• Title/Summary/Keyword: Wafer Positioning Robot

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Application of an Input Shaping Method for Reduction of Residual Vibration in the Wafer Positioning Robot (웨이퍼 이송 로봇의 잔류진동 저감을 위한 입력성형 기법의 적용)

  • Ahn, Tae-Kil;Yim, Jae-Chul;Kim, Seong-Kun;Kim, Kug Weon
    • Journal of the Semiconductor & Display Technology
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    • v.11 no.2
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    • pp.33-38
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    • 2012
  • The wafer positioning robot in the semiconductor industry is required to operate at high speed for the improvement of productivity. The residual vibration caused by the high speed of the wafer positioning robot, however, makes the life of the robot shorter and the cycle time longer. In this study, the input shaping and the path of the system are designed for the reduction of the residual vibration and the improvement of the cycle time. The followings are the process for the reduction and the improvement; 1) System modeling of the wafer positioning robot, 2) Verification of dynamic characteristics of the wafer positioning robot, 3) Input shaping plan using impulse response reiteration, 4) Simulation test using SIMULINK program, 5) Analysis of result.

Reduction of Residual Vibration in Wafer Positioning System Using Input Shaping (입력성형을 통한 웨이퍼 이송장치의 잔류진동 감쇠)

  • Yim, Jae-Chul;Ahn, Tae-Kil;Cho, Jung-Keun
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2005.11a
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    • pp.559-563
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    • 2005
  • The wafer positioning robot used in the semiconductor industry is required to operate at high speed for the improvement of productivity. However, the residual vibration produced by the high speed of the wafer positioning robot makes the life of the robot shorter and the cycle time longer. In this study, the input shaping and the path of the system are designed for the reduction of the residual vibration and the optimization of the cycle time. The followings are the process for the reduction and the optimization; 1)System modeling of wafer positioning robot, 2)Verification of dynamic characteristic of wafer positioning robot, 3)Input shaping plan using impulse response reiteration, 4)Simulation test using simulink, 6)Analysis of result.

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Kinematic Analysis of a 6-DOF Ultra-Precision Positioning Stage Based on Flexure Hinge (플렉셔 힌지 기반 6-자유도 초정밀 위치 결정 스테이지의 기구학 해석)

  • Shin, Hyun-Pyo;Moon, Jun-Hee
    • Journal of the Korean Society for Precision Engineering
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    • v.33 no.7
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    • pp.579-586
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    • 2016
  • This paper describes kinematic analysis of a 6-degrees-of-freedom (DOF) ultra-precision positioning stage based on a flexure hinge. The stage is designed for processes which require ultra-precision and high load capacities, e.g. wafer-level precision bonding/assembly. During the initial design process, inverse and forward kinematic analyses were performed to actuate the precision positioning stage and to calculate workspace. A two-step procedure was used for inverse kinematic analysis. The first step involved calculating the amount of actuation of the horizontal actuation units. The second step involved calculating the amount of actuation of the vertical actuation unit, given the the results of the first step, by including a lever hinge mechanism adopted for motion amplification. Forward kinematic analysis was performed by defining six distance relationships between hinge positions for in-plane and out-of-plane motion. Finally, the result of a circular path actuation test with respect to the x-y, y-z, and x-z planes is presented.