determined to be approximately 0.181 and 0.178 cm²/g, respectively. The X-ray stopping power of the crystals was measured using a suniray-2 X-ray imaging system. To evaluate the responsiveness of the sensors, the photocurrent sensitivity and noise equivalent dose rate (NED) were calculated for both thick films. The findings demonstrated a noteworthy capability of sensing low doses (mGy), thereby suggesting the potential application of these organic materials in X-ray sensor development.

• Progress in Medical Physics
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• v.14 no.3
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• pp.161-166
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• 2003

To evaluate the performance of cadmium sulfide as a multi-function X-ray dosimeter, we made an X-ray detector that was based on cadmium sulfide using evaporation technology, and measured its response to X-ray exposure. The voltages of cadmium sulfide were measured on the various X-ray tube potentials, X-ray tube currents and exposure times. The regression analysis of the voltage response of CdS on the tube-potential variation was y=0.0995x-0.1146 ($R^2$=0.9595, $\sigma$=0.08, standard error=2%) and the regression analysis of the voltage response of CdS on the tube-potential variation was y=0.0439x+1.1891 ($R^2$=0.9021, $\sigma$=0.04, standard error=1.8%) The regression analysis of the voltage response of CdS on the X-ray exposure time variation was y=8.2853+5.5878 ($R^2$=0.7287, $\sigma$=0.06, standard error=1.9%). In conclusion, cadmium sulfide responded linearly to the variation X-ray conditions, suggesting cadmium sulfide to be a feasible X-ray sensor of multi-function dosimeter related instruments.

• Progress in Medical Physics
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• v.23 no.4
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• pp.279-284
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• 2012

The X ray has been widely used in both diagnosis and treatment. Recently, a miniature X ray tube has been developed for radiotherapy. The miniature X ray tube is directly inserted into the body irradiated, so that X rays can be guided to a target at various incident angles according to collimator geometry and, thus, minimize patient dose. If such features of the miniature X ray tube can be applied to development of X ray imaging as well as radiation treatment, it is expected to open a new chapter in the field of diagnostic X ray. However, the miniature X ray tube requires an added filter and a collimator for diagnostic purpose because it was designed for radiotherapy. Therefore, a collimator and an added filter were manufactured for the miniature X ray tube, and mounted on. In this study, we evaluated beam characteristics of the miniature X ray tube for diagnostic X ray system and accuracy of measuring the HVL. We used the Si PIN Photodiode type Piranha detector (Piranha, RTI, Sweden) and estimated the HVL of the miniature X ray tube with added filter and without added filter. Through an another measurement using Al filter, we evaluated the accuracy of the HVL obtained from a direct measurement using the automatic HVL calculation function provided by the Piranha detector. As a result, the HVL of the miniature X ray tube was increased around 1.9 times with the added filter mounted on. So we demonstrated that the HVL was suitable for diagnostic X ray system. In the case that the added filter was not mounted on, the HVL obtained from use of the automatic HVL calculation function provided by Piranha detector was 50% higher than the HVL estimated using Al filter. Therefore, the HVL automatic measurement from the Piranha detector cannot be used for the HVL calculation. However, when the added filter was mounted on, the HVL automatic measurement value using the Piranha detector was approximately 15% lower than the estimated value using Al filter. It implies that the HVL automatic measurement can be used to estimate the HVL of the miniature X ray tube with the added filter mounted on without a more complicated measurement method using Al filter. It is expected that the automatic HVL measurement provided by the Piranha detector enables to make kV-X ray characterization easier.

• The Bulletin of The Korean Astronomical Society
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• v.40 no.1
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• pp.53.3-54
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• 2015

We are developing large arrays of X-ray microcalorimeters for applications in X-ray astronomy. X-ray microcalorimeters can detect the energy of X-rays with extremely high resolution. High-resolution Imaging spectroscopy enabled by these arrays will allow us to study the hot and energetic nature of the Universe through the detection of X-rays from astronomical objects such as neutron stars or black holes. I will introduce the state-of-the-art X-ray microcalorimeters being developed at NASA/GSFC and the future X-ray observatory missions based on microcalorimeters.

• Proceedings of the Korean Magnestics Society Conference
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• 2007.05a
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• pp.230.1-230.1
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• 2007

• The Magazine of the IEIE
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• v.22 no.2
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• pp.37-50
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• 1995

This paper reviews NTT Laboratories' research and development of x-ray lithography during the last ten years since the application of synchrotron orbital radiation(SOR). First, the historical background of x-ray lithograhpy research, NTT's research programs on synchrotron x-ray lithography(SOR lithography), and the current status of NTT's SOR lithography system are overviewed. Then, the key elements of SOR lithography system are reviewed, including the electron storage ring, the x-ray stepper, and the x-ray mask. Finally the appilcation of SOR lithography technology to device fabrication is reported.

• Journal of radiological science and technology
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• v.17 no.1
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• pp.65-70
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• 1994

• Proceedings of the Korea Crystallographic Association Conference
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• 2002.11a
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• pp.51-51
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• 2002

나노기공물질은 특정 기반물질(matrix) 내부에 대략 나노미터크기의 기공을 함유하고 있는 물질이며 나노기공물질의 특성은 기반물질의 특성과 더불어 기공의 형태, 크기, 분포에 의해서 결정된다. 나노기공물질의 기공에 대한 정보를 측정하는 방법으로는 TEM, 흡착법, FE-SEM과 더불어 중성자 또는 X-ray 빔의 산란을 이용하는 소각중성자산란 (Small-Angle Neutron Scatering, SANS), 소각 X-ray 산란 (Small-Angle X-ray Scattering, SAXS), 중성자반사율측정 (Neutron Relfectimetry, NR), X-ray 반사율측정 (X-Ray Reflectometry, XRR) 등이 사용되고 있다. 본 발표는 대략 1 nm - 100 nm 영역의 bulk 구조와 층상구조를 측정할 수 있는 소각 중성자 산란과 중성자 반사율 측정기법을 이용한 나노기공 측정기술을 다룬다.